Works matching IS 03615235 AND DT 2018 AND VI 47 AND IP 5
1
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 3045, doi. 10.1007/s11664-018-6183-z
- Yan, Yuxiang;
- Yang, Hua;
- Zhao, Xinxin;
- Zhang, Haimin;
- Jiang, Jinlong
- Article
2
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2997, doi. 10.1007/s11664-018-6179-8
- Ramarao, K.;
- Rajesh Babu, B.;
- Kishore Babu, B.;
- Veeraiah, V.;
- Ramarao, S. D.;
- Rajasekhar, K.;
- Venkateswara Rao, A.
- Article
3
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2988, doi. 10.1007/s11664-018-6174-0
- Anand, Sunny;
- Sarin, R. K.
- Article
4
- 2018
- Sofi, A. H.;
- Shah, M. A.;
- Asokan, K.
- Correction Notice
5
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 3037, doi. 10.1007/s11664-018-6170-4
- Sharma, Anup Kumar;
- Sharma, Ritu
- Article
6
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2920, doi. 10.1007/s11664-018-6165-1
- Cao, Xiaohui;
- Dong, Hongfei;
- Tan, Yuzhuo;
- Meng, Jinhong
- Article
7
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2970, doi. 10.1007/s11664-018-6164-2
- Li, Yan;
- Chen, Li-Li;
- Lian, Xiao-Xue;
- Li, Jiao
- Article
8
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 3005, doi. 10.1007/s11664-018-6163-3
- Liu, Lili;
- Zeng, Xianshi;
- Gou, Qingdong;
- Ye, Yuanxiu;
- Wen, Yufeng;
- Ou, Ping
- Article
9
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2911, doi. 10.1007/s11664-018-6162-4
- Chou, Tzu-Ting;
- Chen, Wei-Yu;
- Fleshman, Collin Jordon;
- Duh, Jenq-Gong
- Article
10
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 3018, doi. 10.1007/s11664-018-6158-0
- Article
11
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2890, doi. 10.1007/s11664-018-6156-2
- Article
12
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2979, doi. 10.1007/s11664-018-6155-3
- Yigiterol, F.;
- Güllü, H. H.;
- Bayraklı, Ö.;
- Yıldız, D. E.
- Article
13
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 3051, doi. 10.1007/s11664-018-6154-4
- Chowdhury, Towhid Hossain;
- Ferdaous, Mohammad Tanvirul;
- Wadi, Mohd. Aizat Abdul;
- Chelvanathan, Puvaneswaran;
- Amin, Nowshad;
- Islam, Ashraful;
- Kamaruddin, Nurhafiza;
- Zin, Muhammad Irsyamuddin M.;
- Ruslan, Mohd Hafidz;
- Sopian, Kamaruzzaman Bin;
- Akhtaruzzaman, Md.
- Article
14
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 3026, doi. 10.1007/s11664-018-6146-4
- Aghazadeh, Mustafa;
- Karimzadeh, Isa;
- Ganjali, Mohammad Reza
- Article
15
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2861, doi. 10.1007/s11664-018-6151-7
- Kour, P.;
- Pradhan, S. K.;
- Kumar, Pawan;
- Sinha, S. K.;
- Kar, Manoranjan
- Article
16
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2808, doi. 10.1007/s11664-018-6150-8
- Merkulov, O. V.;
- Politov, B. V.;
- Chesnokov, K. Yu.;
- Markov, A. A.;
- Leonidov, I. A.;
- Patrakeev, M. V.
- Article
17
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2824, doi. 10.1007/s11664-018-6149-1
- Yang, Wendong;
- Wang, Changhai;
- Arrighi, Valeria
- Article
18
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2800, doi. 10.1007/s11664-018-6148-2
- Kong, Junhan;
- Zhang, Wei;
- Zhang, Yubo;
- Xia, Minghao;
- Wu, Xiuling;
- Wang, Yongqian
- Article
19
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2945, doi. 10.1007/s11664-018-6153-5
- Heiba, Zein K.;
- Mohamed, Mohamed Bakr;
- Abdel Kader, M. H.
- Article
20
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2929, doi. 10.1007/s11664-018-6145-5
- Ma, Hongru;
- Li, Zhuo;
- Tian, Xun;
- Yan, Shaocun;
- Li, Zhe;
- Guo, Xuhong;
- Ma, Yanqing;
- Ma, Lei
- Article
21
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2836, doi. 10.1007/s11664-018-6143-7
- Article
22
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2940, doi. 10.1007/s11664-018-6142-8
- Tan, Feihu;
- Zhang, Qingmeng;
- Zhao, Hongbin;
- Wei, Feng;
- Du, Jun
- Article
23
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2880, doi. 10.1007/s11664-018-6141-9
- Gonçalves, António P.;
- Lopes, Elsa B.;
- Montemor, Maria F.;
- Monnier, Judith;
- Lenoir, Bertrand
- Article
24
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2897, doi. 10.1007/s11664-018-6139-3
- Bajjou, O.;
- Bakour, A.;
- Khenfouch, M.;
- Baitoul, M.;
- Mothudi, B.;
- Maaza, M.;
- Faulques, E.
- Article
25
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2776, doi. 10.1007/s11664-018-6138-4
- Bouzidi, W.;
- Mliki, N.;
- Bessais, L.
- Article
26
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2791, doi. 10.1007/s11664-018-6137-5
- Koç, Sevgul Ozturk;
- Galioglu, Sezin;
- Ozturk, Seckin;
- Kurç, Burcu Akata;
- Koç, Emrah;
- Salamov, Bahtiyar G.
- Article
27
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2905, doi. 10.1007/s11664-018-6136-6
- Kukade, S. D.;
- Bawankar, S. V.
- Article
28
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2851, doi. 10.1007/s11664-018-6135-7
- Trang, Vu Thi;
- Dinh, Ngo Xuan;
- Lan, Hoang;
- Tam, Le Thi;
- Huy, Tran Quang;
- Tuan, Pham Anh;
- Phan, Vu Ngoc;
- Le, Anh-Tuan
- Article
29
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2782, doi. 10.1007/s11664-018-6134-8
- Yuan, Bo;
- He, Zhi-Zhu;
- Liu, Jing
- Article
30
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2871, doi. 10.1007/s11664-018-6133-9
- Ghasemi, Fatemeh;
- Razi, Sepehr;
- Madanipour, Khosro
- Article
31
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2817, doi. 10.1007/s11664-018-6132-x
- Swain, Trilochan;
- Brahma, Gouri Sankhar
- Article
32
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2761, doi. 10.1007/s11664-018-6131-y
- Janghouri, Mohammad;
- Amini, Mostafa M.
- Article
33
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2545, doi. 10.1007/s11664-018-6130-z
- Yue, Lu;
- Ge, Jingjing;
- Luo, Gaixia;
- Bian, Kaiting;
- Yin, Chao;
- Guan, Rongfeng;
- Zhang, Wenhui;
- Zhou, Zheng;
- Wang, Kaixin;
- Guo, Xiufeng
- Article
34
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2752, doi. 10.1007/s11664-018-6129-5
- Wentlent, Luke;
- Alghoul, Thaer M.;
- Greene, Christopher M.;
- Borgesen, Peter
- Article
35
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2746, doi. 10.1007/s11664-018-6128-6
- Kang, Wenbo;
- Zhu, Dongmei;
- Huang, Zhibin;
- Luo, Fa
- Article
36
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2768, doi. 10.1007/s11664-018-6127-7
- Sakina, S. H.;
- Johari, Zaharah;
- Auzar, Zuriana;
- Alias, N. Ezaila;
- Mohamad, Azam;
- Zakaria, N. Aini
- Article
37
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2739, doi. 10.1007/s11664-018-6126-8
- El-Nahass, M. M.;
- Attia, A. A.;
- Ali, H. A. M.;
- Salem, G. F.;
- Ismail, M. I.
- Article
38
- 2018
- Merkisz, Jerzy;
- Fuc, Pawel;
- Lijewski, Piotr;
- Ziolkowski, Andrzej;
- Wojciechowski, Krzysztof T.
- Correction Notice
39
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2526, doi. 10.1007/s11664-018-6121-0
- Borgesen, Peter;
- Wentlent, Luke;
- Hamasha, Sa’d;
- Khasawneh, Saif;
- Shirazi, Sam;
- Schmitz, Debora;
- Alghoul, Thaer;
- Greene, Chris;
- Yin, Liang
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2703, doi. 10.1007/s11664-018-6119-7
- Biglari, Z.;
- Masoudpanah, S. M.;
- Alamolhoda, S.
- Article
41
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2954, doi. 10.1007/s11664-018-6118-8
- Mohammad, Faruq;
- Arfin, Tanvir;
- Al-Lohedan, Hamad A.
- Article
42
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2964, doi. 10.1007/s11664-018-6114-z
- Van, Hoang Nhu;
- Hoan, Bui Thi;
- Nguyen, Khoi Thi;
- Tam, Phuong Dinh;
- Huy, Pham Thanh;
- Pham, Vuong-Hung
- Article
43
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2658, doi. 10.1007/s11664-018-6113-0
- Zheng, Qi;
- Guo, Chenjiang;
- Yuan, Pengliang;
- Ren, Yu-Hui;
- Ding, Jun
- Article
44
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2710, doi. 10.1007/s11664-018-6112-1
- Araújo, E. S.;
- Libardi, J.;
- Faia, P. M.;
- de Oliveira, H. P.
- Article
45
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2841, doi. 10.1007/s11664-018-6111-2
- Xiong, Chun-Hua;
- Sun, Jiu-Xun;
- Wang, Dai-Peng;
- Dong, Yan
- Article
46
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2718, doi. 10.1007/s11664-018-6110-3
- García-Gutiérrez, Diana F.;
- Hernández-Casillas, Laura P.;
- Sepúlveda-Guzmán, Selene;
- Vazquez-Rodriguez, Sofia;
- García-Gutiérrez, Domingo I.
- Article
47
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2731, doi. 10.1007/s11664-018-6109-9
- Relekar, B. P.;
- Mahadik, S. A.;
- Jadhav, S. T.;
- Patil, A. S.;
- Koli, R. R.;
- Lohar, G. M.;
- Fulari, V. J.
- Article
48
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2694, doi. 10.1007/s11664-018-6108-x
- Voitsekhovskii, A. V.;
- Nesmelov, S. N.;
- Dzyadukh, S. M.
- Article
49
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2519, doi. 10.1007/s11664-018-6107-y
- Abassi, H.;
- Bouguila, N.;
- Timoumi, A.
- Article
50
- Journal of Electronic Materials, 2018, v. 47, n. 5, p. 2640, doi. 10.1007/s11664-018-6102-3
- Magdy, Wafaa;
- Mahmoud, Fawzy A.;
- Nassar, Amira H.
- Article