Works matching IS 03615235 AND DT 2017 AND VI 46 AND IP 8
1
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4784, doi. 10.1007/s11664-017-5389-9
- Pham, Vuong-Hung;
- Tam, Phuong;
- Dung, Nguyen;
- Nguyen, Duy-Hung;
- Huy, Pham
- Article
2
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4765, doi. 10.1007/s11664-017-5401-4
- Yahiaoui, Z.;
- Hassairi, M.;
- Dammak, M.
- Article
3
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4750, doi. 10.1007/s11664-017-5406-z
- Kim, Dae-Hyun;
- Park, Jae-Seong;
- Kang, Daesung;
- Seong, Tae-Yeon
- Article
4
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4755, doi. 10.1007/s11664-017-5416-x
- Ali, Bakhtiar;
- Sabri, Mohd;
- Said, Suhana;
- Mahdavifard, Mohammad;
- Sukiman, Nazatul;
- Jauhari, Iswadi
- Article
5
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4774, doi. 10.1007/s11664-017-5417-9
- Wang, Fei;
- Yang, Hua;
- Zhang, Yunchuan;
- Zhang, Haimin
- Article
6
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4791, doi. 10.1007/s11664-017-5418-8
- Kong, Junhan;
- Wang, Yongqian;
- Sun, Qimeng;
- Meng, Dawei
- Article
7
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4798, doi. 10.1007/s11664-017-5423-y
- Chanakian, Sevan;
- Weber, Rochelle;
- Aydemir, Umut;
- Ormeci, Alim;
- Fleurial, Jean-Pierre;
- Bux, Sabah;
- Snyder, G.
- Article
8
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4805, doi. 10.1007/s11664-017-5425-9
- Bounab, S.;
- Bentabet, A.;
- Bouhadda, Y.;
- Belgoumri, Gh.;
- Fenineche, N.
- Article
9
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4842, doi. 10.1007/s11664-017-5443-7
- Srivastava, Amit;
- Kumar, Naresh
- Article
10
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4825, doi. 10.1007/s11664-017-5455-3
- Tang, Xiaoqin;
- Shen, Wei;
- Fu, Zhiyong;
- Liu, Xiaorui;
- Li, Ming
- Article
11
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4815, doi. 10.1007/s11664-017-5461-5
- Yang, Weifang;
- Xu, Han;
- Li, Yuanyuan;
- Wang, Wei
- Article
12
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4848, doi. 10.1007/s11664-017-5462-4
- Article
13
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5039, doi. 10.1007/s11664-017-5465-1
- Ali, Hassan;
- Islam, M.;
- Ali, Irshad;
- Ashiq, Muhammad;
- Ramay, Shahid;
- Mahmood, Asif
- Article
14
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4707, doi. 10.1007/s11664-017-5467-z
- Pirsalami, Sedigheh;
- Zebarjad, Seyed;
- Daneshmanesh, Habib
- Article
15
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4924, doi. 10.1007/s11664-017-5470-4
- Lu, Xiaochi;
- Bian, Wenjie;
- Li, Yaoyao;
- Fu, Zhenxiao;
- Wang, Zhefei;
- Zhu, Haikui;
- Zhang, Qitu
- Article
16
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4875, doi. 10.1007/s11664-017-5471-3
- Montag, Benjamin;
- Reichenberger, Michael;
- Sunder, Madhana;
- Ugorowski, Philip;
- Nelson, Kyle;
- Henson, Luke;
- McGregor, Douglas
- Article
17
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4989, doi. 10.1007/s11664-017-5472-2
- Emah, Joseph;
- George, Nyakno;
- Akpan, Usenobong
- Article
18
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4835, doi. 10.1007/s11664-017-5473-1
- Pavithradevi, S.;
- Suriyanarayanan, N.;
- Boobalan, T.;
- Velumani, S.;
- Chandramohan, M.;
- Manivel Raja, M.
- Article
19
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4865, doi. 10.1007/s11664-017-5474-0
- Rosaiah, P.;
- Hussain, O.;
- Zhu, Jinghui;
- Qiu, Yejun
- Article
20
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4857, doi. 10.1007/s11664-017-5475-z
- Laref, A.;
- Alsagri, M.;
- Laref, S.;
- Luo, S.
- Article
21
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4891, doi. 10.1007/s11664-017-5477-x
- Wang, C.;
- Dai, T.;
- Lu, Y.;
- Shi, Z.;
- Ruan, J.;
- Guo, Y.;
- Liu, X.
- Article
22
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4883, doi. 10.1007/s11664-017-5479-8
- Article
23
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4898, doi. 10.1007/s11664-017-5484-y
- Tingberg, Tobias;
- Ive, Tommy;
- Larsson, Anders
- Article
24
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4955, doi. 10.1007/s11664-017-5485-x
- Tümkaya, Mehmet;
- Dinçer, Furkan;
- Karaaslan, Muharrem;
- Sabah, Cumali
- Article
25
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5057, doi. 10.1007/s11664-017-5486-9
- Kolb, H.;
- Sottong, R.;
- Dasgupta, T.;
- Mueller, E.;
- Boor, J.
- Article
26
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4963, doi. 10.1007/s11664-017-5487-8
- Gianfagna, Carmine;
- Yu, Huan;
- Swaminathan, Madhavan;
- Pulugurtha, Raj;
- Tummala, Rao;
- Antonini, Giulio
- Article
27
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4948, doi. 10.1007/s11664-017-5490-0
- Shahraki, Mohammad;
- Elyasi, Saeed;
- Heydari, Hamid;
- Dalir, Nima
- Article
28
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4716, doi. 10.1007/s11664-017-5491-z
- Wang, Fengyun;
- Song, Longfei;
- Zhang, Hongchao;
- Luo, Linqu;
- Wang, Dong;
- Tang, Jie
- Article
29
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4939, doi. 10.1007/s11664-017-5492-y
- Pinto, Simone;
- Rezende, Mirabel
- Article
30
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4903, doi. 10.1007/s11664-017-5493-x
- Min, Dandan;
- Zhou, Wancheng;
- Qing, Yuchang;
- Luo, Fa;
- Zhu, Dongmei
- Article
31
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5007, doi. 10.1007/s11664-017-5494-9
- Vaghayenegar, M.;
- Jacobs, R.;
- Benson, J.;
- Stoltz, A.;
- Almeida, L.;
- Smith, David
- Article
32
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4917, doi. 10.1007/s11664-017-5496-7
- Amara, A.;
- Abdennouri, N.;
- Drici, A.;
- Abdelkader, D.;
- Bououdina, M.;
- Chaffar Akkari, F.;
- Khemiri, N.;
- Kanzari, M.;
- Bernède, J.
- Article
33
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4931, doi. 10.1007/s11664-017-5497-6
- Uysal, Fatih;
- Kilinc, Enes;
- Kurt, Huseyin;
- Celik, Erdal;
- Dugenci, Muharrem;
- Sagiroglu, Selami
- Article
34
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5073, doi. 10.1007/s11664-017-5498-5
- Jagatheesan, Krishnasamy;
- Ramasamy, Alagirusamy;
- Das, Apurba;
- Basu, Ananjan
- Article
35
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4912, doi. 10.1007/s11664-017-5499-4
- Zhou, Peng;
- Zhang, Qingmeng;
- Zhou, Hao;
- Tan, Feihu;
- Chen, Junyou
- Article
36
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4981, doi. 10.1007/s11664-017-5500-2
- Liu, Yi;
- Si, Jiajia;
- Li, Yunyu;
- Luo, Fa;
- Su, Xiaolei;
- Xu, Jie;
- Wang, Junbo;
- He, Xinhai;
- Shi, Yimin
- Article
37
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5121, doi. 10.1007/s11664-017-5501-1
- Chen, Tong;
- Li, Huili;
- Zhang, Yao;
- Liu, Desheng;
- Chao, Yun;
- Wang, Lingling
- Article
38
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5112, doi. 10.1007/s11664-017-5502-0
- Shimpi, Tushar;
- Drayton, Jennifer;
- Swanson, Drew;
- Sampath, Walajabad
- Article
39
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4697, doi. 10.1007/s11664-017-5504-y
- Wang, Juanjuan;
- Chao, Xiaolian;
- Li, Guangzhao;
- Feng, Lajun;
- Zhao, Kang;
- Ning, Tiantian
- Article
40
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5089, doi. 10.1007/s11664-017-5505-x
- Kiani, E.;
- poorbafrani, A.
- Article
41
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4999, doi. 10.1007/s11664-017-5507-8
- Zhao, Xu;
- Takaya, Satoshi;
- Muraoka, Mikio
- Article
42
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5046, doi. 10.1007/s11664-017-5508-7
- Saramekala, Gopi;
- Tiwari, Pramod
- Article
43
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5064, doi. 10.1007/s11664-017-5509-6
- Hoai, Tran;
- Nga, Nguyen;
- Giang, Luu;
- Huy, Tran;
- Tuan, Phan;
- Binh, Bui
- Article
44
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5020, doi. 10.1007/s11664-017-5510-0
- Asl, Hassan;
- Rozati, Seyed
- Article
45
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5028, doi. 10.1007/s11664-017-5511-z
- Zhang, Zhihao;
- Cao, Huijun;
- Yang, Haifeng;
- Xiao, Yong;
- Li, Mingyu;
- Yu, Yuxi;
- Yao, Shun
- Article
46
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4976, doi. 10.1007/s11664-017-5512-y
- Singh, Gurvinderjit;
- Sathe, Vasant;
- Tiwari, V.
- Article
47
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5107, doi. 10.1007/s11664-017-5514-9
- Castañeda-Miranda, A.;
- Castaño, V.
- Article
48
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5094, doi. 10.1007/s11664-017-5516-7
- Wu, Kuo-Tsai;
- Hwang, Sheng-Jye;
- Lee, Huei-Huang
- Article
49
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5150, doi. 10.1007/s11664-017-5517-6
- Yen, Ming-Hsuan;
- Liu, Jen-Hsiang;
- Song, Jenn-Ming;
- Lin, Shih-Ching
- Article
50
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5136, doi. 10.1007/s11664-017-5518-5
- Meng, Xiangning;
- Lu, Baiyi;
- Zhu, Miaoyong;
- Suzuki, Ryosuke
- Article