Works matching IS 03615235 AND DT 2016 AND VI 45 AND IP 10
1
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4736, doi. 10.1007/s11664-016-4418-4
- Arı, Ozan;
- Bilgilisoy, Elif;
- Ozceri, Elif;
- Selamet, Yusuf
- Article
2
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4903, doi. 10.1007/s11664-016-4533-2
- Huang, Yafei;
- Yu, Jun;
- Shen, Chunying;
- Tang, Mingliang
- Article
3
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4908, doi. 10.1007/s11664-016-4585-3
- Singh, Charanjeet;
- Kaur, Randeep;
- Bindra Narang, S.;
- Puri, Maalti;
- Dhiman, Tanvi;
- Kaur, Harpreet
- Article
4
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4730, doi. 10.1007/s11664-016-4626-y
- Hou, Xueling;
- Han, Ning;
- Xue, Yun;
- Lu, Qianqian;
- Wang, Xiaochen;
- Phan, Manh-Huong
- Article
5
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5341, doi. 10.1007/s11664-016-4638-7
- Salgado-Delgado, R.;
- Olarte-Paredes, A.;
- Vargas-Galarza, Z.;
- García-Hernández, E.;
- Salgado-Delgado, A.;
- Rubio-Rosas, E.;
- Campos-Álvarez, J.;
- Castaño, V.
- Article
6
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4806, doi. 10.1007/s11664-016-4639-6
- Saraee, Kh.;
- Zadeh, M.;
- Mostajaboddavati, M.;
- Kharieky, A.
- Article
7
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4913, doi. 10.1007/s11664-016-4643-x
- Wan, Fangpei;
- He, Aina;
- Zhang, Jianhua;
- Song, Jiancheng;
- Wang, Anding;
- Chang, Chuntao;
- Wang, Xinmin
- Article
8
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4935, doi. 10.1007/s11664-016-4645-8
- Lin, Y.;
- Lee, K.;
- Hwang, J.;
- Chu, H.;
- Hsu, C.;
- Chen, S.;
- Chuang, T.
- Article
9
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4790, doi. 10.1007/s11664-016-4646-7
- Giang, Lam;
- Marciniak, Lukasz;
- Hreniak, Dariusz;
- Anh, Tran;
- Minh, Le
- Article
10
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4952, doi. 10.1007/s11664-016-4647-6
- Xie, Yu-Long;
- Song, Ping;
- Zhao, Su-Qing
- Article
11
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5347, doi. 10.1007/s11664-016-4649-4
- Article
12
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4979, doi. 10.1007/s11664-016-4653-8
- Ahmad, Iqbal;
- Shah, Syed;
- Ashiq, Muhammad;
- Nawaz, Faisal;
- Shah, Afzal;
- Siddiq, Muhammad;
- Fahim, Iqra;
- Khan, Samiullah
- Article
13
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4919, doi. 10.1007/s11664-016-4654-7
- Zhang, Xuechao;
- Zhao, Xiuchen;
- Zheng, Bing;
- Liu, Ying;
- Cheng, Jingwei;
- Li, Hong
- Article
14
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4898, doi. 10.1007/s11664-016-4662-7
- Westover, Richard;
- Mitchson, Gavin;
- Hite, Omar;
- Hill, Krista;
- Johnson, David
- Article
15
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5238, doi. 10.1007/s11664-016-4658-3
- Kajitani, T.;
- Takahashi, K.;
- Saito, M.;
- Suzuki, H.;
- Kikuchi, S.;
- Kubouchi, M.;
- Hayashi, K.
- Article
16
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4890, doi. 10.1007/s11664-016-4657-4
- Article
17
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4796, doi. 10.1007/s11664-016-4660-9
- Motloung, S.;
- Dejene, F.;
- Sithole, M.;
- Koao, L.;
- Ntwaeaborwa, O.;
- Swart, H.;
- Motaung, T.
- Article
18
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4958, doi. 10.1007/s11664-016-4661-8
- Article
19
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5443, doi. 10.1007/s11664-016-4656-5
- Xujing, Nan;
- Songbai, Xue;
- Peizhuo, Zhai;
- Dongxue, Luo
- Article
20
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5246, doi. 10.1007/s11664-016-4663-6
- Lai, Chunhua;
- Li, Junjie;
- Pan, Chengjun;
- Wang, Lei;
- Bai, Xiaojun
- Article
21
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5436, doi. 10.1007/s11664-016-4664-5
- Liu, Xiaojian;
- Liu, Wei;
- Wang, Chunqing;
- Zheng, Zhen;
- Kong, Lingchao
- Article
22
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4928, doi. 10.1007/s11664-016-4665-4
- Kohri, Hitoshi;
- Yagasaki, Takayoshi
- Article
23
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5375, doi. 10.1007/s11664-016-4667-2
- Khang, Nguyen;
- Thanh, Do;
- Minh, Nguyen
- Article
24
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4854, doi. 10.1007/s11664-016-4668-1
- Chen, Chia-Hsun;
- Lee, Ching-Ting
- Article
25
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5264, doi. 10.1007/s11664-016-4669-0
- Leszczynski, Juliusz;
- Kolezynski, Andrzej;
- Juraszek, Jarosław;
- Wojciechowski, Krzysztof
- Article
26
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4989, doi. 10.1007/s11664-016-4670-7
- Cao, Ya;
- Li, Zhen;
- Wang, Yang;
- Zhang, Tao;
- Li, Yinchang;
- Liu, Xueqin;
- Li, Fei
- Article
27
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5017, doi. 10.1007/s11664-016-4671-6
- Yang, Zhaoning;
- Luo, Fa;
- Gao, Lu;
- Qing, Yuchang;
- Zhou, Wancheng;
- Zhu, Dongmei
- Article
28
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5006, doi. 10.1007/s11664-016-4672-5
- Zhang, Yong;
- Sun, Huajun;
- Chen, Wen
- Article
29
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4847, doi. 10.1007/s11664-016-4673-4
- Thomas, Deepu;
- Augustine, Simon;
- Sadasivuni, Kishor;
- Ponnamma, Deepalekshmi;
- Alhaddad, Ahmad;
- Cabibihan, John-John;
- Vijayalakshmi, K.A.
- Article
30
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5206, doi. 10.1007/s11664-016-4674-3
- Li, Yuanliang;
- Cui, Zhimin;
- Sang, Rongli;
- Li, Zhongqiu;
- Ma, Xuegang;
- Su, Hao
- Article
31
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4966, doi. 10.1007/s11664-016-4675-2
- Zheng, Hao;
- Xu, Shan;
- Li, Lin;
- Feng, Chuanqi;
- Wang, Shiquan
- Article
32
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4943, doi. 10.1007/s11664-016-4676-1
- Yan, Yinglin;
- Ren, Bing;
- Xu, Yunhua;
- Wang, Juan;
- Yang, Rong;
- Zhong, Lisheng;
- Zhao, Nana;
- Wu, Hong
- Article
33
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5418, doi. 10.1007/s11664-016-4677-0
- Mahendia, Suman;
- Goyal, Parveen;
- Tomar, Anil;
- Chahal, Rishi;
- Kumar, Shyam
- Article
34
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5427, doi. 10.1007/s11664-016-4678-z
- Liu, Xiaorui;
- Huang, Chengzhi;
- Shen, Wei;
- He, Rongxing;
- Li, Ming
- Article
35
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5232, doi. 10.1007/s11664-016-4679-y
- Xu, Bin;
- Zhang, Jing;
- Yu, Gongqi;
- Ma, Shanshan;
- Wang, Yusheng;
- Yi, Lin
- Article
36
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5024, doi. 10.1007/s11664-016-4680-5
- Li, S.;
- Wu, X.;
- Zhang, T.;
- Tian, Y.;
- Yan, Z.;
- Zhu, H.
- Article
37
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5082, doi. 10.1007/s11664-016-4681-4
- Biskri, Z.;
- Rached, H.;
- Bouchear, M.;
- Rached, D.;
- Aida, M.
- Article
38
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5040, doi. 10.1007/s11664-016-4682-3
- Ji, Z.;
- Zhou, R.;
- Lew Yan Voon, L.;
- Zhuang, Y.
- Article
39
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4999, doi. 10.1007/s11664-016-4683-2
- Article
40
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5404, doi. 10.1007/s11664-016-4684-1
- Hassanzadazar, M.;
- Ahmadi, M.;
- Ismail, Razali;
- Goudarzi, Hadi
- Article
41
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5048, doi. 10.1007/s11664-016-4685-0
- Puri, Maalti;
- Bahel, Shalini;
- Narang, Sukhleen
- Article
42
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5412, doi. 10.1007/s11664-016-4687-y
- Ma, ShengQian;
- Li, Feng;
- Jiang, ChunLing
- Article
43
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5279, doi. 10.1007/s11664-016-4688-x
- Ghodke, Swapnil;
- Hiroishi, Naoya;
- Yamamoto, Akio;
- Ikuta, Hiroshi;
- Matsunami, Masaharu;
- Takeuchi, Tsunehiro
- Article
44
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5285, doi. 10.1007/s11664-016-4689-9
- Rehman, Naveed;
- Siddiqui, Mubashir
- Article
45
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4973, doi. 10.1007/s11664-016-4690-3
- Li, X.;
- Zhou, J.;
- Deng, J.;
- Zheng, H.;
- Zheng, L.;
- Zheng, P.;
- Qin, H.
- Article
46
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4838, doi. 10.1007/s11664-016-4691-2
- Lee, Ching-Ting;
- Lee, Hsin-Ying;
- Chen, Kuan-Hao
- Article
47
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5033, doi. 10.1007/s11664-016-4693-0
- Zhao, Jingcheng;
- Cheng, Yongzhi
- Article
48
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5302, doi. 10.1007/s11664-016-4694-z
- Goh, Kian;
- Haseeb, A.;
- Wong, Yew
- Article
49
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5074, doi. 10.1007/s11664-016-4695-y
- Brahem, R.;
- Farhat, N.;
- Graça, M.;
- Costa, L.
- Article
50
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 5058, doi. 10.1007/s11664-016-4696-x
- Dan, Nguyen;
- Yen, Nguyen;
- Thanh, Pham
- Article