Works in Journal of Electronic Testing, 2024, Vol 40, Issue 6
Results: 8
Editorial.
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- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 689, doi. 10.1007/s10836-024-06156-0
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- Article
Multi-modal Pre-silicon Evaluation of Hardware Masking Styles.
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- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 723, doi. 10.1007/s10836-024-06155-1
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- Article
Modeling and Parasitic Extraction of the MM9 Transistor for GHz/THz CMOS RF Circuit Design.
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- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 795, doi. 10.1007/s10836-024-06154-2
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- Article
Advancing Low Power BIST Architecture with GAN-Driven Test Pattern Optimization.
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- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 691, doi. 10.1007/s10836-024-06153-3
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- Article
A SLvT Adaptive Test Method for Integrated Circuit Test Parameter Sets without Yield Loss.
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- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 777, doi. 10.1007/s10836-024-06152-4
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- Article
Fatigue Life Based Study of Electronic Package Mounting Locations on Printed Circuit Boards Subjected to Random Vibration Loads.
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- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 761, doi. 10.1007/s10836-024-06151-5
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- Article
A Feature-Adaptive and Scalable Hardware Trojan Detection Framework For Third-party IPs Utilizing Multilevel Feature Analysis and Random Forest.
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- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 741, doi. 10.1007/s10836-024-06150-6
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- Article
A Novel Two-Stage Model Based SCA against secAES.
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- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 707, doi. 10.1007/s10836-024-06149-z
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- Article