Works matching IS 03615235 AND DT 2017 AND VI 46 AND IP 2
1
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 766, doi. 10.1007/s11664-016-4830-9
- Saoud, Fatma;
- Rabah, Khenata;
- Bouhemadou, Abdelmadjid;
- Plenet, Jean;
- Henini, Mohamed;
- Djabou, Rihabe
- Article
2
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 936, doi. 10.1007/s11664-016-4851-4
- Lin, Yung-Hao;
- Lee, Ching-Ting
- Article
3
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 903, doi. 10.1007/s11664-016-4883-9
- Ali, Akbar;
- Grössinger, R.;
- Imran, Muhammad;
- Khan, M.;
- Elahi, Asmat;
- Akhtar, Majid;
- Mustafa, Ghulam;
- Khan, Muhammad;
- Ullah, Hafeez;
- Murtaza, Ghulam;
- Ahmad, Mukhtar
- Article
4
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 758, doi. 10.1007/s11664-016-4939-x
- Xiang, Zhenbo;
- Wang, Yi;
- Ju, Peng;
- Zhang, Dun
- Article
5
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 802, doi. 10.1007/s11664-016-4942-2
- Rocha-Rocha, O.;
- Cortez-Valadez, M.;
- Hernández-Martínez, A.;
- Gámez-Corrales, R.;
- Alvarez, Ramón;
- Britto-Hurtado, R.;
- Delgado-Beleño, Y.;
- Martinez-Nuñez, C.;
- Pérez-Rodríguez, A.;
- Arizpe-Chávez, H.;
- Flores-Acosta, M.
- Article
6
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 866, doi. 10.1007/s11664-016-4943-1
- Singh, Charanjeet;
- Bindra Narang, S.
- Article
7
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 872, doi. 10.1007/s11664-016-4948-9
- Elarusi, Abdulmunaem;
- Fagehi, Hassan;
- Lee, Hosung;
- Attar, Alaa
- Article
8
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 808, doi. 10.1007/s11664-016-4949-8
- Edukondalu, Avula;
- Sripathi, T.;
- Kareem Ahmmad, Shaik;
- Rahman, Syed;
- Sivakumar, K.
- Article
9
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 911, doi. 10.1007/s11664-016-4950-2
- Gao, Yong;
- Long, Qiwei;
- Nong, Rong;
- Wang, Tianman;
- Huang, Yingheng;
- Liao, Sen;
- Zhang, Huaxin
- Article
10
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1079, doi. 10.1007/s11664-016-4951-1
- Jiang, Qiang;
- Chen, Xiao;
- Li, Lin;
- Feng, Chuanqi;
- Guo, Zaiping
- Article
11
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 742, doi. 10.1007/s11664-016-4959-6
- Article
12
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 747, doi. 10.1007/s11664-016-4963-x
- Article
13
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 782, doi. 10.1007/s11664-016-4964-9
- Dehzangi, Arash;
- Larki, Farhad;
- Mohd Razip Wee, M.;
- Wichmann, Nicolas;
- Majlis, Burhanuddin;
- Bollaert, Sylvain
- Article
14
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 790, doi. 10.1007/s11664-016-4969-4
- Sahiner, Nurettin;
- Demirci, Sahin;
- Yildiz, Mustafa
- Article
15
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 833, doi. 10.1007/s11664-016-4970-y
- Kwon, Yong-Hyuk;
- Bang, Hee-Seon;
- Bang, Han-Sur
- Article
16
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 856, doi. 10.1007/s11664-016-4971-x
- Fal, Jacek;
- Cholewa, Marian;
- Gizowska, Magdalena;
- Witek, Adam;
- ŻyŁa, GaweŁ
- Article
17
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 848, doi. 10.1007/s11664-016-4972-9
- Park, Sang;
- Jin, Younghwan;
- Ahn, Kyunghan;
- Chung, In;
- Yoo, Chung-Yul
- Article
18
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 974, doi. 10.1007/s11664-016-4973-8
- More, A.;
- Patil, R.;
- Dalavi, D.;
- Suryawanshi, M.;
- Burungale, V.;
- Kim, J.;
- Patil, P.
- Article
19
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 817, doi. 10.1007/s11664-016-4974-7
- Conseil-Gudla, Hélène;
- Jellesen, Morten;
- Ambat, Rajan
- Article
20
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 841, doi. 10.1007/s11664-016-4975-6
- Yeritsyan, H.;
- Sahakyan, A.;
- Grigoryan, N.;
- Harutyunyan, V.;
- Tsakanov, V.;
- Grigoryan, B.;
- Yeremyan, A.;
- Amatuni, G.
- Article
21
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 888, doi. 10.1007/s11664-016-4980-9
- Article
22
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 826, doi. 10.1007/s11664-016-4981-8
- Han, L.;
- Hua, X.;
- Zhu, H.;
- Yang, J.;
- Yang, H.;
- Yan, Z.;
- Zhang, T.
- Article
23
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 955, doi. 10.1007/s11664-016-4982-7
- Lan, Rui;
- Endo, Rie;
- Kuwahara, Masashi;
- Kobayashi, Yoshinao;
- Susa, Masahiro
- Article
24
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 775, doi. 10.1007/s11664-016-4984-5
- Dehimi, Sai̇d;
- Dehimi, Lakhdar;
- Asar, Tarik;
- Özçelik, Süleyman
- Article
25
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 687, doi. 10.1007/s11664-016-4988-1
- Khare, Ayush;
- Mishra, Shubhra;
- Kshatri, D.;
- Tiwari, Sanjay
- Article
26
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1067, doi. 10.1007/s11664-016-4994-3
- Wei, Xiuqin;
- Li, Yinghui;
- Huang, Huizhen
- Article
27
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 895, doi. 10.1007/s11664-016-4995-2
- Hu, W.;
- Zhao, W.;
- Fan, J.;
- Wu, S.;
- Zhang, J.
- Article
28
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1030, doi. 10.1007/s11664-016-4998-z
- Ahmed, Suhel;
- Barik, Subrat
- Article
29
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 882, doi. 10.1007/s11664-016-4999-y
- Yüksel, Ö.;
- Kuş, M.;
- Yıldırım, M.
- Article
30
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 982, doi. 10.1007/s11664-016-5003-6
- Guo, Huilong;
- Lu, Mangeng;
- Liang, Liyan;
- Wu, Kun;
- Ma, Dong;
- Xue, Wei
- Article
31
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 917, doi. 10.1007/s11664-016-5004-5
- Article
32
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1093, doi. 10.1007/s11664-016-5005-4
- El-Nahass, M.;
- El-Zaidia, E.;
- Darwish, A.;
- Salem, G.
- Article
33
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 929, doi. 10.1007/s11664-016-5010-7
- Moreira, João;
- May, Paul;
- Corat, Evaldo;
- Peterlevitz, Alfredo;
- Pinheiro, Romário;
- Zanin, Hudson
- Article
34
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 967, doi. 10.1007/s11664-016-5020-5
- Bhat, Bashir;
- Parvaiz, Muhammad;
- Sen, Pratima
- Article
35
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1088, doi. 10.1007/s11664-016-5021-4
- Jiang, Zhi;
- Zhuang, Yiqi;
- Li, Cong;
- Wang, Ping
- Article
36
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 947, doi. 10.1007/s11664-016-5022-3
- Zhai, Bao-gai;
- Ma, Qing-lan;
- Huang, Yuan
- Article
37
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1396, doi. 10.1007/s11664-016-5027-y
- Gu, Jian;
- Lei, YongPing;
- Lin, Jian;
- Fu, HanGuang;
- Wu, Zhongwei
- Article
38
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 941, doi. 10.1007/s11664-016-5034-z
- Lin, Yen-Sheng;
- Hsiao, Sheng-Yu;
- Tseng, Chun-Lung;
- Shen, Ching-Hsing;
- Chiang, Jung-Sheng
- Article
39
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 713, doi. 10.1007/s11664-016-5041-0
- Article
40
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 961, doi. 10.1007/s11664-016-5045-9
- Article
41
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1048, doi. 10.1007/s11664-016-5046-8
- Yang, Hongyu;
- Li, Enzhu;
- Sun, Chengli;
- Duan, Shuxin;
- Yuan, Ying;
- Tang, Bin
- Article
42
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1072, doi. 10.1007/s11664-016-5048-6
- Sabari Arul, N.;
- Vidya, J.;
- Ramya, V.;
- Mangalaraj, D.
- Article
43
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 999, doi. 10.1007/s11664-016-5050-z
- Huang, Zhengfeng;
- Cheng, Xudong;
- Dong, Peimei;
- Zhang, Xiwen
- Article
44
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 971, doi. 10.1007/s11664-016-5051-y
- Cai, Chun-Yu;
- Zhao, Cui-Lan;
- Xiao, Jing-Lin
- Article
45
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1005, doi. 10.1007/s11664-016-5052-x
- Jiang, Hong;
- Hu, Xue-Ning;
- Zhao, Yin-chang;
- Zhang, Chao
- Article
46
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1163, doi. 10.1007/s11664-016-5053-9
- Ike, Innocent;
- Sigalas, Iakovos;
- Iyuke, Sunny
- Article
47
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 718, doi. 10.1007/s11664-016-5059-3
- Narang, Sukhleen;
- Pubby, Kunal;
- Singh, Charanjeet
- Article
48
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1010, doi. 10.1007/s11664-016-5060-x
- Jagannadham, K.;
- Cui, J.;
- Zhu, Y.
- Article
49
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1201, doi. 10.1007/s11664-016-5061-9
- Behera, S.;
- Das, Piyush;
- Nayak, P.;
- Patri, S.
- Article
50
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1022, doi. 10.1007/s11664-016-5062-8
- Igumbor, E.;
- Andrew, R.;
- Meyer, W.
- Article