Works matching IS 03615235 AND DT 2018 AND VI 47 AND IP 12
1
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7544, doi. 10.1007/s11664-018-6701-z
- Yao, Mingjun;
- Zhao, Ning;
- Wang, Teng;
- Yu, Daquan;
- Xiao, Zhiyi;
- Ma, Haitao
- Article
2
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7537, doi. 10.1007/s11664-018-6698-3
- Cao, Renping;
- Ye, Yujiao;
- Peng, Qiying;
- Chen, Ting;
- Ao, Hui;
- Xiao, Fen;
- Luo, Zhiyang;
- Liu, Pan
- Article
3
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7531, doi. 10.1007/s11664-018-6697-4
- Jang, Jin-Wook;
- Jeong, Seokwon;
- Yoo, Sejin;
- Kang, Doo-Ho;
- Kwon, Chansik;
- An, Sangho
- Article
4
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7520, doi. 10.1007/s11664-018-6695-6
- Chauhan, Sandeep Singh;
- Joglekar, M. M.;
- Manhas, Sanjeev Kumar
- Article
5
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7514, doi. 10.1007/s11664-018-6694-7
- Zhu, Z.;
- Zhang, Y. W.;
- Song, H. Z.;
- Li, X. J.
- Article
6
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7505, doi. 10.1007/s11664-018-6692-9
- James, Soorya;
- Chishti, Benazir;
- Ansari, Sajid Ali;
- Alothman, Othman Y.;
- Fouad, H.;
- Ansari, Z. A.;
- Ansari, S. G.
- Article
7
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7497, doi. 10.1007/s11664-018-6691-x
- Zheng, Jingxia;
- Wang, Junli;
- Wang, Yaling;
- Yang, Yongzhen;
- Liu, Xuguang;
- Xu, Bingshe
- Article
8
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7484, doi. 10.1007/s11664-018-6690-y
- Mazhari, Mohammad-Peyman;
- Hamadanian, Masood
- Article
9
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7476, doi. 10.1007/s11664-018-6689-4
- Pham, Trung T.;
- Huynh, Trung H.;
- Do, Quyet H.;
- Sporken, Robert
- Article
10
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7472, doi. 10.1007/s11664-018-6688-5
- Xiao, Xiao-Fei;
- Si, Ping-Zhan;
- Ge, Hong-Liang;
- Choi, Chul-Jin
- Article
11
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7463, doi. 10.1007/s11664-018-6687-6
- Lima, João V. M.;
- Boratto, Miguel H.;
- dos Santos, Stevan B. O.;
- Scalvi, Luis V. A.
- Article
12
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7456, doi. 10.1007/s11664-018-6686-7
- Rittiruam, Meena;
- Yangthaisong, Anucha;
- Seetawan, Tosawat
- Article
13
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7449, doi. 10.1007/s11664-018-6685-8
- Wang, Jie;
- Nie, Yanyan;
- Sun, Xiaogang;
- Chen, Wei;
- Li, Xu;
- Huang, Yapan;
- Hu, Hao;
- Wei, Chengcheng;
- Liang, Guodong
- Article
14
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7435, doi. 10.1007/s11664-018-6684-9
- Zhou, Zheng;
- Mo, Liping;
- Liu, Hui;
- Chan, Y. C.;
- Wu, Fengshun
- Article
15
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7429, doi. 10.1007/s11664-018-6683-x
- Liu, Jinhua;
- Wang, Haitao;
- Zhai, Jiwei;
- Shen, Bo;
- Luo, Qin;
- Zhi, Qijun
- Article
16
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7420, doi. 10.1007/s11664-018-6682-y
- Kuo, Dong-Hau;
- Liu, Yen-Tzu;
- Jan, Der-Jun
- Article
17
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7409, doi. 10.1007/s11664-018-6681-z
- Madhu, Charu;
- Kaur, Navneet;
- Kaur, Inderpreet;
- Madhu, Gaurav;
- Srivastava, Ritu
- Article
18
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7401, doi. 10.1007/s11664-018-6680-0
- Huang, Timothy B.;
- Sharma, Himani;
- Manepalli, Rahul;
- Kandanur, Sashi;
- Sundaram, Venky;
- Tummala, Rao R.
- Article
19
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7386, doi. 10.1007/s11664-018-6679-6
- Kannojia, Harindra Kumar;
- Sharma, Surender Kumar;
- Dixit, Pradeep
- Article
20
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7380, doi. 10.1007/s11664-018-6678-7
- Iqbal, Javed;
- Liu, Hanxing;
- Hao, Hua;
- Ullah, Atta;
- Cao, Minghe;
- Yao, Zhonghua
- Article
21
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7372, doi. 10.1007/s11664-018-6677-8
- Li, D.;
- Dai, S.;
- Li, J.;
- Zhang, C.;
- Richard-Plouet, M.;
- Goullet, A.;
- Granier, A.
- Article
22
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7365, doi. 10.1007/s11664-018-6676-9
- Singh, Vijay;
- Singh, N.;
- Pathak, M. S.;
- Watanabe, S.;
- Gundu Rao, T. K.;
- Jadhav, Nitin A.;
- Kwon, Young-Wan
- Article
23
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7358, doi. 10.1007/s11664-018-6675-x
- Fathi, Reza;
- Movlarooy, Tayebeh
- Article
24
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7343, doi. 10.1007/s11664-018-6674-y
- Suganthi, Nachimuthu;
- Pushpanathan, Kuppusamy
- Article
25
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7331, doi. 10.1007/s11664-018-6673-z
- Abbas, Tariq Abdul-Hameed
- Article
26
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7323, doi. 10.1007/s11664-018-6672-0
- Shin, Hyeong-Won;
- Jung, Seung-Boo;
- Lee, Hyo-Soo
- Article
27
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7316, doi. 10.1007/s11664-018-6671-1
- Cheng, Lichun;
- Zhou, Huaiying;
- Xiong, Jilei;
- Pan, Shunkang;
- Liu, Xin
- Article
28
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7309, doi. 10.1007/s11664-018-6670-2
- Saraei, A.;
- Eshraghi, M. J.;
- Tajabadi, F.;
- Massoudi, A.
- Article
29
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7301, doi. 10.1007/s11664-018-6668-9
- Hung, Pham Phi;
- Dat, Tran Tat;
- Dung, Dang Duc;
- Trung, Nguyen Ngoc;
- Hanh, Mai Hong;
- Toan, Dang Ngoc;
- Bac, Luong Huu
- Article
30
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7296, doi. 10.1007/s11664-018-6667-x
- Kim, Kyung Ho;
- Kawai, Hiroki;
- Abe, Yoshio;
- Kawamura, Midori;
- Kiba, Takayuki
- Article
31
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7288, doi. 10.1007/s11664-018-6666-y
- Duraia, El-Shazly M.;
- Fahami, Abbas;
- Beall, Gary W.
- Article
32
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7281, doi. 10.1007/s11664-018-6665-z
- Peng, Rui;
- Li, Yuanxun;
- Yu, Guoliang;
- Lu, Yongcheng;
- Li, Sheng
- Article
33
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7272, doi. 10.1007/s11664-018-6664-0
- Bezerra, J. W. O.;
- Oliveira, R. G. M.;
- Silva, M. A. S.;
- Maciel, T. F.;
- Goes, J. C.;
- Sombra, A. S. B.
- Article
34
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7258, doi. 10.1007/s11664-018-6661-3
- Hwang, Lih-Tyng;
- Sung, Yi-Jung;
- Feng, Chang-Yi;
- Chuang, Eson
- Article
35
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7251, doi. 10.1007/s11664-018-6658-y
- Article
36
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7240, doi. 10.1007/s11664-018-6657-z
- Tombak, Ahmet;
- Imer, Arife Gencer;
- Syan, Ranjdar Hamad Basha;
- Gülcan, Mehmet;
- Gümüş, Selçuk;
- Ocak, Yusuf Selim
- Article
37
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7232, doi. 10.1007/s11664-018-6656-0
- Taheri, M.;
- Feizabadi, Z.;
- Jafari, S.;
- Mansour, N.
- Article
38
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7224, doi. 10.1007/s11664-018-6655-1
- Singh, Brajendra;
- Tandon, Aditya;
- Singh, Priyanka;
- Pandey, Anand Kumar
- Article
39
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7212, doi. 10.1007/s11664-018-6654-2
- Subramanian, Yathavan;
- Ramasamy, Venkatapathy;
- Gubendiran, Ramesh Kumar;
- Srinivasan, Gokul Raj;
- Arulmozhi, Durairajan
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7204, doi. 10.1007/s11664-018-6653-3
- Tan, Mengping;
- Wang, Sanjun;
- Rao, Fengfei;
- Yang, Shie;
- Wang, Fei
- Article
41
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7196, doi. 10.1007/s11664-018-6652-4
- Darwish, A. A. A.;
- Qashou, Saleem I.;
- Khattari, Z.;
- Hawamdeh, Mustafa M.;
- Aldrabee, Allayth;
- Al Garni, S. E.
- Article
42
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7191, doi. 10.1007/s11664-018-6651-5
- Tandon, Nandan;
- Ram-Mohan, L. R.;
- Albrecht, J. D.
- Article
43
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7179, doi. 10.1007/s11664-018-6650-6
- Ito, Kiyohiro;
- Sakai, Natsumi;
- Arai, Masayuki
- Article
44
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7170, doi. 10.1007/s11664-018-6648-0
- Van Tong, Pham;
- Hoa, Nguyen Duc;
- Nha, Ha Thi;
- Van Duy, Nguyen;
- Hung, Chu Manh;
- Van Hieu, Nguyen
- Article
45
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7159, doi. 10.1007/s11664-018-6647-1
- Karabulut, Abdulkerim;
- Dere, A.;
- Al-Sehemi, Abdullah G.;
- Al-Ghamdi, Ahmed A.;
- Yakuphanoglu, F.
- Article
46
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7151, doi. 10.1007/s11664-018-6646-2
- Asadian, Keivan;
- Shahgholi, Nafiseh;
- Ghafari, Somayeh;
- Ebadzadeh, Touradj
- Article
47
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7143, doi. 10.1007/s11664-018-6645-3
- Najjar, Reza;
- Bigdeli, Elham;
- Asadpour-Zeynali, Karim;
- Zaker-Hamidi, Mohammad-Sadegh
- Article
48
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7134, doi. 10.1007/s11664-018-6644-4
- Çiçek, Osman;
- Tan, Serhat O.;
- Tecimer, Hüseyin;
- Altındal, Şemsettin
- Article
49
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7129, doi. 10.1007/s11664-018-6643-5
- Ozen, Yunus;
- Sertel, Tunc;
- Cetin, Saime Sebnem;
- Ozcelik, Suleyman
- Article
50
- Journal of Electronic Materials, 2018, v. 47, n. 12, p. 7114, doi. 10.1007/s11664-018-6642-6
- Xu, Weiwei;
- Wang, Jianwei;
- Laref, Amel;
- Wang, Rui;
- Wu, Xiaozhi
- Article