Works matching IS 03615235 AND DT 2017 AND VI 46 AND IP 7
1
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3894, doi. 10.1007/s11664-016-4909-3
- Choi, Won;
- Kim, Hyung-Jun;
- Chang, Joonyeon;
- Han, Suk;
- Koo, Hyun
- Article
2
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3899, doi. 10.1007/s11664-016-4934-2
- Gao, Yang;
- Liu, Xizhe;
- Wang, Zhigang
- Article
3
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3942, doi. 10.1007/s11664-016-4938-y
- Auton, Gregory;
- Kumar, Roshan;
- Hill, Ernie;
- Song, Aimin
- Article
4
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3904, doi. 10.1007/s11664-016-4993-4
- Chen, Lei;
- Wang, Zhigang;
- Li, Zhengqiang;
- Zhang, Rui-Qin
- Article
5
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3938, doi. 10.1007/s11664-016-5006-3
- Jiang, Wanrun;
- Gao, Yang;
- Xu, Dexuan;
- Liu, Fang;
- Wang, Zhigang
- Article
6
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3922, doi. 10.1007/s11664-016-5007-2
- Shubina, T.;
- Semina, M.;
- Belyaev, K.;
- Rodina, A.;
- Toropov, A.;
- Ivanov, S.
- Article
7
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3880, doi. 10.1007/s11664-016-5026-z
- Igumbor, E.;
- Mapasha, R.;
- Meyer, W.
- Article
8
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3917, doi. 10.1007/s11664-016-5036-x
- Kwon, Young;
- Lee, Sejoon;
- Yang, Woochul;
- Park, Chang-Soo;
- Yoon, Im
- Article
9
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3910, doi. 10.1007/s11664-016-5037-9
- Koda, Daniel;
- Bechstedt, Friedhelm;
- Marques, Marcelo;
- Teles, Lara
- Article
10
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3826, doi. 10.1007/s11664-016-5070-8
- Li, Haipeng;
- Xu, Runfeng;
- Bi, Zetong;
- Shen, Xiaopeng;
- Han, Kui
- Article
11
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3927, doi. 10.1007/s11664-016-5090-4
- Tomita, Yoko;
- Park, Tea-uk;
- Nakayama, Takashi
- Article
12
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3888, doi. 10.1007/s11664-016-5091-3
- Toropov, A.;
- Shevchenko, E.;
- Shubina, T.;
- Jmerik, V.;
- Nechaev, D.;
- Evropeytsev, E.;
- Kaibyshev, V.;
- Pozina, G.;
- Rouvimov, S.;
- Ivanov, S.
- Article
13
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4062, doi. 10.1007/s11664-016-5177-y
- Das Mahapatra, S.;
- Majumdar, B.;
- Dutta, I.;
- Bhassyvasantha, S.
- Article
14
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4076, doi. 10.1007/s11664-016-5181-2
- Nobari, Amir;
- Maalekian, Mehran;
- Seelig, Karl;
- Pekguleryuz, Mihriban
- Article
15
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4085, doi. 10.1007/s11664-016-5216-8
- Muralidharan, Govindarajan;
- Leonard, Donovan;
- Meyer, Harry
- Article
16
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3831, doi. 10.1007/s11664-016-5234-6
- Hu, Xiang;
- Huang, Qiuping;
- Zhao, Yi;
- Cai, Honglei;
- Lu, Yalin
- Article
17
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3857, doi. 10.1007/s11664-016-5244-4
- Wang, Jia;
- Gao, Yang;
- Zhang, Zhiyuan;
- Xu, Dexuan;
- Wang, Zhigang;
- Zhang, Rui-Qin
- Article
18
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3862, doi. 10.1007/s11664-017-5285-3
- Article
19
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4109, doi. 10.1007/s11664-017-5290-6
- Kushwaha, A.;
- Khenata, R.;
- Bouhemadou, A.;
- Bin-Omran, S.;
- Haddadi, K.
- Article
20
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3867, doi. 10.1007/s11664-017-5305-3
- Ni, Pei-Nan;
- Tong, Jin-Chao;
- Tobing, Landobasa;
- Qiu, Shu-Peng;
- Xu, Zheng-Ji;
- Tang, Xiao-Hong;
- Zhang, Dao-Hua
- Article
21
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4119, doi. 10.1007/s11664-017-5317-z
- Yoon, Im;
- Cho, Hak;
- Cho, Hoon;
- Kwak, Dong;
- Lee, Sejoon
- Article
22
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4100, doi. 10.1007/s11664-017-5320-4
- Mościcki, A.;
- Smolarek-Nowak, A.;
- Felba, J.;
- Kinart, A.
- Article
23
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4267, doi. 10.1007/s11664-017-5321-3
- Jarupoom, Parkpoom;
- Jaita, Pharatree;
- Boothrawong, Narongdetch;
- Phatungthane, Thanatep;
- Sanjoom, Ratabongkot;
- Rujijanagul, Gobwute;
- Cann, David
- Article
24
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4344, doi. 10.1007/s11664-017-5324-0
- Filho, J.;
- Rodrigues Junior, C.;
- Sousa, D.;
- Oliveira, R.;
- Costa, M.;
- Barroso, G.;
- Sombra, A.
- Article
25
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4160, doi. 10.1007/s11664-017-5327-x
- Khan, M.;
- Shahed, S.;
- Yuta, N.;
- Komeda, T.
- Article
26
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4126, doi. 10.1007/s11664-017-5340-0
- Bilen, Murat;
- Gürü, Metin;
- Çakanyildirim, Çetin
- Article
27
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4093, doi. 10.1007/s11664-017-5341-z
- Noori, Maryam;
- Jafari, Mohammad;
- Hosseini, Sayed;
- Shahedi, Zahra
- Article
28
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4034, doi. 10.1007/s11664-017-5344-9
- Sun, Fenglian;
- Zhu, Yan;
- Li, Xuemei
- Article
29
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4133, doi. 10.1007/s11664-017-5348-5
- Slassi, A.;
- Hammi, M.;
- El Rhazouani, O.
- Article
30
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4187, doi. 10.1007/s11664-017-5349-4
- Sasikumar, S.;
- Saravanan, R.
- Article
31
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3837, doi. 10.1007/s11664-017-5350-y
- Bhandari, Sagar;
- Lee, Gil-Ho;
- Kim, Philip;
- Westervelt, Robert
- Article
32
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4140, doi. 10.1007/s11664-017-5352-9
- Vasumathi, R.;
- Thayumanavan, A.;
- Sriram, S.
- Article
33
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4206, doi. 10.1007/s11664-017-5353-8
- Kanwal, Kiran;
- Ismail, Bushra;
- Rajani, K.;
- Kissinger, N.;
- Zeb, Aurang
- Article
34
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4294, doi. 10.1007/s11664-017-5354-7
- Khadem Hosseini, Vahideh;
- Ahmadi, Mohammad;
- Afrang, Saeid;
- Ismail, Razali
- Article
35
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4384, doi. 10.1007/s11664-017-5355-6
- Chang, Chia-Yun;
- Hung, Fei-Yi;
- Lui, Truan-Sheng
- Article
36
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4147, doi. 10.1007/s11664-017-5356-5
- Yang, S.;
- Chang, C.;
- Zhu, Z.;
- Lin, Y.;
- Kao, C.
- Article
37
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4152, doi. 10.1007/s11664-017-5357-4
- Feng, Hongliang;
- Huang, Jihua;
- Yang, Jian;
- Zhou, Shaokun;
- Zhang, Rong;
- Chen, Shuhai
- Article
38
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4214, doi. 10.1007/s11664-017-5359-2
- Phan, T.;
- Tran, N.;
- Kim, D.;
- Dang, N.;
- Manh, D.;
- Bach, T.;
- Liu, C.;
- Lee, B.
- Article
39
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4057, doi. 10.1007/s11664-017-5361-8
- Article
40
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4166, doi. 10.1007/s11664-017-5362-7
- Patel, Satyanarayan;
- Chauhan, Aditya;
- Madhar, Niyaz;
- Ilahi, Bouraoui;
- Vaish, Rahul
- Article
41
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4276, doi. 10.1007/s11664-017-5363-6
- Baraz, Nalan;
- Yücedağ, İbrahim;
- Azizian-Kalandaragh, Yashar;
- Ersöz, Gülçin;
- Orak, İkram;
- Altındal, Şemsettin;
- Akbari, Bashir;
- Akbari, Hossein
- Article
42
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4236, doi. 10.1007/s11664-017-5364-5
- Ebrahimi, P.;
- Kolahdouz, M.;
- Iraj, M.;
- Ganjian, M.;
- Aghababa, H.;
- Asl-Soleimani, E.;
- Radamson, Henry
- Article
43
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 3987, doi. 10.1007/s11664-017-5365-4
- Bilisik, Kadir;
- Kaya, Gaye
- Article
44
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4250, doi. 10.1007/s11664-017-5367-2
- Mokhtari, S.;
- Safa, S.;
- Khayatian, A.;
- Azimirad, R.
- Article
45
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4172, doi. 10.1007/s11664-017-5370-7
- Yang, Young;
- Aziz, Shahid;
- Mehdi, Syed;
- Sajid, Memoon;
- Jagadeesan, Srikanth;
- Choi, Kyung
- Article
46
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4180, doi. 10.1007/s11664-017-5371-6
- Zhang, Xinguo;
- Pan, Jialiang;
- Mo, Fuwang
- Article
47
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4414, doi. 10.1007/s11664-017-5372-5
- Suresh, C.;
- Srikrishna, P.
- Article
48
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4227, doi. 10.1007/s11664-017-5373-4
- Mahdi, Mohamed;
- Ibrahim, K.;
- Hmood, Arshad;
- Ahmed, Naser;
- Mustafa, Falah
- Article
49
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4197, doi. 10.1007/s11664-017-5374-3
- Sun, Ren;
- Sui, Yanwei;
- Qi, Jiqiu;
- Wei, Fuxiang;
- He, Yezeng;
- Chen, Xiao;
- Meng, Qingkun;
- Sun, Zhi
- Article
50
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4256, doi. 10.1007/s11664-017-5376-1
- Pettersen, Sigurd;
- Redford, Keith;
- Njagi, John;
- Kristiansen, Helge;
- Helland, Susanne;
- Kalland, Erik;
- Goia, Dan;
- Zhang, Zhiliang;
- He, Jianying
- Article