Works matching IS 08943370 AND DT 2015 AND VI 28 AND IP 6
Results: 15
Numerical determination of coaxial cable parameters in cryogenic environments for high-frequency active device noise modeling.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 732, doi. 10.1002/jnm.2072
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- Publication type:
- Article
Issue Information.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. i, doi. 10.1002/jnm.2024
- Publication type:
- Article
A new approach for signal and noise FET modeling including wave propagation effects.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 755, doi. 10.1002/jnm.2090
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- Publication type:
- Article
Guest editorial for the special issue on noise modeling of high-frequency semiconductor devices.
- Published in:
- 2015
- By:
- Publication type:
- Editorial
A novel theoretical analysis for the determination of the noise parameters applicable to millimeter-wave frequencies ( invited).
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 649, doi. 10.1002/jnm.2045
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- Publication type:
- Article
Microwave noise modeling for MOSFETs.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 639, doi. 10.1002/jnm.2061
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- Publication type:
- Article
GaN Ku-band low-noise amplifier design including RF life test.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 717, doi. 10.1002/jnm.2066
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- Publication type:
- Article
Millimetric LNAs for astronomy: characterization at cryogenic temperature.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 745, doi. 10.1002/jnm.2069
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- Publication type:
- Article
Novel neural approach for parameter extraction of microwave transistor noise models.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 707, doi. 10.1002/jnm.2083
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- Publication type:
- Article
Cyclostationary noise modeling of radio frequency devices.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 659, doi. 10.1002/jnm.2035
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- Publication type:
- Article
Numerical modeling and uncertainty analysis of transistor noise-parameter measurements.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 628, doi. 10.1002/jnm.2039
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- Publication type:
- Article
Modeling of low-frequency noise in advanced CMOS devices.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 613, doi. 10.1002/jnm.2052
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- Publication type:
- Article
On the determination of noise parameters of low-noise transistor devices.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 684, doi. 10.1002/jnm.2054
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- Publication type:
- Article
Wide temperature range SiGe HBT noise parameter modeling and LNA design for extreme environment Electronics.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 675, doi. 10.1002/jnm.2055
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- Publication type:
- Article
Black-box noise modeling of GaAs HEMTs under illumination.
- Published in:
- International Journal of Numerical Modelling, 2015, v. 28, n. 6, p. 698, doi. 10.1002/jnm.2056
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- Publication type:
- Article