Works matching IS 03615235 AND DT 2016 AND VI 45 AND IP 6
1
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2710, doi. 10.1007/s11664-015-4310-7
- Madugu, Mohammad;
- Olusola, Olajide;
- Echendu, Obi;
- Kadem, Burak;
- Dharmadasa, Imyhamy
- Article
2
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2683, doi. 10.1007/s11664-015-4311-6
- Dalapati, Pradip;
- Manik, Nabin;
- Basu, Asok
- Article
3
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2651, doi. 10.1007/s11664-015-4312-5
- Zhou, Hao;
- Zhang, Qingmeng;
- Tang, Qun;
- Cui, Hang;
- Xu, Yaohua;
- Lin, Chenguang;
- Du, Jun
- Article
4
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2855, doi. 10.1007/s11664-015-4315-2
- Article
5
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2718, doi. 10.1007/s11664-015-4318-z
- Singh, Devender;
- Tanwar, Vijeta;
- Samantilleke, Anura;
- Mari, Bernabe;
- Bhagwan, Shri;
- Kadyan, Pratap;
- Singh, Ishwar
- Article
6
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2895, doi. 10.1007/s11664-015-4320-5
- Li, Xin;
- Li, Shuang-ming;
- Feng, Song-ke;
- Zhong, Hong;
- Fu, Heng-zhi
- Article
7
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2987, doi. 10.1007/s11664-015-4321-4
- Lee, Kyoungho;
- Kang, Seungjin
- Article
8
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2920, doi. 10.1007/s11664-015-4322-3
- Dyck, J.;
- Colvin, J.;
- Quayle, P.;
- Peshek, T.;
- Kash, K.
- Article
9
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2725, doi. 10.1007/s11664-015-4323-2
- Kumar, Satinder;
- Gathania, A.;
- Vij, Ankush;
- Kumar, Ravi
- Article
10
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2796, doi. 10.1007/s11664-015-4324-1
- Jiang, Ya-Qing;
- Lu, Mao-Wang;
- Huang, Xin-Hong;
- Yang, Shi-Peng;
- Tang, Qiang
- Article
11
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2904, doi. 10.1007/s11664-015-4325-0
- Navrátil, J.;
- Plecháček, T.;
- Drašar, Č.;
- Kucek, V.;
- Laufek, F.;
- Černošková, E.;
- Beneš, L.;
- Vlček, M.
- Article
12
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2914, doi. 10.1007/s11664-015-4326-z
- Yoshida, Akihito;
- Toshima, Naoki
- Article
13
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2745, doi. 10.1007/s11664-015-4328-x
- Zou, Hua;
- Wang, Xusheng;
- Hu, Yifeng;
- Zhu, Xiaoqing;
- Sui, Yongxing;
- Song, Zhitang
- Article
14
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3059, doi. 10.1007/s11664-015-4330-3
- Ullah, Imran;
- Murtaza, G.;
- Khenata, R.;
- Mahmood, Asif;
- Muzzamil, M.;
- Amin, N.;
- Saleh, M.
- Article
15
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2732, doi. 10.1007/s11664-015-4331-2
- Samir, E.;
- Shehata, N.;
- Aldacher, M.;
- Kandas, I.
- Article
16
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2926, doi. 10.1007/s11664-016-4334-7
- Ruan, Limin;
- Zhao, Huaizhou;
- Li, Dandan;
- Jin, Shifeng;
- Li, Shanming;
- Gu, Lin;
- Liang, Jingkui
- Article
17
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3079, doi. 10.1007/s11664-016-4336-5
- Zhao, Xuetong;
- Ren, Lulu;
- Liao, Ruijin;
- Li, Jianying;
- Yang, Lijun;
- Wang, Feipeng
- Article
18
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3069, doi. 10.1007/s11664-016-4339-2
- Wang, Zijun;
- Zhou, Wenying;
- Sui, Xuezhen;
- Dong, Lina;
- Cai, Huiwu;
- Zuo, Jing;
- Chen, Qingguo
- Article
19
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2662, doi. 10.1007/s11664-016-4340-9
- Singh, Laxman;
- Yadava, Shiva Sundar;
- Sin, Byung;
- Rai, Uma;
- Mandal, K.;
- Lee, Youngil
- Article
20
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2808, doi. 10.1007/s11664-016-4342-7
- Guzel, A.;
- Duman, S.;
- Yildirim, N.;
- Turut, A.
- Article
21
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3013, doi. 10.1007/s11664-016-4343-6
- Zhou, Quan;
- Zhou, Bite;
- Lee, Tae-Kyu;
- Bieler, Thomas
- Article
22
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2967, doi. 10.1007/s11664-016-4347-2
- Xu, Jiwen;
- Li, Qinglin;
- Zhou, Changrong;
- Zeng, Weidong;
- Xiao, Jianrong;
- Ma, Jiafeng;
- Yuan, Changlai;
- Chen, Guohua;
- Rao, Guanghui;
- Li, Xuqiong
- Article
23
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3030, doi. 10.1007/s11664-016-4350-7
- Wang, Sea-Fue;
- Hsu, Yung-Fu;
- Chen, Chun-Ya
- Article
24
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2879, doi. 10.1007/s11664-016-4352-5
- Li, J.;
- Lu, Z.;
- Wang, C.;
- Li, Y.;
- Liu, F.;
- Ao, W.
- Article
25
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2886, doi. 10.1007/s11664-016-4355-2
- Elsheikh, Mohamed;
- Sabri, Mohd;
- Said, Suhana;
- Miyazaki, Yuzuru;
- Masjuki, H.;
- Shnawah, Dhafer;
- Long, Bui;
- Naito, Shuma;
- Bashir, Mohamed
- Article
26
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2935, doi. 10.1007/s11664-016-4356-1
- Son, Woohyun;
- Lee, Seung;
- Park, Hongkwan;
- Choi, Hyang;
- Kim, Jung
- Article
27
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2891, doi. 10.1007/s11664-016-4360-5
- Bulat, L.;
- Novotelnova, A.;
- Asach, A.;
- Tukmakova, A.;
- Osvenskii, V.;
- Parchomenko, Y.;
- Zhao, L.;
- Zongrui, Q.
- Article
28
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2789, doi. 10.1007/s11664-016-4364-1
- Vankhade, Dhaval;
- Kothari, Anjana;
- Chaudhuri, Tapas
- Article
29
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2815, doi. 10.1007/s11664-016-4369-9
- Gentile, A.;
- Ruffino, F.;
- D'Andrea, C.;
- Gucciardi, P. G.;
- Reitano, R.;
- Grimaldi, M.
- Article
30
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2776, doi. 10.1007/s11664-016-4370-3
- Singh, Vijay;
- Sivaramaiah, G.;
- Rao, J.;
- Singh, N.;
- Srivastava, Anoop;
- Jirimali, H.;
- Li, J.;
- Gao, H.;
- Kumaran, R.;
- Singh, Pramod;
- Dhoble, S.
- Article
31
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2826, doi. 10.1007/s11664-016-4373-0
- Krier, A.;
- Yin, M.;
- Marshall, A.;
- Krier, S.
- Article
32
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2802, doi. 10.1007/s11664-016-4375-y
- Liu, Dan;
- Lin, Chun;
- Zhou, Songmin;
- Hu, Xiaoning
- Article
33
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2974, doi. 10.1007/s11664-016-4376-x
- Zheng, Yuhui;
- Hu, Jing;
- Deng, Surong;
- Gao, Jinwei;
- Wang, Qianming
- Article
34
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2831, doi. 10.1007/s11664-016-4377-9
- Kujofsa, Tedi;
- Ayers, John
- Article
35
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2861, doi. 10.1007/s11664-016-4381-0
- Dutta, D.;
- Hazra, S.;
- Das, J.;
- Sarkar, C.;
- Basu, S.
- Article
36
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2981, doi. 10.1007/s11664-016-4385-9
- Liao, Da-qian;
- Xia, Chao-yang;
- Xi, Xiao-ming;
- Zhou, Chun-xian;
- Xiao, Ke-song;
- Chen, Xiao-qing;
- Qin, Shi-biao
- Article
37
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2996, doi. 10.1007/s11664-016-4388-6
- Suresh, E.;
- Prasad, K.;
- Arun, N.;
- Ratheesh, R.
- Article
38
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3087, doi. 10.1007/s11664-016-4391-y
- Krishnasamy, Jagatheesan;
- Ramasamy, Alagirusamy;
- Das, Apurba;
- Basu, Ananjan
- Article
39
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3236, doi. 10.1007/s11664-016-4393-9
- Balasubramanian, G.;
- Hull, R.
- Article
40
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3003, doi. 10.1007/s11664-016-4394-8
- Li, Yuan;
- Jing, Hongyang;
- Han, Yongdian;
- Xu, Lianyong;
- Lu, Guoquan
- Article
41
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3040, doi. 10.1007/s11664-016-4395-7
- Tian, Ji-Li;
- Zhang, Hua-Yu;
- Wang, Hai-Jun
- Article
42
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3053, doi. 10.1007/s11664-016-4396-6
- Yao, L.;
- Wu, F.;
- Wang, X.;
- Cao, R.;
- Li, X.;
- Hu, X.;
- Song, H.
- Article
43
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3113, doi. 10.1007/s11664-016-4400-1
- Huang, Xusheng;
- Zhou, Yuan;
- Wu, Wenwei;
- Xu, Jiawei;
- Liu, Shangqian;
- Liu, Dongsheng;
- Wu, Juan
- Article
44
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3046, doi. 10.1007/s11664-016-4401-0
- Bucur, Raul;
- Badea, Iuliana;
- Bucur, Alexandra;
- Novaconi, Stefan
- Article
45
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3244, doi. 10.1007/s11664-016-4403-y
- Singh, Gurbinder;
- Haseeb, A.
- Article
46
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3121, doi. 10.1007/s11664-016-4404-x
- Uehara, Mutsuo;
- Akiyama, Kensuke;
- Shimizu, Takao;
- Matsushima, Masaaki;
- Uchida, Hiroshi;
- Kimura, Yoshisato;
- Funakubo, Hiroshi
- Article
47
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3101, doi. 10.1007/s11664-016-4406-8
- Article
48
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2784, doi. 10.1007/s11664-016-4407-7
- Feng, Xiaoting;
- Zhang, Feng;
- Wang, Yaling;
- Zhang, Yi;
- Yang, Yongzhen;
- Liu, Xuguang
- Article
49
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 3127, doi. 10.1007/s11664-016-4411-y
- Article
50
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2692, doi. 10.1007/s11664-016-4413-9
- Zvanut, M.;
- Dashdorj, J.;
- Freitas, J.;
- Glaser, E.;
- Willoughby, W.;
- Leach, J.;
- Udwary, K.
- Article