Works matching IS 03615235 AND DT 2018 AND VI 47 AND IP 3
1
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1792, doi. 10.1007/s11664-017-5947-1
- Yueqiu, Gong;
- Hongyi, Chen;
- Shuhong, Xie;
- Xujun, Li
- Article
2
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1798, doi. 10.1007/s11664-017-5950-6
- Ganesh, V.;
- Salem, G.;
- Yahia, I.;
- Yakuphanoglu, F.
- Article
3
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1806, doi. 10.1007/s11664-017-5953-3
- Al-Daraghmeh, Tariq;
- Saleh, Mahmoud;
- Ahmad, Mais;
- Bulos, Basim;
- Shehadeh, Khawla;
- Jafar, Mousa
- Article
4
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1819, doi. 10.1007/s11664-017-5963-1
- Zhang, Zongyang;
- Liu, Xiansong;
- Feng, Shuangjiu;
- Rehman, Khalid
- Article
5
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1824, doi. 10.1007/s11664-017-5966-y
- Borkar, Rajnikant;
- Dahake, Rashmi;
- Rayalu, Sadhana;
- Bansiwal, Amit
- Article
6
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1832, doi. 10.1007/s11664-017-5967-x
- Cheng, Hsien-Chie;
- Chen, You-Wei;
- Chen, Wen-Hwa;
- Lu, Su-Tsai;
- Lin, Shih-Ming
- Article
7
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1847, doi. 10.1007/s11664-017-5972-0
- Jing, W.;
- Shi, J.;
- Xu, Z.;
- Jiang, Z.;
- Wei, Z.;
- Zhou, F.;
- Wu, Q.;
- Cui, Q.
- Article
8
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1859, doi. 10.1007/s11664-017-5974-y
- Hossain, Mohammad;
- Faruque, Mohammad;
- Islam, Mohammad
- Article
9
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1871, doi. 10.1007/s11664-017-5976-9
- Khan, Amin;
- Ali, Zahid;
- Khan, Imad;
- Ahmad, Iftikhar
- Article
10
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1881, doi. 10.1007/s11664-017-5980-0
- Zuo, Yong;
- Bieler, Thomas;
- Zhou, Quan;
- Ma, Limin;
- Guo, Fu
- Article
11
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1896, doi. 10.1007/s11664-017-5984-9
- Tekgül, Atakan;
- Kockar, Hakan;
- Kuru, Hilal;
- Alper, Mürsel;
- ÜnlÜ, C.
- Article
12
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1904, doi. 10.1007/s11664-017-5985-8
- Benlamari, S.;
- Boukhtouta, M.;
- Taïri, L.;
- Meradji, H.;
- Amirouche, L.;
- Ghemid, S.
- Article
13
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1916, doi. 10.1007/s11664-017-5987-6
- Naseem, Swaleha;
- Khan, Shakeel;
- Husain, Shahid;
- Khan, Wasi
- Article
14
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1924, doi. 10.1007/s11664-017-5991-x
- Pallavi, Bandi;
- Sathyan, Sneha;
- Yoshimura, Takuya;
- Kumar, Praveen;
- Anbalagan, Kousika;
- Talluri, Bhusankar;
- Ramanujam, Sarathi;
- Ranjan, Prem;
- Thomas, Tiju
- Article
15
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1753, doi. 10.1007/s11664-017-5992-9
- Zhou, Yining;
- Liu, Hefen;
- Liu, Jianqiang;
- Liu, Haowen
- Article
16
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1932, doi. 10.1007/s11664-017-5993-8
- Vafapoor, Borzoo;
- Fathi, Davood;
- Eskandari, Mehdi
- Article
17
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1937, doi. 10.1007/s11664-017-5994-7
- Astik, Nidhi;
- Jha, Prafulla;
- Pratap, Arun
- Article
18
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1944, doi. 10.1007/s11664-017-5995-6
- Qu, Sheng;
- Zhang, Jihua;
- Wu, Kaituo;
- Wang, Lei;
- Chen, Hongwei
- Article
19
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1952, doi. 10.1007/s11664-017-5996-5
- Thirumoolam, Mani;
- Manikandan, Ananda;
- Sivaramakrishnan, Balaji;
- Kaluvan, Hariharan;
- Gowravaram, Mohan
- Article
20
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1962, doi. 10.1007/s11664-017-5997-4
- Article
21
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1970, doi. 10.1007/s11664-017-5998-3
- Amba Sankar, K.;
- Mohanta, Kallol
- Article
22
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1979, doi. 10.1007/s11664-017-5999-2
- Zhang, Xingyu;
- Tan, Gangfeng;
- Yang, Bo
- Article
23
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1993, doi. 10.1007/s11664-017-6000-0
- Ameri, Mohsen;
- Raoufi, Meysam;
- Zamani-Meymian, M.-R.;
- Samavat, Feridoun;
- Fathollahi, M.-R.;
- Mohajerani, Ezeddin
- Article
24
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2000, doi. 10.1007/s11664-017-6001-z
- Bouderbala, Ibrahim;
- Herbadji, Abdelmadjid;
- Mentar, Loubna;
- Beniaiche, Abdelkrim;
- Azizi, Amor
- Article
25
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2009, doi. 10.1007/s11664-017-6002-y
- Rahnamaye Aliabad, H.;
- Hosseini, N.
- Article
26
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2017, doi. 10.1007/s11664-017-6003-x
- Abdelkafi, Z.;
- Khasskhoussi, G.;
- Abdelmoula, N.
- Article
27
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2025, doi. 10.1007/s11664-017-6004-9
- Abdel-Rahman, Mohamed;
- Haraz, Osama;
- Ashraf, Nadeem;
- Zia, Muhammad;
- Khaled, Usama;
- Elsahfiey, Ibrahim;
- Alshebeili, Saleh;
- Sebak, Abdel
- Article
28
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2032, doi. 10.1007/s11664-017-6008-5
- Maqsood, Saba;
- Rashid, Muhammad;
- Din, Fasih;
- Saddique, M.;
- Laref, A.
- Article
29
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2042, doi. 10.1007/s11664-017-6009-4
- Bhat, Tahir;
- Gupta, Dinesh
- Article
30
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2050, doi. 10.1007/s11664-017-6010-y
- Ozkendir, Osman;
- Gundogmus, H.;
- Saiyasombat, Chatree
- Article
31
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2057, doi. 10.1007/s11664-017-6011-x
- Delhaise, André;
- Perovic, Doug
- Article
32
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2066, doi. 10.1007/s11664-017-6012-9
- Goyal, Gagan;
- Dasgupta, T.
- Article
33
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2073, doi. 10.1007/s11664-017-6014-7
- Lin, Jian;
- Lei, Yongping;
- Fu, Hanguang;
- Guo, Fu
- Article
34
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2082, doi. 10.1007/s11664-017-6015-6
- Tadesse, Melkie;
- Dumitrescu, Delia;
- Loghin, Carmen;
- Chen, Yan;
- Wang, Lichuan;
- Nierstrasz, Vincent
- Article
35
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2093, doi. 10.1007/s11664-017-6016-5
- Azimi, Mona;
- Abbaspour, Mohsen;
- Fazli, Ali;
- Setoodeh, Hamideh;
- Pourabbas, Behzad
- Article
36
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2103, doi. 10.1007/s11664-017-6017-4
- Zaman, Arif;
- Malik, Rizwan;
- Maqbool, Adnan;
- Hussain, Ali;
- Ahmed, Tanveer;
- Song, Tae;
- Kim, Won-Jeong;
- Kim, Myong-Ho
- Article
37
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1762, doi. 10.1007/s11664-017-6018-3
- Li, Hongxia;
- Zhou, You;
- Du, Gang;
- Huang, Yanwei;
- Ji, Zhenguo
- Article
38
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2110, doi. 10.1007/s11664-017-6021-8
- Chen, Wen;
- Wu, Wenwei;
- Zhou, Chong;
- Zhou, Shifang;
- Li, Miaoyu;
- Ning, Yu
- Article
39
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2120, doi. 10.1007/s11664-017-6022-7
- Ahmad, Samir;
- Leong, Cheow;
- Sopian, K.;
- Zaidi, Saleem
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1757, doi. 10.1007/s11664-017-6023-6
- Ahlberg, Patrik;
- Hinnemo, Malkolm;
- Zhang, Shi-Li;
- Olsson, Jörgen
- Article
41
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2135, doi. 10.1007/s11664-017-6024-5
- Mitra, Dana;
- Mitra, Kalyan;
- Dzhagan, Volodymyr;
- Pillai, Nikhil;
- Zahn, Dietrich;
- Baumann, Reinhard
- Article
42
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2143, doi. 10.1007/s11664-017-6025-4
- Rather, Mehraj;
- Samad, Rubiya;
- Want, Basharat
- Article
43
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2155, doi. 10.1007/s11664-017-6026-3
- Chakraborty, Deepannita;
- Munuswamy, Kuppan;
- Shaik, Kaleemulla;
- Nasina, Madhusudhana;
- Dugasani, Sreekantha;
- Inturu, Omkaram
- Article
44
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2165, doi. 10.1007/s11664-017-6027-2
- Zou, Yanzhao;
- Wang, Hong;
- Lai, Xiaoyong;
- Li, Xuefei;
- Zhou, Xiaofei;
- Lin, Guo;
- Liu, Di;
- Chen, Jian;
- Xin, Hong
- Article
45
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2171, doi. 10.1007/s11664-017-6028-1
- Reddy, Y.;
- Shin, Young;
- Kang, In-Ku;
- Lee, Hee
- Article
46
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2177, doi. 10.1007/s11664-017-6029-0
- Rajar, Kausar;
- Sirajuddin;
- Balouch, Aamna;
- Bhanger, M.;
- Sherazi, Tufail;
- Kumar, Raj
- Article
47
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2184, doi. 10.1007/s11664-017-6031-6
- Roslan, Nur;
- Abdullah, Shahino;
- Halizan, Muhammad;
- Bawazeer, Tahani;
- Alsenany, Nourah;
- Alsoufi, Mohammad;
- Majid, Wan;
- Supangat, Azzuliani
- Article
48
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1768, doi. 10.1007/s11664-017-6048-x
- Sarkar, B.;
- Mandal, J.;
- Dalal, M.;
- Bandyopadhyay, A.;
- Satpati, B.;
- Chakrabarti, P.
- Article
49
- 2018
- Kwon, Young;
- Lee, Sejoon;
- Yang, Woochul;
- Park, Chang-Soo;
- Yoon, Im
- Erratum
50
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 1780, doi. 10.1007/s11664-018-6065-4
- Galeti, H.;
- Galvão Gobato, Y.;
- Brasil, M.;
- Taylor, D.;
- Henini, M.
- Article