Works matching IS 04247760 AND DT 2000 AND VI 132 AND IP 4
Results: 10
Space–wavenumber analysis of field scattered from a semi-infinite strip grating.
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- Electrical Engineering in Japan, 2000, v. 132, n. 4, p. 1, doi. 10.1002/1520-6416(200009)132:4<1::AID-EEJ1>3.0.CO;2-P
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A novel three-phase converter using a three-phase series chopper.
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- Electrical Engineering in Japan, 2000, v. 132, n. 4, p. 79, doi. 10.1002/1520-6416(200009)132:4<79::AID-EEJ10>3.0.CO;2-O
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Laser-induced discharge in a rod–plane electrode in the presence of a negative dc electric field.
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- Electrical Engineering in Japan, 2000, v. 132, n. 4, p. 19, doi. 10.1002/1520-6416(200009)132:4<19::AID-EEJ3>3.0.CO;2-K
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Electrical breakdown characteristics of nitrogen and air at cryogenic temperature in a quasi-uniform electric field.
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- Electrical Engineering in Japan, 2000, v. 132, n. 4, p. 28, doi. 10.1002/1520-6416(200009)132:4<28::AID-EEJ4>3.0.CO;2-J
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Internal structure and ER properties in ER suspensions of disperse system under dc electric field.
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- Electrical Engineering in Japan, 2000, v. 132, n. 4, p. 9, doi. 10.1002/1520-6416(200009)132:4<9::AID-EEJ2>3.0.CO;2-Z
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Fundamental characteristics of semiconductor ring laser gyroscopes.
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- Electrical Engineering in Japan, 2000, v. 132, n. 4, p. 73, doi. 10.1002/1520-6416(200009)132:4<73::AID-EEJ9>3.0.CO;2-E
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Recovery time to superconducting state after quench in superconducting fault-current limiter.
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- Electrical Engineering in Japan, 2000, v. 132, n. 4, p. 34, doi. 10.1002/1520-6416(200009)132:4<34::AID-EEJ5>3.0.CO;2-R
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High-frequency voltage oscillation in transformer windings and electrical breakdown properties of interturn insulation immersed in oil at VFT voltage.
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- Electrical Engineering in Japan, 2000, v. 132, n. 4, p. 45, doi. 10.1002/1520-6416(200009)132:4<45::AID-EEJ6>3.0.CO;2-K
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A calculation of torque in motors considering rotor eccentricity.
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- Electrical Engineering in Japan, 2000, v. 132, n. 4, p. 53, doi. 10.1002/1520-6416(200009)132:4<53::AID-EEJ7>3.0.CO;2-M
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Robust stability for singularly perturbed systems with structured state space uncertainties.
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- Electrical Engineering in Japan, 2000, v. 132, n. 4, p. 62, doi. 10.1002/1520-6416(200009)132:4<62::AID-EEJ8>3.0.CO;2-L
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