X-rays in art and archaeology: An overview.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 3, doi. 10.1154/1.1649963
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- Article
Works matching IS 08857156 AND DT 2004 AND VI 19 AND IP 1
Results: 22
1
2
In situ measurement of growth stress in alumina scale.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 69, doi. 10.1154/1.1649318
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- Article
3
Simultaneous measurements of X-ray diffraction (XRD) and differential scanning calorimetry (DSC) data under controlled humidity condition: Instrumentation and application to studies on hydration, dehydration, and rehydration processes of ...
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- Powder Diffraction, 2004, v. 19, n. 1, p. 31, doi. 10.1154/1.1649321
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- Article
4
Texture measurements using the new neutron diffractometer HIPPO and their analysis using the Rietveld method.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 65, doi. 10.1154/1.1649961
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- Article
5
Advances in quantitative XRD analysis for clinker, cements, and cementitious additions.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 40, doi. 10.1154/1.1649328
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- Article
6
Quantitative analysis by X-ray induced total electron yield (TEY) compared to XRFA.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 90, doi. 10.1154/1.1649329
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- Article
7
Improvements in XRF specimen preparation using the dried residue method: Gallium in plutonium metal.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 87, doi. 10.1154/1.1649325
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- Article
8
Ultratrace speciation of nitrogen compounds in aerosols collected on silicon wafer surfaces by means of TXRF-NEXAFS.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 81, doi. 10.1154/1.1649327
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- Article
9
Development and application of laboratory X-ray fluorescence holography equipment.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 77, doi. 10.1154/1.1649324
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- Article
10
Thermally-induced stresses in thin aluminum layers grown on silicon.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 74, doi. 10.1154/1.1649326
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- Article
11
Materials characterization using a novel simultaneous near-infrared/X-ray diffraction instrument.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 36, doi. 10.1154/1.1649322
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- Article
12
Texture and microstructure analysis with high-energy synchrotron radiation.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 60, doi. 10.1154/1.1649317
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- Article
13
Strain effects in thin film/Si substrates revealed by X-ray microdiffraction.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 56, doi. 10.1154/1.1649323
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- Article
14
X-ray microdiffraction study of the half-V-shaped switching liquid crystal.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 53, doi. 10.1154/1.1649330
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- Article
15
Structural characterization of SiGe and SiGe:C heterostructures using a combination of X-ray scattering methods.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 49, doi. 10.1154/1.1649320
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- Article
16
Grazing incidence in-plane X-ray diffraction in the laboratory.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 45, doi. 10.1154/1.1649319
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- Article
17
Evaluating experimental methods and techniques in X-ray diffraction using 280 000 data sets in the Powder Diffraction File.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 20, doi. 10.1154/1.1651104
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- Article
18
A plug-in program to perform Hanawalt or Fink search-indexing using organics entries in the ICDD PDF-4/organics 2003 database.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 26, doi. 10.1154/1.1649960
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- Article
19
New Managing Editor.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 2, doi. 10.1154/1.1688833
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- Article
20
Synchrotron applications in archaeometallurgy: Analysis of high zinc brass astrolabes.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 12, doi. 10.1154/1.1649316
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- Article
21
Analysis of art objects and other delicate samples: Is XRF really nondestructive?
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- Powder Diffraction, 2004, v. 19, n. 1, p. 16, doi. 10.1154/1.1649962
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- Article
22
Special March 2004 Issue.
- Published in:
- Powder Diffraction, 2004, v. 19, n. 1, p. 1, doi. 10.1154/1.1688832
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- Article