Works matching IS 09238174 AND DT 2007 AND VI 23 AND IP 1

Results: 11

Generation of Primary Input Blocking Pattern for Power Minimization during Scan Testing.

Published in:

Journal of Electronic Testing, 2007, v. 23, n. 1, p. 75, doi. 10.1007/s10836-006-0098-y

By:

Wang-Dauh Tseng

Publication type:

Article

Isolation of Failing Scan Cells through Convolutional Test Response Compaction.

Published in:

Journal of Electronic Testing, 2007, v. 23, n. 1, p. 35, doi. 10.1007/s10836-006-9524-4

By:

Grzegorz Mrugalski;
Janusz Rajski;
Chen Wang;
Artur Pogiel;
Jerzy Tyszer

Publication type:

Article

Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open Faults.

Published in:

Journal of Electronic Testing, 2007, v. 23, n. 1, p. 25

By:

Uğur Çilingiroğlu

Publication type:

Article

Minimal March Tests for Detection of Dynamic Faults in Random Access Memories.

Published in:

Journal of Electronic Testing, 2007, v. 23, n. 1, p. 55, doi. 10.1007/s10836-006-9504-8

By:

G. Harutunyan;
V. Vardanian;
Y. Zorian

Publication type:

Article

RF Testing on a Mixed Signal Tester.

Published in:

Journal of Electronic Testing, 2007, v. 23, n. 1, p. 85, doi. 10.1007/s10836-006-9947-y

By:

Dana Brown;
John Ferrario;
Randy Wolf;
Jing Li;
Jayendra Bhagat;
Mustapha Slamani

Publication type:

Article

Evaluating Different Solutions to Design Fault Tolerant Systems with SRAM-based FPGAs.

Published in:

Journal of Electronic Testing, 2007, v. 23, n. 1, p. 47, doi. 10.1007/s10836-006-0403-9

By:

L. Sterpone;
M. Sonza Reorda;
M. Violante;
F. Kastensmidt;
L. Carro

Publication type:

Article

New Editor.

Published in:: Journal of Electronic Testing, 2007, v. 23, n. 1, p. 7, doi. 10.1007/s10836-007-0751-0
Publication type:: Article

Test Technology Newsletter.

Published in:

Journal of Electronic Testing, 2007, v. 23, n. 1, p. 9, doi. 10.1007/s10836-006-0752-4

By:

Bruce Kim

Publication type:

Article

A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters.

Published in:

Journal of Electronic Testing, 2007, v. 23, n. 1, p. 95, doi. 10.1007/s10836-006-9523-5

By:

Shalabh Goyal;
Abhijit Chatterjee;
Michael Purtell

Publication type:

Article

Editorial.

Published in:: Journal of Electronic Testing, 2007, v. 23, n. 1, p. 5, doi. 10.1007/s10836-007-0750-1
Publication type:: Article

Improve the Quality of Per-Test Fault Diagnosis Using Output Information.

Published in:

Journal of Electronic Testing, 2007, v. 23, n. 1, p. 11, doi. 10.1007/s10836-006-9442-5

By:

Chunsheng Liu

Publication type:

Article