Works matching IS 03615235 AND DT 2017 AND VI 46 AND IP 9
1
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5374, doi. 10.1007/s11664-017-5441-9
- Arkun, F.;
- Edwall, Dennis;
- Ellsworth, Jon;
- Douglas, Sheri;
- Zandian, Majid;
- Carmody, Michael
- Article
2
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5471, doi. 10.1007/s11664-017-5513-x
- Jóźwikowski, K.;
- Piotrowski, J.;
- Jóźwikowska, A.;
- Kopytko, M.;
- Martyniuk, P.;
- Gawron, W.;
- Madejczyk, P.;
- Kowalewski, A.;
- Markowska, O.;
- Martyniuk, A.;
- Rogalski, A.
- Article
3
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5400, doi. 10.1007/s11664-017-5528-3
- Yasuda, K.;
- Niraula, M.;
- Araki, N.;
- Miyata, M.;
- Kitagawa, S.;
- Kojima, M.;
- Ozawa, J.;
- Tsubota, S.;
- Yamaguchi, T.;
- Agata, Y.
- Article
4
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5430, doi. 10.1007/s11664-017-5563-0
- Article
5
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5479, doi. 10.1007/s11664-017-5586-6
- Easley, Justin;
- Arkun, Erdem;
- Carmody, Michael;
- Phillips, Jamie
- Article
6
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5424, doi. 10.1007/s11664-017-5588-4
- Ogedengbe, O.;
- Swartz, C.;
- Jayathilaka, P.;
- Petersen, J.;
- Sohal, S.;
- LeBlanc, E.;
- Edirisooriya, M.;
- Zaunbrecher, K.;
- Wang, A.;
- Barnes, T.;
- Myers, T.
- Article
7
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5379, doi. 10.1007/s11664-017-5589-3
- LeBlanc, E.;
- Edirisooriya, M.;
- Ogedengbe, O.;
- Noriega, O.;
- Jayathilaka, P.;
- Rab, S.;
- Swartz, C.;
- Diercks, D.;
- Burton, G.;
- Gorman, B.;
- Wang, A.;
- Barnes, T.;
- Myers, T.
- Article
8
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5386, doi. 10.1007/s11664-017-5590-x
- Klipstein, P.;
- Avnon, E.;
- Benny, Y.;
- Berkowicz, E.;
- Cohen, Y.;
- Dobromislin, R.;
- Fraenkel, R.;
- Gershon, G.;
- Glozman, A.;
- Hojman, E.;
- Ilan, E.;
- Karni, Y.;
- Klin, O.;
- Kodriano, Y.;
- Krasovitsky, L.;
- Langof, L.;
- Lukomsky, I.;
- Nevo, I.;
- Nitzani, M.;
- Pivnik, I.
- Article
9
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5448, doi. 10.1007/s11664-017-5596-4
- Eich, D.;
- Schirmacher, W.;
- Hanna, S.;
- Mahlein, K.;
- Fries, P.;
- Figgemeier, H.
- Article
10
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5418, doi. 10.1007/s11664-017-5599-1
- Benson, J.;
- Bubulac, L.;
- Jaime-Vasquez, M.;
- Arias, J.;
- Smith, P.;
- Jacobs, R.;
- Markunas, J.;
- Almeida, L.;
- Stoltz, A.;
- Wijewarnasuriya, P.;
- Peterson, J.;
- Reddy, M.;
- Jones, K.;
- Johnson, S.;
- Lofgreen, D.
- Article
11
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5367, doi. 10.1007/s11664-017-5621-7
- Brown, A.;
- Baril, N.;
- Zuo, D.;
- Almeida, L.;
- Arias, J.;
- Bandara, S.
- Article
12
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5405, doi. 10.1007/s11664-017-5628-0
- Jenkins, Geoffrey;
- Morath, Christian;
- Cowan, Vincent
- Article
13
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5394, doi. 10.1007/s11664-017-5637-z
- Grenouilloux, T.;
- Ferron, A.;
- Péré-Laperne, N.;
- Mathiot, D.
- Article
14
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5361, doi. 10.1007/s11664-017-5646-y
- Sohal, S.;
- Edirisooriya, M.;
- Ogedengbe, O.;
- Petersen, J.;
- Swartz, C.;
- LeBlanc, E.;
- Myers, T.;
- Li, J.;
- Holtz, M.
- Article
15
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5359, doi. 10.1007/s11664-017-5660-0
- Article
16
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5357, doi. 10.1007/s11664-017-5661-z
- Sivananthan, S.;
- Anter, Y.;
- Dhar, N.
- Article
17
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5411, doi. 10.1007/s11664-017-5673-8
- Palosz, W.;
- Trivedi, S.;
- Zhang, D.;
- Meissner, G.;
- Olver, K.;
- DeCuir, E.;
- Wijewarnasuriya, P.;
- Jensen, J.
- Article
18
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5442, doi. 10.1007/s11664-017-5691-6
- Tuaz, Aymeric;
- Ballet, Philippe;
- Biquard, Xavier;
- Rieutord, François
- Article
19
- Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5458, doi. 10.1007/s11664-017-5378-z
- Vallone, Marco;
- Goano, Michele;
- Bertazzi, Francesco;
- Ghione, Giovanni;
- Schirmacher, Wilhelm;
- Hanna, Stefan;
- Figgemeier, Heinrich
- Article