Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 4, p. 405, doi. 10.1007/s10836-023-06083-6
- Publication type:
- Article
Works matching IS 0923-8174 AND VI 39 AND IP 4 AND DT 2023
Results: 10
1
2
Editorial.
- Published in:
- 2023
- By:
- Publication type:
- Editorial
3
Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation Patterns.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 4, p. 521, doi. 10.1007/s10836-023-06081-8
- By:
- Publication type:
- Article
4
Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 4, p. 465, doi. 10.1007/s10836-023-06080-9
- By:
- Publication type:
- Article
5
Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 4, p. 447, doi. 10.1007/s10836-023-06079-2
- By:
- Publication type:
- Article
6
Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 4, p. 421, doi. 10.1007/s10836-023-06078-3
- By:
- Publication type:
- Article
7
Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 4, p. 501, doi. 10.1007/s10836-023-06077-4
- By:
- Publication type:
- Article
8
E<sup>3</sup>C Techniques for Protecting NAND Flash Memories.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 4, p. 487, doi. 10.1007/s10836-023-06075-6
- By:
- Publication type:
- Article
9
New Second-order Threshold Implementation of Sm4 Block Cipher.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 4, p. 435, doi. 10.1007/s10836-023-06076-5
- By:
- Publication type:
- Article
10
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 4, p. 409, doi. 10.1007/s10836-023-06072-9
- By:
- Publication type:
- Article