Works matching IS 03615235 AND DT 2018 AND VI 47 AND IP 7
1
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4124, doi. 10.1007/s11664-018-6308-4
- Wang, Hongsu;
- Luo, Ruiping;
- Chen, Yang;
- Si, Qi;
- Niu, Xiaodi
- Article
2
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4116, doi. 10.1007/s11664-018-6307-5
- Wang, Feifei;
- Zhou, Fan;
- Wang, Jinshu;
- Liu, Wei;
- Zhang, Quan;
- Yin, Qiao
- Article
3
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4108, doi. 10.1007/s11664-018-6306-6
- Hao, Tianqi;
- Wang, Wei;
- Yu, Dan
- Article
4
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4098, doi. 10.1007/s11664-018-6305-7
- Sharma, Neha;
- Kant, Ravi;
- Sharma, Varun;
- Kumar, Sanjay
- Article
5
- 2018
- Parrey, Khursheed Ahmad;
- Khandy, Shakeel Ahmad;
- Islam, Ishtihadah;
- Laref, Amel;
- Gupta, Dinesh C.;
- Niazi, Asad;
- Aziz, Anver;
- Ansari, S. G.;
- Khenata, R.;
- Rubab, Seemin
- Correction Notice
6
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4149, doi. 10.1007/s11664-018-6314-6
- Article
7
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4140, doi. 10.1007/s11664-018-6313-7
- Asha, B.;
- Harsha, Cirandur Sri;
- Padma, R.;
- Rajagopal Reddy, V.
- Article
8
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4190, doi. 10.1007/s11664-018-6311-9
- Piotrowska, Kamila;
- Ud Din, Rameez;
- Grumsen, Flemming Bjerg;
- Jellesen, Morten Stendahl;
- Ambat, Rajan
- Article
9
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4136, doi. 10.1007/s11664-018-6310-x
- Sonth, Mahesh V.;
- Soma, Savita;
- Gowre, Sanjaykumar C.;
- Biradar, Nagashettappa
- Article
10
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4090, doi. 10.1007/s11664-018-6302-x
- Article
11
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4085, doi. 10.1007/s11664-018-6301-y
- Shao, Li-Huan;
- Shen, Si-Yun;
- Zheng, Hui;
- Zheng, Peng;
- Wu, Qiong;
- Zheng, Liang
- Article
12
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4078, doi. 10.1007/s11664-018-6297-3
- Nekouee, Kh. A.;
- Rahimi, A. H.;
- Haghighi, M. Alineghad;
- Ehsani, N.
- Article
13
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3974, doi. 10.1007/s11664-018-6281-y
- Xiong, Shanxin;
- Wang, Ru;
- Li, Shuaishuai;
- Wu, Bohua;
- Chu, Jia;
- Wang, Xiaoqin;
- Zhang, Runlan;
- Gong, Ming
- Article
14
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4028, doi. 10.1007/s11664-018-6289-3
- Hardiansyah, Andri;
- Chaldun, Elsy Rahimi;
- Nuryadin, Bebeh Wahid;
- Fikriyyah, Anti Khoerul;
- Subhan, Achmad;
- Ghozali, Muhammad;
- Purwasasmita, Bambang Sunendar
- Article
15
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4010, doi. 10.1007/s11664-018-6286-6
- Yeritsyan, H. N.;
- Sahakyan, A. A.;
- Grigoryan, N. E.;
- Harutyunyan, V. V.;
- Grigoryan, B. A.;
- Amatuni, G. A.;
- Petrosyan, V. H.;
- Khachatryan, A. A.;
- Rhodes, C. J.
- Article
16
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4070, doi. 10.1007/s11664-018-6296-4
- Zhang, Wei;
- Liu, Pengcheng;
- Wang, Yifeng;
- Zhu, Kongjun;
- Tai, Guoan;
- Liu, Jinsong;
- Wang, Jing;
- Yan, Kang;
- Zhang, Jianhui
- Article
17
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4038, doi. 10.1007/s11664-018-6290-x
- Jiang, Chengpeng;
- Fan, Xi’an;
- Hu, Jie;
- Feng, Bo;
- Xiang, Qiusheng;
- Li, Guangqiang;
- Li, Yawei;
- He, Zhu
- Article
18
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3983, doi. 10.1007/s11664-018-6282-x
- Fagehi, Hassan;
- Attar, Alaa;
- Lee, Hosung
- Article
19
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3403, doi. 10.1007/s11664-018-6295-5
- Manikandan, V.;
- Li, Xiaogan;
- Mane, R. S.;
- Chandrasekaran, J.
- Article
20
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4056, doi. 10.1007/s11664-018-6293-7
- Wang, Jian;
- Cui, Senlin;
- Rao, Weifeng
- Article
21
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4047, doi. 10.1007/s11664-018-6291-9
- Article
22
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4003, doi. 10.1007/s11664-018-6285-7
- Ahmadi, Ramin;
- Ahmadi, Mohamad Taghi;
- Ismail, Razali
- Article
23
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3996, doi. 10.1007/s11664-018-6284-8
- Yang, Li;
- Ren, Fengzhagn;
- Feng, Qigao;
- Xu, Guangri;
- Li, Xiaobo;
- Li, Yuanchao;
- Zhao, Erqing;
- Ma, Jignjign;
- Fan, Shumin
- Article
24
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4022, doi. 10.1007/s11664-018-6288-4
- Article
25
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4016, doi. 10.1007/s11664-018-6287-5
- Article
26
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3969, doi. 10.1007/s11664-018-6280-z
- Ivanova, E. V.;
- Dementev, P. A.;
- Sitnikova, A. A.;
- Aleksandrov, O. V.;
- Zamoryanskaya, M. V.
- Article
27
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3963, doi. 10.1007/s11664-018-6279-5
- Khan, Ezaz Hasan;
- Thota, Sammaiah;
- Wang, Yiwen;
- Li, Lian;
- Wilusz, Eugene;
- Osgood, Richard;
- Kumar, Jayant
- Article
28
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3912, doi. 10.1007/s11664-018-6270-1
- Aslam, Muhammad;
- Kalyar, Mazhar Ali;
- Raza, Zulfiqar Ali
- Article
29
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3957, doi. 10.1007/s11664-018-6278-6
- Sowpati, A. K.;
- Nelo, M.;
- Varghese, J.;
- Liimatainen, H.;
- Visanko, M.;
- Sebastian, M. T.;
- Jantunen, H.
- Article
30
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3902, doi. 10.1007/s11664-018-6267-9
- Liu, Lintao;
- Yao, Qian;
- Zhang, Junying;
- Dong, Weimin;
- Li, Jing;
- Wang, Jiyang;
- Boughton, Robert I.
- Article
31
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3951, doi. 10.1007/s11664-018-6277-7
- Skaudzius, Ramunas;
- Sakirzanovas, Simas;
- Kareiva, Aivaras
- Article
32
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3934, doi. 10.1007/s11664-018-6274-x
- Dong, Shuwen;
- Yan, Shuang;
- Gao, Wenyuan;
- Liu, Guishan;
- Hao, Hongshun
- Article
33
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3927, doi. 10.1007/s11664-018-6271-0
- Torchynska, T.;
- Khomenkova, L.;
- Slaoui, A.
- Article
34
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4177, doi. 10.1007/s11664-018-6275-9
- Jagtap, Piyush;
- Ramesh Narayan, P.;
- Kumar, Praveen
- Article
35
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3942, doi. 10.1007/s11664-018-6276-8
- Zizka, J.;
- King, S.;
- Every, A.;
- Sooryakumar, R.
- Article
36
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3897, doi. 10.1007/s11664-018-6265-y
- Zhao, Chuan-Zhen;
- Wei, Tong;
- Sun, Xiao-Dong;
- Wang, Sha-Sha;
- Wang, Jun
- Article
37
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3891, doi. 10.1007/s11664-018-6264-z
- Ragab, Tarek;
- Basaran, Cemal
- Article
38
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3876, doi. 10.1007/s11664-018-6263-0
- Pattipaka, Srinivas;
- James, A. R.;
- Dobbidi, Pamu
- Article
39
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3398, doi. 10.1007/s11664-018-6262-1
- Afqir, Mohamed;
- Tachafine, Amina;
- Fasquelle, Didier;
- Elaatmani, Mohamed;
- Carru, Jean-Claude;
- Zegzouti, Abdelouahad;
- Daoud, Mohamed
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3869, doi. 10.1007/s11664-018-6261-2
- Yan, X. Y.;
- Peng, J. F.;
- Yan, S. A.;
- Zheng, X. J.
- Article
41
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3861, doi. 10.1007/s11664-018-6260-3
- Liao, Chen-Yu;
- Chien, Hung-Hua;
- Hao, Yu-Chuan;
- Chen, Chieh-Wen;
- Yu, Ing-Song;
- Chen, Jian-Zhang
- Article
42
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3855, doi. 10.1007/s11664-018-6259-9
- Zeng, Ying;
- Shi, Songjie;
- Zhou, Ling;
- Ling, Furi;
- Yao, Jianquan
- Article
43
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3847, doi. 10.1007/s11664-018-6258-x
- Fan, Heliang;
- Yao, Zhen;
- Xu, Cheng;
- Wang, Xinqiang;
- Yu, Zhichao
- Article
44
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3836, doi. 10.1007/s11664-018-6256-z
- Nouri, K.;
- Bartoli, T.;
- Chrobak, A.;
- Moscovici, J.;
- Bessais, L.
- Article
45
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3829, doi. 10.1007/s11664-018-6255-0
- de Morais, J. E. V.;
- de Castro, A. J. N.;
- Oliveira, R. G. M.;
- do Carmo, F. F.;
- Sales, A. J. M.;
- Sales, J. C.;
- Silva, M. A. S.;
- Gouveia, D. X.;
- Costa, M. M.;
- Rodrigues, A. R.;
- Sombra, A. S. B.
- Article
46
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3817, doi. 10.1007/s11664-018-6254-1
- Shaikh, F. I.;
- Chikhale, L. P.;
- Nadargi, D. Y.;
- Mulla, I. S.;
- Suryavanshi, S. S.
- Article
47
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4170, doi. 10.1007/s11664-018-6253-2
- Signor, L.;
- Kumar, P.;
- Tressou, B.;
- Nadot-Martin, C.;
- Miranda-Ordonez, José;
- Carr, J.;
- Joulain, K.;
- Milhet, X.
- Article
48
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3809, doi. 10.1007/s11664-018-6251-4
- Dar, Sajad Ahmad;
- Srivastava, Vipul;
- Sakalle, Umesh Kumar;
- Parey, Vanshree
- Article
49
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3800, doi. 10.1007/s11664-018-6250-5
- Aziz, Shujahadeen B.;
- Abdullah, Omed Gh.;
- Hussein, Sarkawt A.
- Article
50
- Journal of Electronic Materials, 2018, v. 47, n. 7, p. 3788, doi. 10.1007/s11664-018-6248-z
- Adewumi, Gloria A.;
- Inambao, Freddie;
- Eloka-Eboka, Andrew;
- Revaprasadu, Neerish
- Article