Works matching IS 03615235 AND DT 2016 AND VI 45 AND IP 2
1
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 892, doi. 10.1007/s11664-015-4195-5
- Chen, Jianwen;
- Yao, Manwen;
- Yao, Xi
- Article
2
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1184, doi. 10.1007/s11664-015-4198-2
- Lahokallio, Sanna;
- Hoikkanen, Maija;
- Marttila, Tuomas;
- Vuorinen, Jyrki;
- Kiilunen, Janne;
- Frisk, Laura
- Article
3
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 899, doi. 10.1007/s11664-015-4209-3
- Gogoi, Pallabi;
- Srinivas, P.;
- Sharma, Pramod;
- Pamu, D.
- Article
4
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 859, doi. 10.1007/s11664-015-4210-x
- Huang, Wei-Ching;
- Chu, Chung-Ming;
- Hsieh, Chi-Feng;
- Wong, Yuen-Yee;
- Chen, Kai-wei;
- Lee, Wei-I;
- Tu, Yung-Yi;
- Chang, Edward-Yi;
- Dee, Chang;
- Majlis, B.;
- Yap, S.
- Article
5
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1035, doi. 10.1007/s11664-015-4215-5
- Benabdeslem, M.;
- Sehli, H.;
- Rahal, S.;
- Benslim, N.;
- Bechiri, L.;
- Djekoun, A.;
- Touam, T.;
- Boujnah, M.;
- El Kenz, A.;
- Benyoussef, A.;
- Portier, X.
- Article
6
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1077, doi. 10.1007/s11664-015-4221-7
- Williams, Jared;
- Mather, Spencer;
- Morelli, Donald
- Article
7
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 910, doi. 10.1007/s11664-015-4223-5
- Vieira, E.;
- Ribeiro, J.;
- Sousa, R.;
- Silva, M.;
- Dupont, L.;
- Gonçalves, L.
- Article
8
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 917, doi. 10.1007/s11664-015-4224-4
- Vasoya, N.;
- Jha, Prafulla;
- Saija, K.;
- Dolia, S.;
- Zankat, K.;
- Modi, K.
- Article
9
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 928, doi. 10.1007/s11664-015-4226-2
- Bajpai, P.;
- Singh, K.;
- Tamrakar, Preeti
- Article
10
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1160, doi. 10.1007/s11664-015-4229-z
- Tang, Chunmiao;
- Chen, Zhiying;
- Zhang, Haoran;
- Zhang, Yaqian;
- Zhang, Yanhui;
- Sui, Yanping;
- Yu, Guanghui;
- Cao, Yijiang
- Article
11
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 940, doi. 10.1007/s11664-015-4232-4
- Lu, Xuepeng;
- Zheng, Yong;
- Huang, Qi;
- Dong, Zuowei
- Article
12
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1165, doi. 10.1007/s11664-015-4233-3
- Wang, Lihua;
- Zhang, Zizhen;
- Zhao, Jianguo;
- Ding, Bingjun;
- Guo, Yong
- Article
13
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 947, doi. 10.1007/s11664-015-4235-1
- Acharya, Truptimayee;
- Choudhary, R.
- Article
14
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 881, doi. 10.1007/s11664-015-4239-x
- Voitsekhovskii, A.;
- Nesmelov, S.;
- Dzyadukh, S.
- Article
15
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 872, doi. 10.1007/s11664-015-4240-4
- Benzarti, Z.;
- Halidou, I.;
- Touré, A.;
- Jani, B.
- Article
16
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1154, doi. 10.1007/s11664-015-4241-3
- Zhang, J.;
- Liu, N.;
- Sun, H.;
- Yan, P.;
- Li, Y.;
- Zhong, S.;
- Xie, S.;
- Li, R.;
- Miao, X.
- Article
17
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 959, doi. 10.1007/s11664-015-4244-0
- Puri, Maalti;
- Bahel, Shalini;
- Bindra Narang, Sukhleen
- Article
18
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1115, doi. 10.1007/s11664-015-4245-z
- Article
19
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1210, doi. 10.1007/s11664-015-4246-y
- Grigalevicius, S.;
- Zostautiene, R.;
- Sipaviciute, D.;
- Stulpinaite, B.;
- Volyniuk, D.;
- Grazulevicius, J.;
- Liu, L.;
- Xie, Z.;
- Zhang, B.
- Article
20
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 970, doi. 10.1007/s11664-015-4247-x
- Zuo, Qianghui;
- Luo, Laihui;
- Yao, Yongjie
- Article
21
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1142, doi. 10.1007/s11664-015-4249-8
- Article
22
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 867, doi. 10.1007/s11664-015-4250-2
- Tiras, Engin;
- Mutlu, Selman;
- Balkan, Naci
- Article
23
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1085, doi. 10.1007/s11664-015-4251-1
- Kusz, B.;
- Miruszewski, T.;
- Bochentyn, B.;
- Łapiński, M.;
- Karczewski, J.
- Article
24
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 976, doi. 10.1007/s11664-015-4253-z
- Muthukumaran, S.;
- Ashokkumar, M.
- Article
25
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 983, doi. 10.1007/s11664-015-4255-x
- DiStefano, Jennifer;
- Lin, Yu-Chuan;
- Robinson, Joshua;
- Glavin, Nicholas;
- Voevodin, Andrey;
- Brockman, Justin;
- Kuhn, Markus;
- French, Benjamin;
- King, Sean
- Article
26
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 989, doi. 10.1007/s11664-015-4256-9
- Yuzer, Abdulcelil;
- Ozkendir, Osman
- Article
27
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1094, doi. 10.1007/s11664-015-4259-6
- Article
28
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 999, doi. 10.1007/s11664-015-4260-0
- Article
29
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1201, doi. 10.1007/s11664-015-4262-y
- Article
30
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1011, doi. 10.1007/s11664-015-4263-x
- Li, Ying-xiang;
- Si, Feng;
- Tang, Bin;
- Wang, Ya;
- Zhang, Shu-ren
- Article
31
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1017, doi. 10.1007/s11664-015-4264-9
- Xiu, Shaomei;
- Xiao, Shi;
- Xue, Shuangxi;
- Shen, Bo;
- Zhai, Jiwei
- Article
32
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1101, doi. 10.1007/s11664-015-4265-8
- Article
33
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1023, doi. 10.1007/s11664-015-4267-6
- Cheng, Lichun;
- Xiong, Jilei;
- Zhou, Huaiying;
- Pan, Shunkang;
- Huang, Hehua
- Article
34
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1028, doi. 10.1007/s11664-015-4268-5
- Huang, Ting;
- Cheng, Xiao-min;
- Guan, Xia-wei;
- Miao, Xiang-shui
- Article
35
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1041, doi. 10.1007/s11664-015-4272-9
- Liu, Yuling;
- Liu, Shuhong;
- Zhang, Cong;
- Lu, Xingxu;
- Chen, Chong;
- Du, Yong;
- Živković, Dragana
- Article
36
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1057, doi. 10.1007/s11664-015-4285-4
- Roh, Im-Jun;
- Kwon, Beomjin;
- Baek, Seung-Hyub;
- Kim, Seong;
- Kim, Jin-Sang;
- Kang, Chong-Yun
- Article
37
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1065, doi. 10.1007/s11664-015-4286-3
- Nazir, Muhammad;
- Ul-Islam, Misbah;
- Ali, Irshad;
- Ali, Hassan;
- Ahmad, Bashir;
- Ramay, Shahid;
- Raza, Nadeem;
- Ehsan, Muhammad;
- Ashiq, Muhammad
- Article
38
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1073, doi. 10.1007/s11664-015-4289-0
- Yu, Naisen;
- Dong, Dapeng;
- Qi, Yan;
- Wu, Yunfeng;
- Chen, Lu
- Article
39
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1175, doi. 10.1007/s11664-015-4163-0
- Ullah, Irfan;
- Shah, Mutabar;
- Khan, Majid;
- Wahab, Fazal
- Article