Works matching IS 08943370 AND DT 2015 AND VI 28 AND IP 6

Results: 15

Numerical determination of coaxial cable parameters in cryogenic environments for high-frequency active device noise modeling.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 732, doi. 10.1002/jnm.2072

By:

Cleriti, Riccardo;
Colangeli, Sergio;
Ciccognani, Walter;
Palomba, Mirko;
Limiti, Ernesto

Publication type:

Article

Issue Information.

Published in:: International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. i, doi. 10.1002/jnm.2024
Publication type:: Article

A new approach for signal and noise FET modeling including wave propagation effects.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 755, doi. 10.1002/jnm.2090

By:

Asadi, Shahrooz;
Yaghoub, Mustapha C. E.;
Biabanifard, Sadegh

Publication type:

Article

Guest editorial for the special issue on noise modeling of high-frequency semiconductor devices.

Published in:

2015

By:

Caddemi, Alina;
Limiti, Ernesto

Publication type:

Editorial

A novel theoretical analysis for the determination of the noise parameters applicable to millimeter-wave frequencies ( invited).

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 649, doi. 10.1002/jnm.2045

By:

Boglione, Luciano

Publication type:

Article

Microwave noise modeling for MOSFETs.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 639, doi. 10.1002/jnm.2061

By:

Yu, Panpan;
Chen, Bo;
Gao, Jianjun

Publication type:

Article

GaN Ku-band low-noise amplifier design including RF life test.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 717, doi. 10.1002/jnm.2066

By:

D'Angelo, Sara;
Nalli, Andrea;
Resca, Davide;
Raffo, Antonio;
Florian, Corrado;
Scappaviva, Francesco;
Vannini, Giorgio;
Rochette, Stephane;
Muraro, Jean‐Luc

Publication type:

Article

Millimetric LNAs for astronomy: characterization at cryogenic temperature.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 745, doi. 10.1002/jnm.2069

By:

Zannoni, M.

Publication type:

Article

Novel neural approach for parameter extraction of microwave transistor noise models.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 707, doi. 10.1002/jnm.2083

By:

Marinković, Zlatica;
Ivković, Nenad;
Pronić‐Rančić, Olivera;
Marković, Vera;
Caddemi, Alina

Publication type:

Article

Cyclostationary noise modeling of radio frequency devices.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 659, doi. 10.1002/jnm.2035

By:

Bonani, F.;
Guerrieri, S. Donati;
Ghione, G.

Publication type:

Article

Numerical modeling and uncertainty analysis of transistor noise-parameter measurements.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 628, doi. 10.1002/jnm.2039

By:

Randa, James

Publication type:

Article

Modeling of low-frequency noise in advanced CMOS devices.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 613, doi. 10.1002/jnm.2052

By:

Balestra, F.;
Ghibaudo, G.;
Jomaah, J.

Publication type:

Article

On the determination of noise parameters of low-noise transistor devices.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 684, doi. 10.1002/jnm.2054

By:

Seelmann‐Eggebert, M.;
Aja, B.;
Baldischweiler, B.;
Moschetti, G.;
Massler, H.;
Bruch, D.;
Schlechtweg, M.;
Ambacher, O.

Publication type:

Article

Wide temperature range SiGe HBT noise parameter modeling and LNA design for extreme environment Electronics.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 675, doi. 10.1002/jnm.2055

By:

Niu, Guofu;
Ma, Rongchen;
Luo, Lan;
Cressler, John D.

Publication type:

Article

Black-box noise modeling of GaAs HEMTs under illumination.

Published in:

International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 698, doi. 10.1002/jnm.2056

By:

Colangeli, Sergio;
Ciccognani, Walter;
Limiti, Ernesto;
Caddemi, Alina;
Crupi, Giovanni;
Salvo, Giuseppe

Publication type:

Article