Works matching IS 03615235 AND DT 2016 AND VI 45 AND IP 12
1
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6192, doi. 10.1007/s11664-016-4719-7
- Liu, Ting-Chien;
- Wu, Chih-Chung;
- Huang, Chih-Hsiang;
- Chen, Chih-Ming
- Article
2
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6200, doi. 10.1007/s11664-016-4763-3
- Wang, Chao-Hong;
- Li, Kuan-Ting
- Article
3
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6102, doi. 10.1007/s11664-016-4773-1
- Lee, Hwa-Teng;
- Huang, Kuo-Chen
- Article
4
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6247, doi. 10.1007/s11664-016-4775-z
- Lewis, Matthew;
- Bichoupan, Kevin;
- Shah, S.;
- Zide, Joshua
- Article
5
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6208, doi. 10.1007/s11664-016-4787-8
- Huang, Tzu-Ting;
- Lin, Shih-Wei;
- Chen, Chih-Ming;
- Chen, Pei;
- Yen, Yee-Wen
- Article
6
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6067, doi. 10.1007/s11664-016-4815-8
- Gancarz, Tomasz;
- Pstrus, Janusz;
- Cempura, Grzegorz;
- Berent, Katarzyna
- Article
7
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6143, doi. 10.1007/s11664-016-4832-7
- Yakymovych, A.;
- Plevachuk, Yu.;
- Švec, P.;
- Janičkovič, D.;
- Šebo, P.;
- Beronská, N.;
- Roshanghias, A.;
- Ipser, H.
- Article
8
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6150, doi. 10.1007/s11664-016-4837-2
- Hong, Won;
- Oh, Chulmin;
- Kim, Mi-Song;
- Lee, Young;
- Kim, Hui;
- Hong, Sung;
- Moon, Jeong
- Article
9
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6214, doi. 10.1007/s11664-016-4846-1
- Huang, Chieh-Szu;
- Chang, Ming-Chuan;
- Huang, Cheng-Liang;
- Lin, Shih-kang
- Article
10
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6233, doi. 10.1007/s11664-016-4848-z
- Mukherjee, Arnab;
- Ankit, Kumar;
- Mukherjee, Rajdip;
- Nestler, Britta
- Article
11
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6163, doi. 10.1007/s11664-016-4874-x
- Huang, Y.;
- Chen, C.;
- Lee, B.;
- Chen, H.;
- Wang, C.;
- Wu, Albert
- Article
12
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6113, doi. 10.1007/s11664-016-4879-5
- Zuruzi, Abu;
- Mazulianawati, Majid
- Article
13
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6171, doi. 10.1007/s11664-016-4885-7
- Tang, Y.;
- Hsu, Y.;
- Lin, E.;
- Hu, Y.;
- Liu, C.
- Article
14
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6052, doi. 10.1007/s11664-016-4892-8
- Farahi, Nader;
- Prabhudev, Sagar;
- Bugnet, Matthieu;
- Botton, Gianluigi;
- Salvador, James;
- Kleinke, Holger
- Article
15
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6177, doi. 10.1007/s11664-016-4902-x
- Lee, Tae-Kyu;
- Chen, Zhiqiang;
- Baty, Greg;
- Bieler, Thomas;
- Kim, Choong-Un
- Article
16
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6184, doi. 10.1007/s11664-016-4908-4
- Kim, Kyoung-Ho;
- Koike, Junichi;
- Yoon, Jeong-Won;
- Yoo, Sehoon
- Article
17
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6095, doi. 10.1007/s11664-016-4929-z
- Wang, Yan;
- Han, Jing;
- Ma, Limin;
- Zuo, Yong;
- Guo, Fu
- Article
18
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6079, doi. 10.1007/s11664-016-4941-3
- Liu, C.;
- Wei, Y.;
- Lin, E.;
- Hsu, Y.;
- Tang, Y.
- Article
19
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6086, doi. 10.1007/s11664-016-4965-8
- Han, Jing;
- Tan, Shihai;
- Guo, Fu
- Article
20
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6355, doi. 10.1007/s11664-016-4983-6
- Wang, Jingzhou;
- Koizumi, Atsushi;
- Fujiwara, Yasufumi;
- Jadwisienczak, Wojciech
- Article
21
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6292, doi. 10.1007/s11664-016-4986-3
- Tellekamp, M.;
- Shank, Joshua;
- Goorsky, Mark;
- Doolittle, W.
- Article
22
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6280, doi. 10.1007/s11664-016-4987-2
- Gong, Yiyang;
- Zhang, Xiaotian;
- Redwing, Joan;
- Jackson, Thomas
- Article
23
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6123, doi. 10.1007/s11664-016-5000-9
- Tsou, Chia-Hung;
- Liu, Kai-Ning;
- Lin, Heng-Tien;
- Ouyang, Fan-Yi
- Article
24
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6323, doi. 10.1007/s11664-016-5002-7
- Ohmi, Shun-ichiro;
- Chen, Mengyi;
- Masahiro, Yasushi
- Article
25
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6310, doi. 10.1007/s11664-016-5008-1
- Reed, Austin;
- Paine, David;
- Lee, Sunghwan
- Article
26
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6059, doi. 10.1007/s11664-016-5011-6
- Madavali, Babu;
- Hong, Soon-Jik
- Article
27
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6222, doi. 10.1007/s11664-016-5012-5
- Radchenko, I.;
- Tippabhotla, S.;
- Tamura, N.;
- Budiman, A.
- Article
28
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6317, doi. 10.1007/s11664-016-5015-2
- Noorzad, Camron;
- Zhao, Xin;
- Harotoonian, Vache;
- Woodall, Jerry
- Article
29
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6329, doi. 10.1007/s11664-016-5023-2
- Saadatkia, Pooneh;
- Ariyawansa, G.;
- Leedy, K.;
- Look, D.;
- Boatner, L.;
- Selim, F.
- Article
30
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6337, doi. 10.1007/s11664-016-5025-0
- Haseman, Micah;
- Saadatkia, P.;
- Winarski, D.;
- Selim, F.;
- Leedy, K.;
- Tetlak, S.;
- Look, D.;
- Anwand, W.;
- Wagner, A.
- Article
31
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6251, doi. 10.1007/s11664-016-5028-x
- Al-Kabi, Sattar;
- Ghetmiri, Seyed;
- Margetis, Joe;
- Du, Wei;
- Mosleh, Aboozar;
- Dou, Wei;
- Sun, Greg;
- Soref, Richard;
- Tolle, John;
- Li, Baohua;
- Mortazavi, Mansour;
- Naseem, Hameed;
- Yu, Shui-Qing
- Article
32
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6346, doi. 10.1007/s11664-016-5029-9
- Su, Jie;
- Posthuma, Niels;
- Wellekens, Dirk;
- Saripalli, Yoga;
- Decoutere, Stefaan;
- Arif, Ronald;
- Papasouliotis, George
- Article
33
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6305, doi. 10.1007/s11664-016-5030-3
- Harotoonian, Vache;
- Woodall, Jerry
- Article
34
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6265, doi. 10.1007/s11664-016-5031-2
- Dou, Wei;
- Ghetmiri, Seyed;
- Al-Kabi, Sattar;
- Mosleh, Aboozar;
- Zhou, Yiyin;
- Alharthi, Bader;
- Du, Wei;
- Margetis, Joe;
- Tolle, John;
- Kuchuk, Andrian;
- Benamara, Mourad;
- Li, Baohua;
- Naseem, Hameed;
- Mortazavi, Mansour;
- Yu, Shui-Qing
- Article
35
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6258, doi. 10.1007/s11664-016-5032-1
- Addamane, Sadhvikas;
- Shima, Darryl;
- Soudachanh, Amy;
- Hains, Christopher;
- Dawson, Ralph;
- Balakrishnan, Ganesh
- Article
36
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6273, doi. 10.1007/s11664-016-5033-0
- Zhang, Xiaotian;
- Al Balushi, Zakaria;
- Zhang, Fu;
- Choudhury, Tanushree;
- Eichfeld, Sarah;
- Alem, Nasim;
- Jackson, Thomas;
- Robinson, Joshua;
- Redwing, Joan
- Article
37
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6300, doi. 10.1007/s11664-016-5042-z
- Gurunathan, Ramya;
- Nasr, Joseph;
- Cordell, Jacob;
- Banai, Rona;
- Abraham, Michael;
- Cooley, Kayla;
- Horn, Mark;
- Mohney, Suzanne
- Article
38
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6130, doi. 10.1007/s11664-016-5044-x
- Huang, Wei-Hsiang;
- Lin, Kwang-Lung;
- Lin, Yu-Wei;
- Cheng, Yun-Kai
- Article
39
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6285, doi. 10.1007/s11664-016-5049-5
- Yang, M.;
- Wadekar, P.;
- Hsieh, W.;
- Huang, H.;
- Lin, C.;
- Chou, J.;
- Liao, C.;
- Chang, C.;
- Seo, H.;
- You, S.;
- Tu, L.;
- Lo, I.;
- Ho, N.;
- Yeh, S.;
- Liao, H.;
- Chen, Q.;
- Chu, W.
- Article
40
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6137, doi. 10.1007/s11664-016-5109-x
- Huang, Wei-Chih;
- Lin, Kwang-Lung
- Article
41
- Journal of Electronic Materials, 2016, v. 45, n. 12, p. 6047, doi. 10.1007/s11664-016-4692-1
- Article