Works in Quality & Reliability Engineering International, 2011, Vol 27, Issue 6
Results: 10
Addressing multicollinearity in semiconductor manufacturing.
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- Quality & Reliability Engineering International, 2011, v. 27, n. 6, p. 843, doi. 10.1002/qre.1173
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- Article
Multi-cause degradation path model: a case study on rubidium lamp degradation.
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- Quality & Reliability Engineering International, 2011, v. 27, n. 6, p. 781, doi. 10.1002/qre.1159
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- Article
A model-based approach for attribute gauge analysis.
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- Quality & Reliability Engineering International, 2011, v. 27, n. 6, p. 753, doi. 10.1002/qre.1154
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- Article
Examining improved experimental designs for wind tunnel testing using Monte Carlo sampling methods.
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- Quality & Reliability Engineering International, 2011, v. 27, n. 6, p. 795, doi. 10.1002/qre.1165
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- Article
Hierarchical modeling using generalized linear models.
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- Quality & Reliability Engineering International, 2011, v. 27, n. 6, p. 835, doi. 10.1002/qre.1176
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- Article
A Review and perspective on surveillance of Bernoulli processes.
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- Quality & Reliability Engineering International, 2011, v. 27, n. 6, p. 735, doi. 10.1002/qre.1256
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- Article
Innovation and quality technology.
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- Quality & Reliability Engineering International, 2011, v. 27, n. 6, p. 733, doi. 10.1002/qre.1267
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- Article
Enhancing the performance of EWMA charts.
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- Quality & Reliability Engineering International, 2011, v. 27, n. 6, p. 821, doi. 10.1002/qre.1175
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- Article
A graphical representation for a statistical test of average equivalence and variance comparison with process data.
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- Quality & Reliability Engineering International, 2011, v. 27, n. 6, p. 771, doi. 10.1002/qre.1157
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- Article
Modelling a maintenance management framework based on PAS 55 standard.
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- Quality & Reliability Engineering International, 2011, v. 27, n. 6, p. 805, doi. 10.1002/qre.1168
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- Article