Works matching IS 03615235 AND DT 2018 AND VI 47 AND IP 11
1
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6909, doi. 10.1007/s11664-018-6616-8
- Ojo, A. A.;
- Dharmadasa, I. M.
- Article
2
- 2018
- Madni, I.;
- Umana-Membreno, G. A.;
- Lei, W.;
- Faraone, L.
- Correction Notice
3
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6716, doi. 10.1007/s11664-018-6649-z
- Manimozhi, R.;
- Ranjith Kumar, D.;
- Gnana Prakash, A. P.
- Article
4
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6918, doi. 10.1007/s11664-018-6622-x
- Le, Hai Viet;
- Nguyen, Quyen Truc Thi;
- Co, Thien Thanh;
- Nguyen, Phuong Kieu Thi;
- Nguyen, Hoang Thai
- Article
5
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6935, doi. 10.1007/s11664-018-6620-z
- Thakur, Neha;
- Mehra, Rajesh;
- Devi, Chandni
- Article
6
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6886, doi. 10.1007/s11664-018-6610-1
- Krishnakumar, V.;
- Kraft, C.;
- Siepchen, B.;
- Späth, B.;
- Drost, C.;
- Peng, S.
- Article
7
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6848, doi. 10.1007/s11664-018-6608-8
- Singh, Joginder;
- Poolla, Rajaram
- Article
8
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6791, doi. 10.1007/s11664-018-6605-y
- Ahmad, Samir Mahmmod;
- Leong, Cheow Siu;
- Winder, Richard W.;
- Sopian, K.;
- Zaidi, Saleem H.
- Article
9
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6923, doi. 10.1007/s11664-018-6618-6
- Cheng, Tien-Hung;
- Chang, Sheng-Po;
- Chang, Shoou-Jinn
- Article
10
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6862, doi. 10.1007/s11664-018-6607-9
- Kumar, Sandeep;
- Singh, Vishvendra Pratap;
- Vaish, Rahul
- Article
11
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6878, doi. 10.1007/s11664-018-6615-9
- Mohan, Raja;
- Paulose, Rini
- Article
12
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6894, doi. 10.1007/s11664-018-6614-x
- Singh, Ranbir;
- Kumar, Manish;
- Shukla, Vivek Kumar
- Article
13
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6378, doi. 10.1007/s11664-018-6613-y
- Bazilchuk, Molly;
- Evenstad, Otto Magnus;
- Zhang, Zhiliang;
- Kristiansen, Helge;
- He, Jianying
- Article
14
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6868, doi. 10.1007/s11664-018-6612-z
- Vafaeenezhad, H.;
- Seyedein, S. H.;
- Aboutalebi, M. R.;
- Eivani, A. R.
- Article
15
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6390, doi. 10.1007/s11664-018-6611-0
- Saravanakumar, B.;
- Shobana, R.;
- Ravi, G.;
- Ganesh, V.;
- Yuvakkumar, R.
- Article
16
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6842, doi. 10.1007/s11664-018-6603-0
- Hou, Shang;
- Yang, Xinyu;
- Fei, Chunlong;
- Sun, Xinhao;
- Chen, Qiang;
- Lin, Pengfei;
- Li, Di;
- Yang, Yintang;
- Zhou, Qifa
- Article
17
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6767, doi. 10.1007/s11664-018-6602-1
- Du, Jinlong;
- Wu, Hongda;
- Wang, Xiaorong;
- Qi, Chengyuan;
- Mao, Wei;
- Ren, Tieqiang;
- Qiao, Qingdong;
- Yang, Zhanxu
- Article
18
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6781, doi. 10.1007/s11664-018-6600-3
- Samavatian, Majid;
- Ilyashenko, Lubov K.;
- Surendar, A.;
- Maseleno, Andino;
- Samavatian, Vahid
- Article
19
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6821, doi. 10.1007/s11664-018-6598-6
- Sinfrônio, F. S. M.;
- Rodrigues, J. A. O.;
- Silva, F. C.;
- Fonseca, R. S. P.;
- de Menezes, A. S.;
- Mouta, R.;
- Sharma, S. K.;
- Castro Junior, M. C.
- Article
20
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6833, doi. 10.1007/s11664-018-6596-8
- Verdier, P.;
- Vasilevskiy, D.;
- Turenne, S.;
- Masut, R. A.
- Article
21
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6383, doi. 10.1007/s11664-018-6595-9
- Li, Chunchun;
- Xiang, Huaicheng;
- Yin, Changzhi;
- Tang, Ying;
- Li, Yuncui;
- Fang, Liang
- Article
22
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6759, doi. 10.1007/s11664-018-6592-z
- Souri, Dariush;
- Ahmadian, Kobra;
- Khezripour, Ali Reza
- Article
23
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6751, doi. 10.1007/s11664-018-6591-0
- Article
24
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6811, doi. 10.1007/s11664-018-6584-z
- Xia, Jiuyang;
- Shen, Yanling;
- Xiao, Chengyue;
- Chen, Wen;
- Wu, Xuehang;
- Wu, Wenwei;
- Wang, Qiangshuai;
- Li, Jintao
- Article
25
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6901, doi. 10.1007/s11664-018-6590-1
- Jafari, Azam;
- Khademi, Siamak;
- Farahmandjou, Majid;
- Darudi, Ahmad;
- Rasuli, Reza
- Article
26
- 2018
- Igoshev, V. I.;
- Kleiman, J. I.;
- Shangguan, D.;
- Wong, S.;
- Michon, U.
- Correction Notice
27
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6607, doi. 10.1007/s11664-018-6586-x
- Avila-Meza, M. F.;
- Zelaya-Angel, O.;
- Gallardo, S.;
- Fernández-Muñoz, J. L.;
- Alfaro-Flores, D. R.;
- Meléndez-Lira, M. A.
- Article
28
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6722, doi. 10.1007/s11664-018-6585-y
- Tsukimoto, Susumu;
- Ise, Tatsuhiko;
- Maruyama, Genta;
- Hashimoto, Satoshi;
- Sakurada, Tsuguo;
- Senzaki, Junji;
- Kato, Tomohisa;
- Kojima, Kazutoshi;
- Okumura, Hajime
- Article
29
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6746, doi. 10.1007/s11664-018-6589-7
- Article
30
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6663, doi. 10.1007/s11664-018-6583-0
- Mahapatra, T.;
- Halder, S.;
- Bhuyan, S.;
- Choudhary, R. N. P.
- Article
31
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6731, doi. 10.1007/s11664-018-6582-1
- Taufique, M. F. N.;
- Haque, Ariful;
- Karnati, Priyanka;
- Ghosh, Kartik
- Article
32
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6373, doi. 10.1007/s11664-018-6581-2
- Bismibanu, A.;
- Vanga, Pradeep Reddy;
- Selvalakshmi, Thangaraj;
- Ashok, M.;
- Alagar, M.
- Article
33
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6335, doi. 10.1007/s11664-018-6580-3
- Magisetty, RaviPrakash;
- Shukla, Anuj;
- Kandasubramanian, Balasubramanian
- Article
34
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6591, doi. 10.1007/s11664-018-6579-9
- Pei, Zhao;
- Su, Donglin;
- Dai, Fei;
- Liao, Yi;
- Xu, Yonggang
- Article
35
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6600, doi. 10.1007/s11664-018-6578-x
- Ersöz Demir, Gülçin;
- Yücedağ, İbrahim;
- Azizian-Kalandaragh, Yashar;
- Altındal, Şemsettin
- Article
36
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6625, doi. 10.1007/s11664-018-6576-z
- Mahaboob, Isra;
- Marini, Jonathan;
- Hogan, Kasey;
- Rocco, Emma;
- Tompkins, Randy P.;
- Lazarus, Nathan;
- Shahedipour-Sandvik, Fatemeh
- Article
37
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6681, doi. 10.1007/s11664-018-6575-0
- Joishy, Sumanth;
- Rajendra, B. V.
- Article
38
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6774, doi. 10.1007/s11664-018-6574-1
- Wang, X. J.;
- Xia, X. A.;
- Meng, W. J.;
- Yang, C. X.;
- Guo, M. Q.;
- Zhao, Y.;
- Yang, F. Q.
- Article
39
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6551, doi. 10.1007/s11664-018-6567-0
- Chen, Cong;
- Tan, Chenlin;
- Zhang, Jiameng;
- Hao, Yanan;
- Huan, Yu;
- Bi, Ke
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6518, doi. 10.1007/s11664-018-6564-3
- Zhu, Jianxiong;
- Song, Weixing;
- Huang, Run
- Article
41
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6540, doi. 10.1007/s11664-018-6573-2
- Wang, Linmeng;
- Wei, Meng;
- Gu, Xiuquan;
- Zhao, Yulong;
- Qiang, Yinghuai
- Article
42
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6655, doi. 10.1007/s11664-018-6572-3
- Tian, Yongshang;
- Li, Shuiyun;
- Sun, Shulin;
- Gong, Yansheng;
- Sun, Shujie;
- Jing, Qiangshan
- Article
43
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6575, doi. 10.1007/s11664-018-6569-y
- Xiong, Shanxin;
- Zhang, Xiangkai;
- Chu, Jia;
- Wang, Xiaoqin;
- Zhang, Runlan;
- Gong, Ming;
- Wu, Bohua
- Article
44
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6701, doi. 10.1007/s11664-018-6568-z
- Anh, Ta Thi Nhat;
- Lan, Hoang;
- Tam, Le Thi;
- Pham, Vuong-Hung;
- Tam, Phuong Dinh
- Article
45
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6557, doi. 10.1007/s11664-018-6563-4
- Berksoy-Yavuz, Ayşe;
- Mensur-Alkoy, Ebru
- Article
46
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6691, doi. 10.1007/s11664-018-6571-4
- Orak, Ikram;
- Kocyigit, Adem;
- Karteri, İbrahim;
- Uruş, Serhan
- Article
47
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6567, doi. 10.1007/s11664-018-6570-5
- Oliva, J.;
- García, C. R.;
- Díaz Torres, L. A.;
- Camacho, C.;
- Guzman-Rocha, M.;
- Romero, M. T.;
- Hirata, G. A.
- Article
48
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6583, doi. 10.1007/s11664-018-6562-5
- AbuSaa, M.;
- Qasrawi, A. F.;
- Shehada, Sufyan R.
- Article
49
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6649, doi. 10.1007/s11664-018-6561-6
- Chen, Hao-Long;
- Wei, Li-Kai;
- Chang, Yee-Shin
- Article
50
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6641, doi. 10.1007/s11664-018-6560-7
- Lebaudy, A.-L.;
- Pesci, R.;
- Fendler, M.
- Article