Works matching IS 09238174 AND DT 2007 AND VI 23 AND IP 2/3
1
- Journal of Electronic Testing, 2007, v. 23, n. 2/3, p. 219, doi. 10.1007/s10836-006-0554-8
- Fei Su;
- William Hwang;
- Arindam Mukherjee;
- Krishnendu Chakrabarty
- Article
2
- Journal of Electronic Testing, 2007, v. 23, n. 2/3, p. 193, doi. 10.1007/s10836-006-0551-y
- Sanjukta Bhanja;
- Marco Ottavi;
- Fabrizio Lombardi;
- Salvatore Pontarelli
- Article
3
- Journal of Electronic Testing, 2007, v. 23, n. 2/3, p. 235, doi. 10.1007/s10836-006-0555-7
- Wenjing Rao;
- Alex Orailoglu;
- Ramesh Karri
- Article
4
- Journal of Electronic Testing, 2007, v. 23, n. 2/3, p. 163, doi. 10.1007/s10836-006-0548-6
- Jing Huang;
- Mariam Momenzadeh;
- Fabrizio Lombardi
- Article
5
- Journal of Electronic Testing, 2007, v. 23, n. 2/3, p. 115, doi. 10.1007/s10836-006-0641-x
- Article
6
- Journal of Electronic Testing, 2007, v. 23, n. 2/3, p. 175, doi. 10.1007/s10836-006-0549-5
- Article