Works matching IS 03615235 AND DT 2018 AND VI 47 AND IP 2
1
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 903, doi. 10.1007/s11664-017-5789-x
- Guo, Jianqiu;
- Yang, Yu;
- Raghothamachar, Balaji;
- Dudley, Michael;
- Stoupin, Stanislav
- Article
2
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1045, doi. 10.1007/s11664-017-5811-3
- Khan, Sajid;
- Yazdani-Kachoei, Majid;
- Jalali-Asadabadi, Saeid;
- Farooq, Muhammad;
- Ahmad, Iftikhar
- Article
3
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 927, doi. 10.1007/s11664-017-5812-2
- Jiang, Yifan;
- Sung, Woongje;
- Baliga, Jayant;
- Wang, Sizhen;
- Lee, Bongmook;
- Huang, Alex
- Article
4
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 917, doi. 10.1007/s11664-017-5814-0
- Barraza, E.;
- Dunlap-Shohl, Wiley;
- Mitzi, David;
- Stiff-Roberts, Adrienne
- Article
5
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1091, doi. 10.1007/s11664-017-5823-z
- Molaei Imen Abadi, Rouzbeh;
- Saremi, Mehdi
- Article
6
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 932, doi. 10.1007/s11664-017-5824-y
- Zeng, Joy;
- Xu, Xiaoqing;
- Parameshwaran, Vijay;
- Baker, Jon;
- Bent, Stacey;
- Wong, H.-S.;
- Clemens, Bruce
- Article
7
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1140, doi. 10.1007/s11664-017-5828-7
- Berrian, Djaber;
- Fathi, Mohamed;
- Kechouane, Mohamed
- Article
8
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 988, doi. 10.1007/s11664-017-5831-z
- Wu, Zijian;
- Cai, Jian;
- Wang, Junqiang;
- Geng, Zhiting;
- Wang, Qian
- Article
9
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1647, doi. 10.1007/s11664-017-5837-6
- Dias, Marcelino;
- Costa, Thiago;
- Soares, Thiago;
- Silva, Bismarck;
- Cheung, Noé;
- Spinelli, José;
- Garcia, Amauri
- Article
10
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1059, doi. 10.1007/s11664-017-5845-6
- Dadsetani, Mehrdad;
- Nejatipour, Reihan
- Article
11
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 938, doi. 10.1007/s11664-017-5846-5
- Yang, Yu;
- Guo, Jianqiu;
- Raghothamachar, Balaji;
- Chan, Xiaojun;
- Kim, Taejin;
- Dudley, Michael
- Article
12
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1658, doi. 10.1007/s11664-017-5847-4
- Nouri, K.;
- Bouzidi, W.;
- Jemmali, M.;
- Hentech, I.;
- Dhahri, E.;
- Bessais, L.
- Article
13
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 944, doi. 10.1007/s11664-017-5849-2
- Han, Sangmoon;
- Choi, Ilgyu;
- Lee, Kwanjae;
- Lee, Cheul-Ro;
- Lee, Seoung-Ki;
- Hwang, Jeongwoo;
- Chung, Dong;
- Kim, Jin
- Article
14
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1201, doi. 10.1007/s11664-017-5850-9
- Chen, Yunfei;
- Tan, Xuehai;
- Peng, Shou;
- Xin, Cao;
- Delahoy, Alan;
- Chin, Ken;
- Zhang, Chuanjun
- Article
15
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1208, doi. 10.1007/s11664-017-5851-8
- Auzar, Zuriana;
- Johari, Zaharah;
- Sakina, S.;
- Alias, N.
- Article
16
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1125, doi. 10.1007/s11664-017-5853-6
- Zhou, Boru;
- Jie, Wanqi;
- Wang, Tao;
- Xu, Yadong;
- Yang, Fan;
- Yin, Liying;
- Zhang, Binbin;
- Nan, Ruihua
- Article
17
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1311, doi. 10.1007/s11664-017-5854-5
- Elarusi, Abdulmunaem;
- Attar, Alaa;
- Lee, HoSung
- Article
18
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1244, doi. 10.1007/s11664-017-5856-3
- Zhou, Jia;
- Zhu, Zheng-Hou;
- Xiong, Chao
- Article
19
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1080, doi. 10.1007/s11664-017-5861-6
- Hosseinpour, Rabie;
- Izadifard, Morteza;
- Ghazi, Mohammad;
- Bahramian, Bahram
- Article
20
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1099, doi. 10.1007/s11664-017-5862-5
- Liu, Xin;
- Zhuang, Yongyong;
- Xu, Zhuo;
- Li, Fei;
- Li, Jinglei;
- Tian, Ye;
- Dong, Guoxiang
- Article
21
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1218, doi. 10.1007/s11664-017-5863-4
- Yang, Yu;
- Guo, Jianqiu;
- Goue, Ouloide;
- Kim, Jun;
- Raghothamachar, Balaji;
- Dudley, Michael;
- Chung, Gill;
- Sanchez, Edward;
- Manning, Ian
- Article
22
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1713, doi. 10.1007/s11664-017-5865-2
- Khurram, A.;
- ul-Haq, Izhar;
- Khan, Ajmal;
- Hussain, Rizwan;
- Gul, I.
- Article
23
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1117, doi. 10.1007/s11664-017-5866-1
- Ibrahim, Khaled;
- Irannejad, Mehrdad;
- Wales, Benjamin;
- Sanderson, Joseph;
- Musselman, Kevin;
- Yavuz, Mustafa
- Article
24
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1009, doi. 10.1007/s11664-017-5867-0
- Darvishi Gilan, Mahdi;
- Chegel, Raad
- Article
25
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1694, doi. 10.1007/s11664-017-5872-3
- Roma, Maria;
- Kudtarkar, Santosh;
- Kierse, Oliver;
- Sengupta, Dipak;
- Cho, Junghyun
- Article
26
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1107, doi. 10.1007/s11664-017-5874-1
- Rahimzadeh, N.;
- Ghodsi, F.;
- Mazloom, J.
- Article
27
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1730, doi. 10.1007/s11664-017-5876-z
- Sinha, Tarkeshwar;
- Lilhare, Devjyoti;
- Khare, Ayush
- Article
28
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1071, doi. 10.1007/s11664-017-5878-x
- Yu, Hung;
- Anandan, Deepak;
- Hsu, Ching;
- Hung, Yu;
- Su, Chun;
- Wu, Chien;
- Kakkerla, Ramesh;
- Ha, Minh;
- Huynh, Sa;
- Tu, Yung;
- Chang, Edward
- Article
29
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1686, doi. 10.1007/s11664-017-5880-3
- Ha, Trung;
- Le, Huyen;
- Cao, Ha;
- Binh, Nguyen;
- Nguyen, Huy;
- Dang, Le;
- Do, Quan;
- Nguyen, Dzung;
- Lam, Tran;
- Nguyen, Vân-Anh
- Article
30
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1131, doi. 10.1007/s11664-017-5884-z
- Khan, Wilayat;
- Hussain, Sajjad;
- Minar, Jan;
- Azam, Sikander
- Article
31
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1673, doi. 10.1007/s11664-017-5886-x
- Tang, Y.;
- Luo, S.;
- Li, G.;
- Yang, Z.;
- Chen, R.;
- Han, Y.;
- Hou, C.
- Article
32
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 982, doi. 10.1007/s11664-017-5887-9
- Megalini, Ludovico;
- Cabinian, Brian;
- Zhao, Hongwei;
- Oakley, Douglas;
- Bowers, John;
- Klamkin, Jonathan
- Article
33
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1183, doi. 10.1007/s11664-017-5888-8
- Yaseen, Muhammad;
- Ren, Wei;
- Chen, Xiaofeng;
- Feng, Yujun;
- Shi, Peng;
- Wu, Xiaoqing
- Article
34
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1259, doi. 10.1007/s11664-017-5889-7
- Torabi, Z.;
- Arab, A.;
- Ghanbari, F.
- Article
35
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1022, doi. 10.1007/s11664-017-5890-1
- Li, Xin;
- Li, Shuangming;
- Feng, Songke;
- Zhong, Hong
- Article
36
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1232, doi. 10.1007/s11664-017-5892-z
- Yang, Su-Hua;
- Wu, Jian-Ping;
- Huang, Tao-Liang;
- Chung, Bin-Fong
- Article
37
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1285, doi. 10.1007/s11664-017-5893-y
- Ankireddy, Krishnamraju;
- Lavery, Brandon;
- Druffel, Thad
- Article
38
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1223, doi. 10.1007/s11664-017-5894-x
- Kumar, V.;
- Chandra, S.;
- Santosh, R.
- Article
39
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1158, doi. 10.1007/s11664-017-5895-9
- Althowibi, Fahad;
- Ayers, John
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1192, doi. 10.1007/s11664-017-5896-8
- Surzhikov, A.;
- Lysenko, E.;
- Sheveleva, E.;
- Malyshev, A.;
- Astafyev, A.;
- Vlasov, V.
- Article
41
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1250, doi. 10.1007/s11664-017-5897-7
- Li, Chunxiu;
- Xu, Hang;
- Li, Kang;
- Ma, Xiao;
- Wu, Lili;
- Wang, Wenwu;
- Zhang, Jingquan;
- Li, Wei;
- Li, Bing;
- Feng, Lianghuan
- Article
42
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1705, doi. 10.1007/s11664-017-5898-6
- Han, Jing;
- Wang, Yan;
- Tan, Shihai;
- Guo, Fu
- Article
43
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1151, doi. 10.1007/s11664-017-5899-5
- Hu, Weibing;
- Zhang, Wen;
- Wang, Meng;
- Feng, Fu
- Article
44
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1239, doi. 10.1007/s11664-017-5900-3
- Article
45
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1167, doi. 10.1007/s11664-017-5901-2
- Xiong, Shanxin;
- Li, Shuaishuai;
- Zhang, Xiangkai;
- Wang, Ru;
- Zhang, Runlan;
- Wang, Xiaoqin;
- Wu, Bohua;
- Gong, Ming;
- Chu, Jia
- Article
46
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1176, doi. 10.1007/s11664-017-5902-1
- Duraia, El-Shazly;
- Fahami, Abbas;
- Beall, Gary
- Article
47
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 949, doi. 10.1007/s11664-017-5903-0
- Winarski, D.;
- Kreit, E.;
- Heckman, E.;
- Flesburg, E.;
- Haseman, M.;
- Aga, R.;
- Selim, F.
- Article
48
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1271, doi. 10.1007/s11664-017-5910-1
- Ravishankar, S.;
- Balu, A.;
- Nagarethinam, V.
- Article
49
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1279, doi. 10.1007/s11664-017-5911-0
- Salehifar, Samira;
- Shayesteh, Mohammad;
- Hashemian, Saeedeh
- Article
50
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1293, doi. 10.1007/s11664-017-5912-z
- Kansara, Shivam;
- Gupta, Sanjeev;
- Sonvane, Yogesh;
- Nekrasov, Kirill;
- Kichigina, Natalia
- Article