Works matching IS 03615235 AND DT 2017 AND VI 46 AND IP 12
1
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6856, doi. 10.1007/s11664-017-5708-1
- Manotum, R.;
- Klinkla, R.;
- Phaisangittisakul, N.;
- Pinsook, U.;
- Bovornratanaraks, T.
- Article
2
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6984, doi. 10.1007/s11664-017-5714-3
- Article
3
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6769, doi. 10.1007/s11664-017-5719-y
- Marandi, Maziar;
- Rahmani, Elham;
- Ahangarani Farahani, Farzaneh
- Article
4
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6756, doi. 10.1007/s11664-017-5723-2
- Madkhali, Hadi;
- Hamil, Ali;
- Lee, HoSung
- Article
5
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6965, doi. 10.1007/s11664-017-5724-1
- Yesappa, L.;
- Niranjana, M.;
- Ashokkumar, S.;
- Vijeth, H.;
- Sharanappa, Chapi;
- Raghu, S.;
- Devendrappa, H.
- Article
6
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6977, doi. 10.1007/s11664-017-5725-0
- Lu, Xuepeng;
- Dong, Zuowei;
- Zheng, Yong
- Article
7
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6910, doi. 10.1007/s11664-017-5726-z
- Chen, Sinn-wen;
- Chiu, Wan-ting;
- Gierlotka, Wojciech;
- Chang, Jui-shen;
- Wang, Chao-hong
- Article
8
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6936, doi. 10.1007/s11664-017-5727-y
- Huang, H.;
- Bu, F.;
- Tian, J.;
- Liu, D.
- Article
9
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6817, doi. 10.1007/s11664-017-5728-x
- Delacourt, B.;
- Ballet, P.;
- Boulard, F.;
- Ferron, A.;
- Bonnefond, L.;
- Pellerin, T.;
- Kerlain, A.;
- Destefanis, V.;
- Rothman, J.
- Article
10
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6884, doi. 10.1007/s11664-017-5729-9
- Supriya, Sweety;
- Kumar, Sunil;
- Kar, Manoranjan
- Article
11
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6878, doi. 10.1007/s11664-017-5730-3
- Shi, Yonghong;
- Li, Yuangang;
- Wei, Xiaoliang;
- Feng, Juan;
- Li, Huajing;
- Zhou, Wanyi
- Article
12
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6870, doi. 10.1007/s11664-017-5731-2
- Dar, Sajad;
- Srivastava, Vipul;
- Sakalle, Umesh
- Article
13
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6811, doi. 10.1007/s11664-017-5732-1
- Sun, Yuemei;
- Hu, Yifeng;
- Zhu, Xiaoqin;
- Zou, Hua;
- Sui, Yongxing;
- Xue, Jianzhong;
- Yuan, Li;
- Zhang, Jianhao;
- Zheng, Long;
- Zhang, Dan;
- Song, Zhitang
- Article
14
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6864, doi. 10.1007/s11664-017-5733-0
- Ren, Yang;
- Wang, Qiuhong;
- Zhou, Xiaoge;
- Gao, Yun;
- Zhao, Gaoyang
- Article
15
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6922, doi. 10.1007/s11664-017-5734-z
- Bakhshizadeh, N.;
- Sivoththaman, S.
- Article
16
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6901, doi. 10.1007/s11664-017-5737-9
- Kujofsa, Tedi;
- Ayers, John
- Article
17
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6895, doi. 10.1007/s11664-017-5738-8
- Duan, Zaihua;
- Zhang, Yong;
- Tong, Yexing;
- Zou, Hefeng;
- Peng, Jinfeng;
- Zheng, Xuejun
- Article
18
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6957, doi. 10.1007/s11664-017-5739-7
- Mansour, A.;
- El-Taweel, F.;
- Abu El-Enein, R.;
- El-Menyawy, E.
- Article
19
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6848, doi. 10.1007/s11664-017-5742-z
- Sosman, L.;
- López, A.;
- Camara, A.;
- Pedro, S.;
- Carvalho, I.;
- Cella, N.
- Article
20
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6843, doi. 10.1007/s11664-017-5743-y
- Ha, Chu;
- Lien, Nghiem;
- Anh, Nguyen;
- Lam, Nguyen
- Article
21
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6750, doi. 10.1007/s11664-017-5744-x
- Lima, Bismarck;
- Gómez-Malagón, L.;
- Gomes, A.;
- Garcia, J.;
- Kassab, L.
- Article
22
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6745, doi. 10.1007/s11664-017-5746-8
- Faraj, M.;
- Pakhuruddin, M.;
- Taboada, P.
- Article
23
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6804, doi. 10.1007/s11664-017-5747-7
- Deng, Shuping;
- Tang, Yu;
- Li, Decong;
- Liu, Hongxia;
- Chen, Zhong;
- Shen, Lanxian;
- Deng, Shukang
- Article
24
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6834, doi. 10.1007/s11664-017-5748-6
- Zolghadr, S.;
- Kimiagar, S.;
- Khojier, K.
- Article
25
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6829, doi. 10.1007/s11664-017-5749-5
- Pham, Khac;
- Nguyen, Van;
- Nguyen, Dang;
- Do, Danh;
- Le, Mai;
- Luc, Huy
- Article
26
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6795, doi. 10.1007/s11664-017-5764-6
- Nokhwal, Radheshyam;
- Srivastav, Vanya;
- Goyal, Anshu;
- Sharma, B.;
- Hashmi, S.;
- Sharma, R.
- Article
27
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6739, doi. 10.1007/s11664-017-5778-0
- Yildiz, Abdullah;
- Ozturk, Elif;
- Atilgan, Abdullah;
- Sbeta, Mohamed;
- Atli, Aycan;
- Serin, Tulay
- Article
28
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6930, doi. 10.1007/s11664-017-5784-2
- Ajdari, M.;
- Tondro, G.;
- Sattarahmady, N.;
- Parsa, A.;
- Heli, H.
- Article
29
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6947, doi. 10.1007/s11664-017-5801-5
- Article
30
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6784, doi. 10.1007/s11664-017-5706-3
- Ganesamoorthy, Ramasamy;
- Vijayaraghavan, Rajagopalan;
- Sakthivel, Pachagounder
- Article