Works matching IS 03615235 AND DT 2016 AND VI 45 AND IP 7
1
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3356, doi. 10.1007/s11664-016-4460-2
- Tien Ha, Le;
- Kien, Nguyen;
- Hoang, Phan;
- Duong, Thanh;
- Huy, Pham
- Article
2
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3400, doi. 10.1007/s11664-016-4465-x
- Kaushik, S.;
- Manikandan, S.;
- Hans, Ranjana
- Article
3
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3375, doi. 10.1007/s11664-016-4467-8
- Article
4
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3307, doi. 10.1007/s11664-016-4469-6
- Bouanane, I.;
- Kabir, A.;
- Boulainine, D.;
- Zerkout, S.;
- Schmerber, G.;
- Boudjema, B.
- Article
5
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3332, doi. 10.1007/s11664-016-4470-0
- Hegab, N.;
- Farid, A.;
- Shakra, A.;
- Afifi, M.;
- Alrebati, A.
- Article
6
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3712, doi. 10.1007/s11664-016-4471-z
- Mukherjee, S.;
- Chauhan, P.;
- Osterman, M.;
- Dasgupta, A.;
- Pecht, M.
- Article
7
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3460, doi. 10.1007/s11664-016-4473-x
- Abd El-Rahman, K.;
- Darwish, A.;
- Qashou, Saleem;
- Hanafy, T.
- Article
8
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3726, doi. 10.1007/s11664-016-4477-6
- Yang, Wenlong;
- Wang, Li;
- Lin, Jiaqi;
- Li, Xiaokang;
- Xiu, Hanjiang;
- Shen, Yanqing
- Article
9
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3466, doi. 10.1007/s11664-016-4478-5
- Kalanda, N.;
- Demyanov, S.;
- Petrov, A.;
- Karpinsky, D.;
- Yarmolich, M.;
- Oh, S.;
- Yu, S.;
- Kim, D.-H.
- Article
10
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3300, doi. 10.1007/s11664-016-4482-9
- Gai, Yanqin;
- Jiang, Jiaping;
- Wu, Yuxi;
- Tang, Gang
- Article
11
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3473, doi. 10.1007/s11664-016-4483-8
- Liu, Qian;
- Li, Yanxia;
- Li, Jun;
- Chai, Xiaona;
- Zhao, Haifeng;
- Wang, Xusheng;
- Yao, Xi
- Article
12
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3410, doi. 10.1007/s11664-016-4485-6
- Kim, Jae-Hwan;
- Kim, Woo-Jun;
- Oh, Tae-Sung
- Article
13
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3418, doi. 10.1007/s11664-016-4486-5
- Nieroda, P.;
- Kolezynski, A.;
- Oszajca, M.;
- Milczarek, J.;
- Wojciechowski, K.
- Article
14
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3427, doi. 10.1007/s11664-016-4487-4
- Usenko, Andrey;
- Moskovskikh, Dmitry;
- Korotitskiy, Andrey;
- Gorshenkov, Mikhail;
- Voronin, Andrey;
- Arkhipov, Dmitry;
- Lyange, Maria;
- Isachenko, Grigory;
- Khovaylo, Vladimir
- Article
15
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3479, doi. 10.1007/s11664-016-4488-3
- Bencherif, K.;
- Yakoubi, A.;
- Della, N.;
- Miloud Abid, O.;
- Khachai, H.;
- Ahmed, R.;
- Khenata, R.;
- Bin Omran, S.;
- Gupta, S.;
- Murtaza, G.
- Article
16
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3259, doi. 10.1007/s11664-016-4489-2
- Choi, Hyelim;
- Kaplan, Wayne;
- Choe, Heeman
- Article
17
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3268, doi. 10.1007/s11664-016-4490-9
- Reddy, V.;
- Asha, B.;
- Choi, Chel-Jong
- Article
18
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3340, doi. 10.1007/s11664-016-4491-8
- Peng, Yunfei;
- Wang, Hailong;
- Zhang, Wenqi;
- Li, Bin;
- Zhou, Dongzhan;
- Zhang, Xiqing;
- Wang, Yongsheng
- Article
19
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3314, doi. 10.1007/s11664-016-4492-7
- Rehman, Gul;
- Shafiq, M.;
- Saifullah;
- Ahmad, Rashid;
- Jalali-Asadabadi, S.;
- Maqbool, M.;
- Khan, Imad;
- Rahnamaye-Aliabad, H.;
- Ahmad, Iftikhar
- Article
20
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3491, doi. 10.1007/s11664-016-4493-6
- Mandal, Manas;
- Ghosh, Debasis;
- Chattopadhyay, Krishna;
- Das, Chapal
- Article
21
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3776, doi. 10.1007/s11664-016-4495-4
- Dong, Lina;
- Zhou, Wenying;
- Sui, Xuezhen;
- Wang, Zijun;
- Cai, Huiwu;
- Wu, Peng;
- Zuo, Jing;
- Liu, Xiangrong
- Article
22
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3786, doi. 10.1007/s11664-016-4496-3
- Lee, Jong-Gyu;
- Shim, Gyu-Seong;
- Park, Ji-Won;
- Kim, Hyun-Joong;
- Moon, Sang-Eun;
- Kim, Young-Kwan;
- No, Dong-Hun;
- Kim, Jong-Hwan;
- Han, Kwan-Young
- Article
23
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3734, doi. 10.1007/s11664-016-4498-1
- Pettersen, Sigurd;
- Kristiansen, Helge;
- Nagao, Shijo;
- Helland, Susanne;
- Njagi, John;
- Suganuma, Katsuaki;
- Zhang, Zhiliang;
- He, Jianying
- Article
24
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3501, doi. 10.1007/s11664-016-4499-0
- Tola, Pardi;
- Kim, D.;
- Liu, Chunli;
- Phan, T.;
- Lee, B.
- Article
25
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3509, doi. 10.1007/s11664-016-4500-y
- Gong, G.;
- Hu, P.;
- Li, Y.;
- Kim, D.;
- Liu, C.;
- Phan, T.;
- Ho, T.;
- Yu, S.;
- Telegin, A.;
- Naumov, S.
- Article
26
- 2016
- Ahmad, Nazir;
- Ahmad, M.;
- Kotru, P.
- Erratum
27
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3515, doi. 10.1007/s11664-016-4502-9
- Article
28
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3440, doi. 10.1007/s11664-016-4503-8
- Yusupov, K.;
- Khovaylo, V.;
- Muratov, D.;
- Kozhitov, L.;
- Arkhipov, D.;
- Pryadun, V.;
- Vasiliev, A.
- Article
29
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3744, doi. 10.1007/s11664-016-4504-7
- Article
30
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3532, doi. 10.1007/s11664-016-4505-6
- Al-Saleh, Mohammed;
- Abdul Jawad, Saadi
- Article
31
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3759, doi. 10.1007/s11664-016-4507-4
- Sahiner, Nurettin;
- Demirci, Sahin;
- Sel, Kivanc
- Article
32
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3540, doi. 10.1007/s11664-016-4508-3
- Yang, Feng;
- Guo, Yichen;
- Zong, Zhihao;
- Hao, Xuehong;
- Shi, Yiwen;
- Tang, Minghua
- Article
33
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3766, doi. 10.1007/s11664-016-4509-2
- Yang, Li;
- Ge, Jinguo;
- Zhang, Yaocheng;
- Dai, Jun;
- Liu, Haixiang;
- Xiang, Jicen
- Article
34
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3343, doi. 10.1007/s11664-016-4510-9
- Savaloni, Hadi;
- Abbaszadeh, Neda
- Article
35
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3433, doi. 10.1007/s11664-016-4511-8
- Ebling, D.;
- Krumm, A.;
- Pfeiffelmann, B.;
- Gottschald, J.;
- Bruchmann, J.;
- Benim, A.;
- Adam, M.;
- Labs, R.;
- Herbertz, R.;
- Stunz, A.
- Article
36
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3581, doi. 10.1007/s11664-016-4512-7
- Trang, Nguyen;
- Chinh, Nguyen;
- Giang, Nguyen;
- Thanh, Dinh;
- Lam, Tran;
- Hoang, Thai
- Article
37
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3801, doi. 10.1007/s11664-016-4513-6
- Nguyen, T.;
- Le, U.;
- Ngo, K.;
- Pham, K.;
- Dinh, L.
- Article
38
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3546, doi. 10.1007/s11664-016-4514-5
- Xue, Yan;
- Zhang, Ya-Hui;
- Zhao, Rui-Peng;
- Zhang, Fei;
- Lu, Yu-Ming;
- Cai, Chuan-Bing;
- Xiong, Jie;
- Tao, Bo-Wan
- Article
39
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3591, doi. 10.1007/s11664-016-4515-4
- Article
40
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3651, doi. 10.1007/s11664-016-4517-2
- Myung, Woo-Ram;
- Kim, Yongil;
- Kim, Kyung-Yeol;
- Jung, Seung-Boo
- Article
41
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3251, doi. 10.1007/s11664-016-4518-1
- Beji, Nasreddine;
- Ajili, Mejda;
- Turki, Najoua
- Article
42
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3659, doi. 10.1007/s11664-016-4519-0
- Agyakwa, Pearl;
- Yang, Li;
- Arjmand, Elaheh;
- Evans, Paul;
- Corfield, Martin;
- Johnson, C.
- Article
43
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3562, doi. 10.1007/s11664-016-4520-7
- Inpasalini, M.;
- Choubey, Ravi;
- Mukherjee, Samrat
- Article
44
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3673, doi. 10.1007/s11664-016-4521-6
- Mahdavifard, M.;
- Sabri, M.;
- Said, S.;
- Shnawah, D.;
- Badruddin, I.;
- Rozali, S.
- Article
45
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3795, doi. 10.1007/s11664-016-4524-3
- Nghia, Nguyen;
- Hue, Nguyen;
- Thu, Ma;
- Len, Phung;
- Thu, Vu;
- Lam, Tran
- Article
46
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3603, doi. 10.1007/s11664-016-4525-2
- Li, Fucheng;
- Chen, Shilong;
- Wei, Yong;
- Liu, Konghua;
- Lin, Yong;
- Liu, Lan
- Article
47
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3383, doi. 10.1007/s11664-016-4526-1
- Laux, Edith;
- Uhl, Stefanie;
- Journot, Tony;
- Brossard, Julien;
- Jeandupeux, Laure;
- Keppner, Herbert
- Article
48
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3361, doi. 10.1007/s11664-016-4527-0
- Cao, Renping;
- Han, Peng;
- Luo, Wenjie;
- Fu, Ting;
- Luo, Zhiyang;
- Liu, Pan;
- Chen, Zhiquan;
- Yu, Xiaoguang
- Article
49
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3324, doi. 10.1007/s11664-016-4528-z
- Acharya, Shashidhara;
- Bangera, Kasturi;
- Shivakumar, G.
- Article
50
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3367, doi. 10.1007/s11664-016-4530-5
- Mu, Jing;
- Zheng, Gan;
- Dai, Zhen;
- Zhang, Lin;
- Zhu, Ya
- Article