Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 425, doi. 10.1007/s10836-007-5056-9
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2008 AND VI 24 AND IP 5
Results: 9
1
2
Reverse Breakdown Voltage Measurement for Power P<sup />NN<sup /> Rectifier.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 473, doi. 10.1007/s10836-007-5054-y
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- Publication type:
- Article
3
A Reconfigurable Power Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 497, doi. 10.1007/s10836-008-5074-2
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- Publication type:
- Article
4
Improving the Effectiveness of Combinational Decompressors Through Judicious Partitioning of Scan Cells.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 439, doi. 10.1007/s10836-007-5039-x
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- Publication type:
- Article
5
Comparison of NIST and Wavelet Transform Test Point Selection Methods For a Programmable Gain Amplifier.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 449, doi. 10.1007/s10836-008-5070-6
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- Publication type:
- Article
6
Test Technology Newsletter October 2008.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 423, doi. 10.1007/s10836-008-5087-x
- Publication type:
- Article
7
Noise-Insensitive Digital BIST for any PLL or DLL.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 461, doi. 10.1007/s10836-007-5061-z
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- Publication type:
- Article
8
Controllability of Static CMOS Circuits for Timing Characterization.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 481, doi. 10.1007/s10836-007-5059-6
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- Publication type:
- Article
9
Editorial.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 421, doi. 10.1007/s10836-008-5089-8
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- Publication type:
- Article