Found: 16
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Editorial.
- Published in:
- 2013
- By:
- Publication type:
- Editorial
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 257, doi. 10.1007/s10836-013-5381-0
- Publication type:
- Article
Guest Editorial.
- Published in:
- 2013
- By:
- Publication type:
- Editorial
On the Delay of a CNTFET with Undeposited CNTs by Gate Width Adjustment.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 261, doi. 10.1007/s10836-013-5388-6
- By:
- Publication type:
- Article
A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 275, doi. 10.1007/s10836-013-5357-0
- By:
- Publication type:
- Article
Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 289, doi. 10.1007/s10836-013-5358-z
- By:
- Publication type:
- Article
A Practical Approach to Single Event Transient Analysis for Highly Complex Design.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 301, doi. 10.1007/s10836-013-5385-9
- By:
- Publication type:
- Article
A Probabilistic Approach to Diagnose SETs in Sequential Circuits.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 317, doi. 10.1007/s10836-013-5361-4
- By:
- Publication type:
- Article
A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 331, doi. 10.1007/s10836-013-5359-y
- By:
- Publication type:
- Article
A Preliminary Study about SEU Effects on Programmable Interconnections of SRAM-based FPGAs.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 341, doi. 10.1007/s10836-013-5387-7
- By:
- Publication type:
- Article
On the Impact of Performance Faults in Modern Microprocessors.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 351, doi. 10.1007/s10836-013-5360-5
- By:
- Publication type:
- Article
Fault Analysis and Evaluation of a True Random Number Generator Embedded in a Processor.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 367, doi. 10.1007/s10836-013-5356-1
- By:
- Publication type:
- Article
Using Error Correcting Codes Without Speed Penalty in Embedded Memories: Algorithm, Implementation and Case Study.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 383, doi. 10.1007/s10836-013-5386-8
- By:
- Publication type:
- Article
Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 401, doi. 10.1007/s10836-013-5355-2
- By:
- Publication type:
- Article
A Region-based Fault-Tolerant Routing Algorithmfor 2D Irregular Mesh Network-on-Chip.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 415, doi. 10.1007/s10836-013-5377-9
- By:
- Publication type:
- Article
Partial Virtual Channel Sharing: A Generic Methodology to Enhance Resource Management and Fault Tolerance in Networks-on-Chip.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 431, doi. 10.1007/s10836-013-5389-5
- By:
- Publication type:
- Article