Application of a Bayesian network to integrated circuit tester diagnosis.
- Published in:
- AI EDAM, 1995, v. 9, n. 1, p. 51, doi. 10.1017/S0890060400002080
- By:
- Publication type:
- Article
Works matching IS 08900604 AND DT 1995 AND VI 9 AND IP 1
Results: 7
1
2
An artificial neural network approach to discrete-event simulation.
- Published in:
- AI EDAM, 1995, v. 9, n. 1, p. 37, doi. 10.1017/S0890060400002079
- By:
- Publication type:
- Article
3
Integrating knowledge-based systems and artificial neural networks for engineering.
- Published in:
- AI EDAM, 1995, v. 9, n. 1, p. 13, doi. 10.1017/S0890060400002055
- By:
- Publication type:
- Article
4
A constraint-based approach for qualitative matrix structural analysis.
- Published in:
- AI EDAM, 1995, v. 9, n. 1, p. 23, doi. 10.1017/S0890060400002067
- By:
- Publication type:
- Article
5
Computer-aided design/engineering of bearing systems using the Dempster-Shafer theory.
- Published in:
- AI EDAM, 1995, v. 9, n. 1, p. 1, doi. 10.1017/S0890060400002043
- By:
- Publication type:
- Article
6
AIE volume 9 issue 1 Cover and Back matter.
- Published in:
- AI EDAM, 1995, v. 9, n. 1, p. b1, doi. 10.1017/S0890060400002031
- Publication type:
- Article
7
AIE volume 9 issue 1 Cover and Front matter.
- Published in:
- AI EDAM, 1995, v. 9, n. 1, p. f1, doi. 10.1017/S089006040000202X
- Publication type:
- Article