Works in Quality & Reliability Engineering International, 1992, Vol 8, Issue 3

Results: 37

Failure Model Mechanism Distributions (Book).

Published in:

1992

By:

O'Connor, P. D. T.

Publication type:

Book Review

Electrostatic Discharge Susceptibility Data (Book).

Published in:

1992

By:

O'Connor, P. D. T.

Publication type:

Book Review

Assessment of GaAs Device Quality and Reliability./Qualified Manufacturer List: New Device Manufacturing and Procurement Technique...(Book).

Published in:

1992

By:

O'Connor, P. D. T.

Publication type:

Book Review

Reliability by Design (Book).

Published in:

1992

By:

O'Connor, P. D. T.

Publication type:

Book Review

Handbook of Electronic Package Design (Book).

Published in:

1992

By:

O'Connor, P. D. T.

Publication type:

Book Review

IERI Newsletter.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 310
Publication type:: Article

New From RAC.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 310
Publication type:: Article

The RAC Quarterly.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 310
Publication type:: Article

Innovative Reliability Assurance and Control Through TQM.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 309
Publication type:: Article

MIL-HDBK-217 Update.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 309
Publication type:: Article

European Quality Award.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 308
Publication type:: Article

Harley-Davidson Spends $80 Million on Quality.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 308
Publication type:: Article

New Reliability Service in Germany.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 308
Publication type:: Article

BSI Quality Assurance Launches New Service.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 307
Publication type:: Article

ANSI, RAB Launch National Accreditation Program.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 307
Publication type:: Article

NASA Update.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 307
Publication type:: Article

Baldrige Award Criteria in New Format.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 307
Publication type:: Article

LOW FREQUENCY NOISE ANALYSIS TO DETECT THE INFLUENCE OF DEEP LEVELS IN AlGaAs/GaAs HEMTs.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 301, doi. 10.1002/qre.4680080321

By:

Labat, N.;
Bodi, D. Ouro;
Touboul, A.;
Danto, Y.

Publication type:

Article

GaAs MMIC RELIABILITY STUDIES.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 295, doi. 10.1002/qre.4680080320

By:

Anderson, W. T.;
Roussos, J. A.;
Christianson, K. A.

Publication type:

Article

ESD INDUCED DEGRADATION MECHANISMS OF InGaAsP/InP LASERS.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 287, doi. 10.1002/qre.4680080319

By:

Magistrali, F.;
Sala, D.;
Salmini, G.;
Vanzi, M.;
Fantini, F.;
Giansante, M.

Publication type:

Article

RELIABILITY AND DEGRADATION OF 980 nm InGaAs/GaAs STRAINED QUANTUM WELL LASERS.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 283, doi. 10.1002/qre.4680080318

By:

Fukuda, Mitsuo;
Okayasu, Masanobu;
Takeshita, Tatsuya;
Wada, Masato

Publication type:

Article

STABILITY OF INTERFACES IN PSEUDOMORPHIC InGaAs HEMTs.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 279, doi. 10.1002/qre.4680080317

By:

Audren, P.;
J. M.Dumas, P.;
Mottel, S.;
Vuchener, C.;
Paugam, J.;
Favennec, M. P.

Publication type:

Article

TRANSIENTLY TRIGGERED LATCH-UP IN CMOS TWIN- TUB AND EPITAXIAL TECHNOLOGIES.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 273, doi. 10.1002/qre.4680080316

By:

Pavan, Paolo;
Caprara, Paolo;
Stucchi, Michele

Publication type:

Article

ESD IN INTEGRATED CIRCUITS.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 259, doi. 10.1002/qre.4680080315

By:

Amerasekera, Auth;
Verwey, Jan

Publication type:

Article

ELECTROMIGRATION AT GOLD-ALUMINIUM INTERFACES AND IN THIN ALUMINIUM TRACKS.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 253, doi. 10.1002/qre.4680080314

By:

Vanhecke, B.

Publication type:

Article

AN EXTENSION OF THE RAPID WAFER-LEVEL WIJET METHOD AND ITS COMPARISON WITH CONVENTIONAL ELECTROMIGRATION TESTING.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 247, doi. 10.1002/qre.4680080313

By:

Jeuland, F.;
Normandon, Ph.;
Lormand, G.;
Boudou, A.

Publication type:

Article

ULTRASONIC MICROSCOPE INVESTIGATIONS OF DIE ATTACH QUALITY AND CORRELATIONS WITH THERMAL RESISTANCE.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 243, doi. 10.1002/qre.4680080312

By:

Pfannschmidt, Gabriele

Publication type:

Article

FAILURE ANALYSIS OF MULTILEVEL METALLIZED LSI USING OPTICAL BEAM INDUCED CURRENT.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 239, doi. 10.1002/qre.4680080311

By:

Mitsuhashi, J.;
Komori, S.;
Tsubouchi, N.

Publication type:

Article

EMISSION MICROSCOPY.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 225

By:

Kölzer, J.;
Dallmann, A.;
Deboy, G.;
Orro, J.;
Weinmann, D.

Publication type:

Article

USE OF A CMOS STATIC MEMORY ARRAY AS A TECHNOLOGY TEST VEHICLE.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 219, doi. 10.1002/qre.4680080309

By:

D. Schmitt-Landsiedel, Y.;
Winnerl, J.;
Neuendorf, G.;
Kölzer, J.

Publication type:

Article

ASICs FAILURE ANALYSIS USING TWO COMPLEMENTARY TECHNIQUES: EXTERNAL ELECTRICAL TESTING AND INTERNAL CONTACTLESS LASER BEAM TESTING.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 213, doi. 10.1002/qre.4680080308

By:

Bouvet, C.;
Foutllat, P.;
Dom, J. P.;
Danto, Y.

Publication type:

Article

PLASTIC ENCAPSULATED ICs IN MILITARY EQUIPMENT RELIABILITY PREDICTION MODELLING.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 195, doi. 10.1002/qre.4680080307

By:

Brizoux, M.;
Deleuze, G.

Publication type:

Article

ENVIRONMENTAL TESTING AND COMPONENT RELIABILITY OBSERVATIONS OF TELECOMMUNICATIONS EQUIPMENT OPERATED IN TROPICAL CLIMATIC. CONDITIONS.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 189, doi. 10.1002/qre.4680080306

By:

Sinnadurai, Nihal;
Kuppuswamy, T. S.;
Chandramouli, R.;
Rao, B. K. N.

Publication type:

Article

FLOATING GATE MEMORIES RELIABILITY.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 177, doi. 10.1002/qre.4680080305

By:

Crisenza, G.;
Clementi, C.;
Ghidini, G.;
Tosi, M.

Publication type:

Article

THE INFLUENCE OF TEMPERATURE ON INTEGRATED CIRCUIT FAILURE MECHANISMS.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 167, doi. 10.1002/qre.4680080304

By:

Pecht, Michael;
Lall, Pradeep

Publication type:

Article

RELIABILITY BEHAVIOUR OF ELECTRONIC COMPONENTS AS A FUNCTION OF TIME.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 161, doi. 10.1002/qre.4680080303

By:

Campbell, D. S.;
Hayes, J. A.;
Jones, J. A.;
Schwarzenberger, A. P.

Publication type:

Article

EDITOR'S COMMENTS.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 159, doi. 10.1002/qre.4680080302

By:

Touboul, A.

Publication type:

Article