Works matching IS 03615235 AND DT 2016 AND VI 45 AND IP 4
1
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2078, doi. 10.1007/s11664-015-4185-7
- Goue, Ouloide;
- Raghothamachar, Balaji;
- Yang, Yu;
- Guo, Jianqiu;
- Dudley, Michael;
- Kisslinger, Kim;
- Trunek, Andrew;
- Neudeck, Philip;
- Spry, David;
- Woodworth, Andrew
- Article
2
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2019, doi. 10.1007/s11664-015-4234-2
- Rana, Tawhid;
- Chandrashekhar, M.V.S.;
- Daniels, Kevin;
- Sudarshan, Tangali
- Article
3
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2059, doi. 10.1007/s11664-015-4243-1
- Joshi, D.;
- Dasari, K.;
- Nayak, S.;
- Palai, R.;
- Suresh, P.;
- Thota, S.
- Article
4
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2291, doi. 10.1007/s11664-015-4252-0
- Jang, Shin;
- Kim, Yeongjun;
- Oh, Je
- Article
5
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2184, doi. 10.1007/s11664-015-4254-y
- Singh, Kunal;
- Kumar, Mirgender;
- Goel, Ekta;
- Singh, Balraj;
- Dubey, Sarvesh;
- Kumar, Sanjay;
- Jit, Satyabrata
- Article
6
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2193, doi. 10.1007/s11664-015-4261-z
- Nithyavathy, N.;
- Arunmetha, S.;
- Vinoth, M.;
- Sriram, G.;
- Rajendran, V.
- Article
7
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2206, doi. 10.1007/s11664-015-4269-4
- Ahmad, Nazir;
- Ahmad, M.;
- Kotru, P.
- Article
8
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2216, doi. 10.1007/s11664-015-4276-5
- Article
9
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2087, doi. 10.1007/s11664-015-4278-3
- Zhao, Shirong;
- McFavilen, Heather;
- Wang, Shuo;
- Ponce, Fernando A.;
- Arena, Chantal;
- Goodnick, Stephen;
- Chowdhury, Srabanti
- Article
10
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2115, doi. 10.1007/s11664-015-4279-2
- Mutlu, Zafer;
- Shahrezaei, Sina;
- Temiz, Selcuk;
- Ozkan, Mihrimah;
- Ozkan, Cengiz
- Article
11
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2133, doi. 10.1007/s11664-015-4283-6
- Al-Kabi, Sattar;
- Ghetmiri, Seyed;
- Margetis, Joe;
- Du, Wei;
- Mosleh, Aboozar;
- Alher, Murtadha;
- Dou, Wei;
- Grant, Joshua;
- Sun, Greg;
- Soref, Richard;
- Tolle, John;
- Li, Baohua;
- Mortazavi, Mansour;
- Naseem, Hameed;
- Yu, Shui-Qing
- Article
12
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2222, doi. 10.1007/s11664-015-4284-5
- Sahu, Ishwar;
- Bisen, D.;
- Brahme, N.;
- Tamrakar, Raunak
- Article
13
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2233, doi. 10.1007/s11664-015-4287-2
- Srivastava, Anurag;
- Santhibhushan, B.;
- Sharma, Vikash;
- Kaur, Kamalpreet;
- Shahzad Khan, Md.;
- Marathe, Madura;
- Sarkar, Abir;
- Shahid Khan, Mohd.
- Article
14
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2242, doi. 10.1007/s11664-015-4288-1
- Rmili, W.;
- Vivet, N.;
- Chupin, S.;
- Bihan, T.;
- Quilliec, G.;
- Richard, C.
- Article
15
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2252, doi. 10.1007/s11664-015-4290-7
- Basu, T.;
- Sen, S.;
- Seal, A.;
- Sen, A.
- Article
16
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2258, doi. 10.1007/s11664-015-4293-4
- Khan, Sajjad;
- Ziya, Amer;
- Ibrahim, Ather;
- Atiq, Shabbar;
- Usman, Muhammad;
- Ahmad, Naseeb;
- Shakeel, Muhammad
- Article
17
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2172, doi. 10.1007/s11664-015-4296-1
- Jena, Kanjalochan;
- Swain, Raghunandan;
- Lenka, T.
- Article
18
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2266, doi. 10.1007/s11664-015-4299-y
- Cota-Leal, M.;
- Sotelo-Lerma, M.;
- Corona-Corona, I.;
- Quevedo-Lopez, M.
- Article
19
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2121, doi. 10.1007/s11664-015-4300-9
- Stephenson, Chad;
- O'brien, William;
- Qi, Meng;
- Penninger, Michael;
- Schneider, William;
- Wistey, Mark
- Article
20
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2274, doi. 10.1007/s11664-015-4301-8
- Wang, Juyi;
- Gu, Ming;
- Bao, Yefeng;
- Li, Xiaoya;
- Chen, Lidong
- Article
21
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2278, doi. 10.1007/s11664-015-4304-5
- Tran, H.;
- Devkota, J.;
- Eggers, T.;
- Wingo, J.;
- Cai, W.;
- Skorvanek, I.;
- Srikanth, H.;
- Phan, M.
- Article
22
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2178, doi. 10.1007/s11664-015-4305-4
- Reshchikov, M.;
- Usikov, A.;
- Helava, H.;
- Makarov, Yu.;
- Puzyk, M.;
- Papchenko, B.
- Article
23
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2286, doi. 10.1007/s11664-015-4306-3
- Song, Dae-Seob;
- Choi, Jung-Oh;
- Ahn, Sung-Hoon
- Article
24
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2299, doi. 10.1007/s11664-015-4308-1
- Song, Meng;
- Xu, Peng;
- Han, Lijing;
- Yi, Lan;
- Wang, Xu;
- Li, Zhenhua;
- Shang, Xuefu;
- Wang, Xiumin;
- Wu, Huizhen;
- Zhao, Pei;
- Song, Yenan;
- Wang, Miao
- Article
25
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2108, doi. 10.1007/s11664-015-4316-1
- Kasanaboina, Pavan;
- Ojha, Sai;
- Sami, Shifat;
- Lewis Reynolds, C.;
- Liu, Yang;
- Iyer, Shanthi
- Article
26
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2045, doi. 10.1007/s11664-015-4317-0
- Guo, Jianqiu;
- Yang, Yu;
- Wu, Fangzhen;
- Sumakeris, Joe;
- Leonard, Robert;
- Goue, Ouloide;
- Raghothamachar, Balaji;
- Dudley, Michael
- Article
27
- 2016
- Jang, Shin;
- Kim, Yeongjun;
- Oh, Je
- Erratum
28
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2102, doi. 10.1007/s11664-016-4333-8
- Katz, M.;
- Twigg, M.;
- Mahadik, N.;
- Canedy, C.;
- Affouda, C.
- Article
29
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2001, doi. 10.1007/s11664-016-4337-4
- Wang, Jingzhou;
- Koizumi, Atsushi;
- Fujiwara, Yasufumi;
- Jadwisienczak, Wojciech
- Article
30
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2008, doi. 10.1007/s11664-016-4338-3
- Watanabe, Akihiro;
- Chiba, Hiroshi;
- Kawashima, Tomoyuki;
- Washio, Katsuyoshi
- Article
31
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2031, doi. 10.1007/s11664-016-4346-3
- Tadjer, Marko;
- Mastro, Michael;
- Mahadik, Nadeemullah;
- Currie, Marc;
- Wheeler, Virginia;
- Freitas, Jaime;
- Greenlee, Jordan;
- Hite, Jennifer;
- Hobart, Karl;
- Eddy, Charles;
- Kub, Fritz
- Article
32
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2038, doi. 10.1007/s11664-016-4348-1
- Thota, Venkata;
- Wickramasinghe, Thushan;
- Wijesundara, Kushal;
- Stinaff, Eric;
- Bracker, Allan;
- Gammon, D.
- Article
33
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2071, doi. 10.1007/s11664-016-4349-0
- Dasari, K.;
- Thapa, B.;
- Wang, J.;
- Wright, J.;
- Kaya, S.;
- Jadwisienczak, W.;
- Palai, R.
- Article
34
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2160, doi. 10.1007/s11664-016-4357-0
- Hao, Chenglong;
- Wang, Xiaofeng;
- Yin, Yajiang;
- You, Zheng
- Article
35
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2142, doi. 10.1007/s11664-016-4358-z
- Wallace, T.;
- Jin, Z.-H.;
- Su, J.
- Article
36
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2025, doi. 10.1007/s11664-016-4359-y
- Vaughan, E.;
- Addamane, S.;
- Shima, D.;
- Balakrishnan, G.;
- Hecht, A.
- Article
37
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2150, doi. 10.1007/s11664-016-4371-2
- Beach, Benjamin;
- Sauriol, Dustin;
- Derosa, Pedro
- Article
38
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2066, doi. 10.1007/s11664-016-4378-8
- Yang, Yu;
- Guo, Jianqiu;
- Goue, Ouloide;
- Raghothamachar, Balaji;
- Dudley, Michael;
- Chung, Gil;
- Sanchez, Edward;
- Quast, Jeff;
- Manning, Ian;
- Hansen, Darren
- Article
39
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2127, doi. 10.1007/s11664-016-4386-8
- Nakasu, Taizo;
- Kizu, Takeru;
- Yamashita, Sotaro;
- Aiba, Takayuki;
- Hattori, Shota;
- Sun, Wei-Che;
- Taguri, Kosuke;
- Kazami, Fukino;
- Hashimoto, Yuki;
- Ozaki, Shun;
- Kobayashi, Masakazu;
- Asahi, Toshiaki
- Article
40
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2092, doi. 10.1007/s11664-016-4387-7
- Liu, Chao;
- Cai, Yuefei;
- Jiang, Huaxing;
- Lau, Kei
- Article
41
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2051, doi. 10.1007/s11664-016-4402-z
- Mosleh, Aboozar;
- Alher, Murtadha;
- Cousar, Larry;
- Du, Wei;
- Ghetmiri, Seyed;
- Al-Kabi, Sattar;
- Dou, Wei;
- Grant, Perry;
- Sun, Greg;
- Soref, Richard;
- Li, Baohua;
- Naseem, Hameed;
- Yu, Shui-Qing
- Article
42
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2013, doi. 10.1007/s11664-015-4175-9
- Jia, Ye;
- Wallace, Joshua;
- Qin, Yueling;
- Gardella, Joseph;
- Dabiran, Amir;
- Singisetti, Uttam
- Article