Found: 12
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Iterative Antirandom Testing.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 301, doi. 10.1007/s10836-011-5272-1
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- Publication type:
- Article
A New Optimal Test Node Selection Method for Analog Circuit.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 279, doi. 10.1007/s10836-011-5274-z
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- Publication type:
- Article
Diagnostics of Filtered Analog Circuits with Tolerance Based on LS-SVM Using Frequency Features.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 291, doi. 10.1007/s10836-011-5275-y
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- Publication type:
- Article
Challenges for Semiconductor Test Engineering: A Review Paper.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 365, doi. 10.1007/s10836-011-5276-x
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- Publication type:
- Article
Optimization of SEU Simulations for SRAM Cells Reliability under Radiation.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 331, doi. 10.1007/s10836-012-5281-8
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- Publication type:
- Article
NBTI-Aware Data Allocation Strategies for Scratchpad Based Embedded Systems.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 349, doi. 10.1007/s10836-012-5295-2
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- Publication type:
- Article
Digital-Compatible Testing Scheme for Operational Amplifier.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 267, doi. 10.1007/s10836-012-5290-7
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- Publication type:
- Article
IC Immunity Modeling Process Validation Using On-Chip Measurements.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 339, doi. 10.1007/s10836-012-5294-3
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- Publication type:
- Article
Robust Coupling Delay Test Sets.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 375, doi. 10.1007/s10836-012-5292-5
- By:
- Publication type:
- Article
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 317, doi. 10.1007/s10836-012-5291-6
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- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 265, doi. 10.1007/s10836-012-5300-9
- Publication type:
- Article
Editorial.
- Published in:
- 2012
- By:
- Publication type:
- Editorial