Works in Journal of Electronic Testing, 2025, Vol 41, Issue 2
2
- Journal of Electronic Testing, 2025, v. 41, n. 2, p. 147, doi. 10.1007/s10836-025-06173-7
- Du, Xiaozhi;
- Chen, Kai;
- Qiao, Zongbin
- Article
3
- Journal of Electronic Testing, 2025, v. 41, n. 2, p. 209, doi. 10.1007/s10836-025-06172-8
- Jafarzadeh, Hanieh;
- Klemme, Florian;
- Amrouch, Hussam;
- Hellebrand, Sybille;
- Wunderlich, Hans-Joachim
- Article
4
- Journal of Electronic Testing, 2025, v. 41, n. 2, p. 139, doi. 10.1007/s10836-025-06171-9
- Baluprithviraj, K. N.;
- Vijayachitra, S.;
- Mahesh, N.
- Article
5
- Journal of Electronic Testing, 2025, v. 41, n. 2, p. 193, doi. 10.1007/s10836-025-06170-w
- Magliano, Enrico;
- Savino, Alessandro;
- Di Carlo, Stefano
- Article
6
- Journal of Electronic Testing, 2025, v. 41, n. 2, p. 111, doi. 10.1007/s10836-025-06169-3
- Tain, Chloe;
- Patil, Savita;
- Al-Asaad, Hussain
- Article
7
- Journal of Electronic Testing, 2025, v. 41, n. 2, p. 241, doi. 10.1007/s10836-025-06168-4
- Rajski, Janusz;
- Trawka, Maciej;
- Tyszer, Jerzy;
- Włodarczak, Bartosz
- Article
8
- Journal of Electronic Testing, 2025, v. 41, n. 2, p. 221, doi. 10.1007/s10836-025-06167-5
- Biswas, Suman;
- Kumar Mahanti, Gautam;
- Chattaraj, Nilanjan
- Article
9
- Journal of Electronic Testing, 2025, v. 41, n. 2, p. 173, doi. 10.1007/s10836-025-06165-7
- Rao, Gajender;
- Nandal, Deepak
- Article