Works matching IS 09238174 AND DT 2008 AND VI 24 AND IP 4

Results: 10

Test Technology Newsletter August 2008.

Published in:: Journal of Electronic Testing, 2008, v. 24, n. 4, p. 323, doi. 10.1007/s10836-008-5075-1
Publication type:: Article

Editorial.

Published in:

Journal of Electronic Testing, 2008, v. 24, n. 4, p. 321, doi. 10.1007/s10836-008-5076-0

By:

Vishwani Agrawal

Publication type:

Article

On Composite Leakage Current Maximization.

Published in:

Journal of Electronic Testing, 2008, v. 24, n. 4, p. 405, doi. 10.1007/s10836-007-5049-8

By:

Ashesh Rastogi;
Kunal Ganeshpure;
Alodeep Sanyal;
Sandip Kundu

Publication type:

Article

Guest Editorial.

Published in:

Journal of Electronic Testing, 2008, v. 24, n. 4, p. 325, doi. 10.1007/s10836-008-5063-5

By:

Nicola Nicolici;
Patrick Girard

Publication type:

Article

Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells.

Published in:

Journal of Electronic Testing, 2008, v. 24, n. 4, p. 327, doi. 10.1007/s10836-007-5048-9

By:

Xijiang Lin;
Yu Huang

Publication type:

Article

A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.

Published in:

Journal of Electronic Testing, 2008, v. 24, n. 4, p. 353, doi. 10.1007/s10836-007-5053-z

By:

N. Badereddine;
Z. Wang;
P. Girard;
K. Chakrabarty;
A. Virazel;
S. Pravossoudovitch;
C. Landrault

Publication type:

Article

Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy.

Published in:

Journal of Electronic Testing, 2008, v. 24, n. 4, p. 393

By:

Ho Ko;
Nicola Nicolici

Publication type:

Article

A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.

Published in:

Journal of Electronic Testing, 2008, v. 24, n. 4, p. 365, doi. 10.1007/s10836-008-5062-6

By:

Hong-Sik Kim;
Sungho Kang;
Michael Hsiao

Publication type:

Article

Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing.

Published in:

Journal of Electronic Testing, 2008, v. 24, n. 4, p. 379, doi. 10.1007/s10836-007-5033-3

By:

Xiaoqing Wen;
Kohei Miyase;
Tatsuya Suzuki;
Seiji Kajihara;
Laung-Terng Wang;
Kewal Saluja;
Kozo Kinoshita

Publication type:

Article

Scan-in and Scan-out Transition Co-optimization Through Modelling Generalized Serial Transformations.

Published in:

Journal of Electronic Testing, 2008, v. 24, n. 4, p. 335, doi. 10.1007/s10836-007-5021-7

By:

Ozgur Sinanoglu

Publication type:

Article