Works matching IS 03615235 AND DT 2017 AND VI 46 AND IP 5
1
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2604, doi. 10.1007/s11664-016-4802-0
- Ren, Fei;
- Schmidt, Robert;
- Case, Eldon;
- An, Ke
- Article
2
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 3200, doi. 10.1007/s11664-016-4804-y
- Yamamoto, Akio;
- Takeuchi, Tsunehiro
- Article
3
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2611, doi. 10.1007/s11664-016-4824-7
- Zhang, Xiong;
- Peng, Kunling;
- Guo, Lijie;
- Yan, Yanchi;
- Zhan, Hen;
- Lu, Xu;
- Gu, Haoshuang;
- Zhou, Xiaoyuan
- Article
4
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2616, doi. 10.1007/s11664-016-4826-5
- Prem Kumar, D.;
- Chetty, R.;
- Femi, O.;
- Chattopadhyay, K.;
- Malar, P.;
- Mallik, R.
- Article
5
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2623, doi. 10.1007/s11664-016-4828-3
- Eum, A-Young;
- Choi, Soon-Mok;
- Lee, Soonil;
- Seo, Won-Seon;
- Park, Jae-Soung;
- Yang, Seung-Ho;
- Kim, Il-Ho
- Article
6
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2629, doi. 10.1007/s11664-016-4833-6
- Liu, Hongliang;
- Zhang, Xin;
- Li, Songhao;
- Zhou, Ziqun;
- Liu, Yanqin;
- Zhang, Jiuxing
- Article
7
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2634, doi. 10.1007/s11664-016-4847-0
- Song, Kwon-Min;
- Shin, Dong-Kil;
- Jang, Kyung-Wook;
- Choi, Soon-Mok;
- Lee, Soonil;
- Seo, Won-Seon;
- Kim, Il-Ho
- Article
8
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2640, doi. 10.1007/s11664-016-4849-y
- Nie, G.;
- Suzuki, S.;
- Tomida, T.;
- Sumiyoshi, A.;
- Ochi, T.;
- Mukaiyama, K.;
- Kikuchi, M.;
- Guo, J.;
- Yamamoto, A.;
- Obara, H.
- Article
9
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2645, doi. 10.1007/s11664-016-4857-y
- Cao, X.;
- Cai, W.;
- Deng, H.;
- Gao, R.;
- Fu, C.;
- Pan, F.
- Article
10
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2652, doi. 10.1007/s11664-016-4858-x
- Williams, Jared;
- Morelli, Donald
- Article
11
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2662, doi. 10.1007/s11664-016-4865-y
- Deng, Shuping;
- Liu, Hongxia;
- Li, Decong;
- Wang, Jinsong;
- Cheng, Feng;
- Shen, Lanxian;
- Deng, Shukang
- Article
12
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2668, doi. 10.1007/s11664-016-4868-8
- Bercegol, A.;
- Christophe, V.;
- Keshavarz, M.;
- Vasilevskiy, D.;
- Turenne, S.;
- Masut, R.
- Article
13
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2676, doi. 10.1007/s11664-016-4875-9
- Quan, Rui;
- Zhou, Wei;
- Yang, Guangyou;
- Quan, Shuhai
- Article
14
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 3207, doi. 10.1007/s11664-016-4888-4
- Oshima, Keisuke;
- Inoue, Junta;
- Sadakata, Shifumi;
- Shiraishi, Yukihide;
- Toshima, Naoki
- Article
15
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2684, doi. 10.1007/s11664-016-4893-7
- Bouyrie, Y.;
- Ohorodniichuk, V.;
- Sassi, S.;
- Masschelein, P.;
- Dauscher, A.;
- Candolfi, C.;
- Lenoir, B.
- Article
16
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2691, doi. 10.1007/s11664-016-4905-7
- Article
17
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2697, doi. 10.1007/s11664-016-4913-7
- Liu, Shuai;
- Peng, Nan;
- Bai, Yu;
- Ma, Dayan;
- Ma, Fei;
- Xu, Kewei
- Article
18
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 3215, doi. 10.1007/s11664-016-4920-8
- Zhan, Heng;
- Peng, Kunling;
- Alsharafi, Rashed;
- Chen, Qiufan;
- Yao, Wei;
- Lu, Xu;
- Wang, Guoyu;
- Sun, Xiaonan;
- Zhou, Xiaoyuan
- Article
19
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2705, doi. 10.1007/s11664-016-4937-z
- Miyazaki, Yuzuru;
- Hamada, Haruki;
- Hayashi, Kei;
- Yubuta, Kunio
- Article
20
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2710, doi. 10.1007/s11664-016-4944-0
- Hayashi, K.;
- Eguchi, M.;
- Miyazaki, Y.
- Article
21
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2717, doi. 10.1007/s11664-016-4945-z
- An, Tae-Ho;
- Lim, Young;
- Seo, Won-Seon;
- Park, Cheol-Hee;
- Yoo, Mi;
- Park, Chan;
- Lee, Chang;
- Shim, Ji
- Article
22
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2724, doi. 10.1007/s11664-016-4946-y
- González, J.;
- Sánchez, Vicenta;
- Wang, Chumin
- Article
23
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2737, doi. 10.1007/s11664-016-4952-0
- Melnikov, A.;
- Kostishin, V.;
- Alenkov, V.
- Article
24
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2746, doi. 10.1007/s11664-016-4953-z
- Xie, Dewen;
- Xu, Jingtao;
- Liu, Zhu;
- Liu, Guoqiang;
- Shao, Hezhu;
- Tan, Xiaojian;
- Jiang, Haochuan;
- Jiang, Jun
- Article
25
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 3221, doi. 10.1007/s11664-016-4954-y
- Bian, Tiezheng;
- Peck, Jamie;
- Cottrell, Stephen;
- Jayasooriya, Upali;
- Chao, Yimin
- Article
26
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2752, doi. 10.1007/s11664-016-4955-x
- Otsuka, Mioko;
- Homma, Ryoei;
- Hasegawa, Yasuhiro
- Article
27
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2765, doi. 10.1007/s11664-016-4960-0
- Xu, Jingtao;
- Wu, Jiazhen;
- Heguri, Satoshi;
- Tanabe, Yoichi;
- Liu, Guo-Qiang;
- Jiang, Jun;
- Jiang, Haochuan;
- Tanigaki, Katsumi
- Article
28
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2770, doi. 10.1007/s11664-016-4962-y
- Yoon, Sang;
- Dharmaiah, Peyala;
- Kim, Hyo-Seob;
- Lee, Chul;
- Hong, Soon-Jik;
- Koo, Jar
- Article
29
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2778, doi. 10.1007/s11664-016-4967-6
- Bulat, L.;
- Pshenay-Severin, D.;
- Ivanov, A.;
- Osvenskii, V.;
- Parkhomenko, Yu.
- Article
30
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2782, doi. 10.1007/s11664-016-4968-5
- Murata, Masayuki;
- Yamamoto, Atsushi;
- Hasegawa, Yasuhiro;
- Komine, Takashi
- Article
31
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2790, doi. 10.1007/s11664-016-4976-5
- Sassi, S.;
- Candolfi, C.;
- Ohorodniichuk, V.;
- Gendarme, C.;
- Masschelein, P.;
- Dauscher, A.;
- Lenoir, B.
- Article
32
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2797, doi. 10.1007/s11664-016-4977-4
- Huang, Ben;
- Zhai, Pengcheng;
- Yang, Xuqiu;
- Li, Guodong
- Article
33
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2807, doi. 10.1007/s11664-016-4978-3
- Pengfei, Wen;
- Pengcheng, Zhai;
- Shijie, Ding;
- Bo, Duan;
- Yao, Li
- Article
34
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2812, doi. 10.1007/s11664-016-4985-4
- Zhao, Yifen;
- Li, Decong;
- Liu, Zuming
- Article
35
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2822, doi. 10.1007/s11664-016-4989-0
- Su, C.;
- Zhu, D.;
- Deng, Y.;
- Wang, Y.;
- Liu, X.
- Article
36
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2832, doi. 10.1007/s11664-016-4990-7
- Sun, Yajing;
- Chen, Gang;
- Bai, Guanghui;
- Yang, Xuqiu;
- Li, Peng;
- Zhai, Pengcheng
- Article
37
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2839, doi. 10.1007/s11664-016-4991-6
- Son, Geonsik;
- Lee, Kyu;
- Choi, Soon-Mok
- Article
38
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2844, doi. 10.1007/s11664-016-4992-5
- Cornett, Jane;
- Chen, Baoxing;
- Haidar, Samer;
- Berney, Helen;
- McGuinness, Pat;
- Lane, Bill;
- Gao, Yuan;
- He, Yifan;
- Sun, Nian;
- Dunham, Marc;
- Asheghi, Mehdi;
- Goodson, Ken;
- Yuan, Yi;
- Najafi, Khalil
- Article
39
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 3227, doi. 10.1007/s11664-016-4996-1
- Deng, Y.;
- Hu, T.;
- Su, C.;
- Yuan, X.
- Article
40
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 3235, doi. 10.1007/s11664-016-4997-0
- Taniguchi, Tatsuhiko;
- Sakane, Shunya;
- Aoki, Shunsuke;
- Okuhata, Ryo;
- Ishibe, Takafumi;
- Watanabe, Kentaro;
- Suzuki, Takeyuki;
- Fujita, Takeshi;
- Sawano, Kentarou;
- Nakamura, Yoshiaki
- Article
41
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2847, doi. 10.1007/s11664-016-5001-8
- Wang, Lijun;
- Zheng, Shuqi;
- Chen, Hong
- Article
42
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2854, doi. 10.1007/s11664-016-5009-0
- Singh, Baljit;
- Baharin, Nuraida;
- Remeli, Muhammad;
- Oberoi, Amandeep;
- Date, Abhijit;
- Akbarzadeh, Aliakbar
- Article
43
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2860, doi. 10.1007/s11664-016-5013-4
- Chen, Chen;
- Zhang, Long;
- Dong, Jianying;
- Xu, Bo
- Article
44
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2867, doi. 10.1007/s11664-016-5014-3
- Liu, Hong-xia;
- Deng, Shu-ping;
- Shen, Lan-xian;
- Wang, Jin-song;
- Cheng, Feng;
- Deng, Shu-kang
- Article
45
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2873, doi. 10.1007/s11664-016-5016-1
- Koyano, M.;
- Mizutani, S.;
- Hayashi, Y.;
- Nishino, S.;
- Miyata, M.;
- Tanaka, T.;
- Fukuda, K.
- Article
46
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2880, doi. 10.1007/s11664-016-5017-0
- Wang, Jin-song;
- Liu, Hong-xia;
- Deng, Shuping;
- Li, De-cong;
- Shen, Lan-xian;
- Cheng, Feng;
- Deng, Shu-kang
- Article
47
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2886, doi. 10.1007/s11664-016-5018-z
- Yu, C.;
- Zheng, S.;
- Deng, Y.;
- Su, C.;
- Wang, Y.
- Article
48
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2894, doi. 10.1007/s11664-016-5019-y
- Zhang, Li-Bo;
- Qi, Hui-Long;
- Gao, Jun-Ling;
- Mao, Tao;
- Di, Jia-xin;
- Xu, Gui-Ying
- Article
49
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2900, doi. 10.1007/s11664-016-5024-1
- Nuthongkum, Pilaipon;
- Sakulkalavek, Aparporn;
- Sakdanuphab, Rachsak
- Article
50
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 3242, doi. 10.1007/s11664-016-5035-y
- Lee, Hwijong;
- Kim, Gwansik;
- Lee, Byunghun;
- Lee, Kyu;
- Lee, Wooyoung
- Article