Works matching IS 03615235 AND DT 2018 AND VI 47 AND IP 8
1
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4519, doi. 10.1007/s11664-018-6407-2
- Lopez-Guede, Jose Manuel;
- Ramos-Hernanz, Josean;
- Altın, Necmi;
- Ozdemir, Saban;
- Kurt, Erol;
- Azkune, Gorka
- Article
2
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4399, doi. 10.1007/s11664-018-6395-2
- Banthí-Barcenas, Juan Carlos;
- Sutara, Frantisek;
- Hernández-Calderón, Isaac
- Article
3
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4515, doi. 10.1007/s11664-018-6389-0
- Momose, Yudai;
- Nomura, Ichirou
- Article
4
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4875, doi. 10.1007/s11664-018-6386-3
- Bashir, Umar;
- Hassan, Zainuriah;
- Ahmed, Naser M.;
- Afzal, Naveed
- Article
5
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4533, doi. 10.1007/s11664-018-6383-6
- Article
6
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4892, doi. 10.1007/s11664-018-6382-7
- Article
7
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4840, doi. 10.1007/s11664-018-6380-9
- Zhu, Daoyun;
- Liao, Min;
- Mu, Zhongfei;
- Wu, Fugen
- Article
8
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4818, doi. 10.1007/s11664-018-6379-2
- Lee, Hsin-Ying;
- Chou, Ping;
- Lee, Ching-Ting
- Article
9
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4902, doi. 10.1007/s11664-018-6378-3
- Petty, C. W.;
- Phillips, J.
- Article
10
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4929, doi. 10.1007/s11664-018-6377-4
- Lu, Zuizhi;
- Fu, Anjie;
- Xia, Siyu;
- Guan, Anxiang;
- Meng, Yingbin;
- Zhou, Liya
- Article
11
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4855, doi. 10.1007/s11664-018-6376-5
- Dakhel, A. A.;
- Khunji, M. A.;
- AlBasri, A. R.
- Article
12
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4882, doi. 10.1007/s11664-018-6375-6
- Sharma, Moolchand;
- Singh, V. P.;
- Singh, Shatrughan;
- Azad, Puneet;
- Ilahi, Bouraoui;
- Madhar, Niyaz Ahamad
- Article
13
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4823, doi. 10.1007/s11664-018-6374-7
- Wei, Kongting;
- Wu, Shengli;
- Wei, Qiang;
- Zheng, Pu;
- Hu, Wenbo;
- Wang, Hongxing
- Article
14
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4508, doi. 10.1007/s11664-018-6373-8
- Ates, H.;
- Bolat, S.;
- Oruc, F.;
- Okyay, A. K.
- Article
15
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4394, doi. 10.1007/s11664-018-6372-9
- Mavridi, N.;
- Zhu, J.;
- Eldose, N. M.;
- Prior, K. A.;
- Moug, R. T.
- Article
16
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4388, doi. 10.1007/s11664-018-6371-x
- Min, Jia-hua;
- Liang, Xiao-yan;
- Liu, Zhao-xin;
- Zhang, Ji-jun;
- Zhao, Yue;
- Wang, Lin-jun;
- Shen, Yue
- Article
17
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4502, doi. 10.1007/s11664-018-6370-y
- Kupa, I.;
- Unal, Y.;
- Cetin, S. S.;
- Durna, L.;
- Topalli, K.;
- Okyay, A. K.;
- Ates, H.
- Article
18
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4845, doi. 10.1007/s11664-018-6369-4
- Abid, Muhammad;
- Somdalen, Ragnar;
- Rodrigo, Marina Sancho
- Article
19
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4757, doi. 10.1007/s11664-018-6368-5
- Bilel, C.;
- Chakir, K.;
- Rebey, A.;
- Alrowaili, Z. A.
- Article
20
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4813, doi. 10.1007/s11664-018-6367-6
- Le, Khai Q.;
- Dang, Ngo Hai
- Article
21
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4799, doi. 10.1007/s11664-018-6366-7
- Khadem Hosseini, Vahideh;
- Ahmadi, Mohammad Taghi;
- Ismail, Razali
- Article
22
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4385, doi. 10.1007/s11664-018-6365-8
- Abe, Tomoki;
- Uchida, Shigeto;
- Tanaka, Keita;
- Fujisawa, Takanobu;
- Kasada, Hirofumi;
- Ando, Koshi;
- Akaiwa, Kazuaki;
- Ichino, Kunio
- Article
23
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4731, doi. 10.1007/s11664-018-6364-9
- Mynbaev, K. D.;
- Bazhenov, N. L.;
- Dvoretsky, S. A.;
- Mikhailov, N. N.;
- Varavin, V. S.;
- Marin, D. V.;
- Yakushev, M. V.
- Article
24
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4742, doi. 10.1007/s11664-018-6363-x
- Rehman, Naveed ur;
- Siddiqui, Mubashir Ali
- Article
25
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4831, doi. 10.1007/s11664-018-6362-y
- Sivakumar, A.;
- Suresh, S.;
- Pradeep, J. Anto;
- Balachandar, S.;
- Martin Britto Dhas, S. A.
- Article
26
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4807, doi. 10.1007/s11664-018-6360-0
- Hajalilou, Abdollah;
- Etemadifar, Reza;
- Abbasi-Chianeh, Vahid;
- Abouzari-Lotf, Ebrahim
- Article
27
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4772, doi. 10.1007/s11664-018-6359-6
- Shehata, Nader;
- Abdelkader, Mohamed
- Article
28
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4910, doi. 10.1007/s11664-018-6358-7
- Liu, Zhongfei;
- Yuan, Jiangtao;
- Li, Kunzhen;
- Xiong, Kuangwei;
- Jin, Shaowei;
- Wang, Peihong
- Article
29
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4721, doi. 10.1007/s11664-018-6357-8
- Azad, Puneet;
- Singh, V. P.;
- Vaish, Rahul
- Article
30
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4863, doi. 10.1007/s11664-018-6355-x
- Sharma, Deepak;
- Jain, Aman;
- Somaiah, Nalla;
- Narayanan, P. Ramesh;
- Kumar, Praveen
- Article
31
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4672, doi. 10.1007/s11664-018-6354-y
- Wang, Gang;
- Zhang, Huaiwu;
- Liu, Cheng;
- Su, Hua;
- Jia, Lijun;
- Li, Jie;
- Huang, Xin;
- Gan, Gongwen
- Article
32
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4663, doi. 10.1007/s11664-018-6353-z
- El-Metwally, E. G.;
- Shakra, A. M.
- Article
33
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4780, doi. 10.1007/s11664-018-6352-0
- Bakali, Emine;
- Selamet, Yusuf;
- Tarhan, Enver
- Article
34
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4703, doi. 10.1007/s11664-018-6351-1
- Zhang, Junming;
- Wang, Peng;
- Chen, Yuanwei;
- Wang, Guowu;
- Wang, Dian;
- Qiao, Liang;
- Wang, Tao;
- Li, Fashen
- Article
35
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4793, doi. 10.1007/s11664-018-6350-2
- Liu, Wanying;
- Zhu, Yabo;
- Chen, Zhiyan;
- Lei, Jia;
- Feng, Peizhong
- Article
36
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4919, doi. 10.1007/s11664-018-6349-8
- Arora, Amit;
- Narang, Sukhleen Bindra
- Article
37
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4634, doi. 10.1007/s11664-018-6348-9
- Tran, Tat-Dat;
- Nguyen, Duy-Hung;
- Pham, Thanh-Huy;
- Nguyen, Duy-Cuong;
- Duong, Thanh-Tung
- Article
38
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4379, doi. 10.1007/s11664-018-6347-x
- Feliciano Crespo, Raquel;
- Perales Perez, Oscar Juan;
- Ramirez, C.
- Article
39
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4493, doi. 10.1007/s11664-018-6346-y
- Denisov, E.;
- Nigmatullin, R.;
- Evdokimov, Y.;
- Timergalina, G.
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4627, doi. 10.1007/s11664-018-6345-z
- Chen, Yongzhou;
- Zhang, Yong;
- Song, Xiaozhen;
- Shen, Ziqin;
- Zhang, Tianyuan
- Article
41
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4678, doi. 10.1007/s11664-018-6339-x
- Manikandan, M.;
- Santhosh Kumar, B.;
- Mukil Raj, T.;
- Moorthy Babu, S.;
- Venkateswaran, C.
- Article
42
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4683, doi. 10.1007/s11664-018-6343-1
- Wadhwa, Girish;
- Raj, Balwinder
- Article
43
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4653, doi. 10.1007/s11664-018-6342-2
- Singh, Anand;
- Pal, Ravinder
- Article
44
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4694, doi. 10.1007/s11664-018-6341-3
- Xiong, Sang;
- Liang, Dong;
- Zhao, Zhuowen
- Article
45
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4737, doi. 10.1007/s11664-018-6340-4
- Shah, Syed Afaq Ali;
- Sayyad, Muhammad Hassan;
- Abdulkarim, Salem;
- Qiao, Qiquan
- Article
46
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4710, doi. 10.1007/s11664-018-6344-0
- Madaka, Ramakrishna;
- Kanneboina, Venkanna;
- Agarwal, Pratima
- Article
47
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4764, doi. 10.1007/s11664-018-6338-y
- Subramanian, E.;
- Santhanamari, P.;
- Murugan, C.
- Article
48
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4642, doi. 10.1007/s11664-018-6336-0
- Feng, Hongliang;
- Huang, Jihua;
- Peng, Xianwen;
- Lv, Zhiwei;
- Wang, Yue;
- Yang, Jian;
- Chen, Shuhai;
- Zhao, Xingke
- Article
49
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4579, doi. 10.1007/s11664-018-6334-2
- Li, Jing;
- Han, Jun;
- Jiang, Tao;
- Luo, Lili;
- Xiang, Yongchun
- Article
50
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4615, doi. 10.1007/s11664-018-6333-3
- Ma, Shengqian;
- Li, Feng;
- Geng, Jiguo;
- Zhu, Mei;
- Li, Suyan;
- Han, Juguang
- Article