Works matching IS 03615235 AND DT 2015 AND VI 44 AND IP 8
1
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2657, doi. 10.1007/s11664-015-3670-3
- Hong, Jeong;
- Wagata, Hajime;
- Ohashi, Naoki;
- Katsumata, Ken-ichi;
- Okada, Kiyoshi;
- Matsushita, Nobuhiro
- Article
2
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2615, doi. 10.1007/s11664-015-3672-1
- Article
3
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2592, doi. 10.1007/s11664-015-3673-0
- Fan, Xiaojiao;
- Liu, Hongxia;
- Fei, Chenxi;
- Zhong, Bo;
- Wang, Xing;
- Wang, Qianqiong
- Article
4
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2608, doi. 10.1007/s11664-015-3675-y
- Kwon, Young-Tae;
- Lee, Young-In;
- Lee, Kun-Jae;
- Choi, Yo-Min;
- Choa, Yong-Ho
- Article
5
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2638, doi. 10.1007/s11664-015-3676-x
- Guo, Cuiping;
- Huang, Liang;
- Li, Changrong;
- Shang, Shunli;
- Du, Zhenmin
- Article
6
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2559, doi. 10.1007/s11664-015-3678-8
- Nahar, Manuj;
- Keto, John;
- Becker, Michael;
- Kovar, Desiderio
- Article
7
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2631, doi. 10.1007/s11664-015-3684-x
- Muthu, G.;
- Shanmugam, S.;
- Veerappan, AR.
- Article
8
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2598, doi. 10.1007/s11664-015-3687-7
- Shemelya, Corey;
- Rivera, Armando;
- Perez, Angel;
- Rocha, Carmen;
- Liang, Min;
- Yu, Xiaoju;
- Kief, Craig;
- Alexander, David;
- Stegeman, James;
- Xin, Hao;
- Wicker, Ryan;
- MacDonald, Eric;
- Roberson, David
- Article
9
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2829, doi. 10.1007/s11664-015-3688-6
- Article
10
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2699, doi. 10.1007/s11664-015-3691-y
- Dadsetani, M.;
- Kianisadr, B.;
- Nejatipour, H.
- Article
11
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2835, doi. 10.1007/s11664-015-3692-x
- Nejm, Razan;
- Ayesh, Ahmad;
- Zeze, Dagou;
- Sleiman, Adam;
- Mabrook, Mohammed;
- Al-Ghaferi, Amal;
- Hussein, Mousa
- Article
12
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2585, doi. 10.1007/s11664-015-3693-9
- Chandel, N.;
- Mehta, N.;
- Kumar, A.
- Article
13
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2762, doi. 10.1007/s11664-015-3695-7
- Amarasinghe, Priyanthi;
- Qadri, Syed;
- Wijewarnasuriya, Priyalal
- Article
14
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2574, doi. 10.1007/s11664-015-3696-6
- Article
15
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2566, doi. 10.1007/s11664-015-3699-3
- Cimaroli, Alex;
- Paquin, Brooke;
- Paduel, Naba;
- Moutinho, Helio;
- Al-Jassim, Mowafak;
- Yan, Yanfa
- Article
16
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2849, doi. 10.1007/s11664-015-3700-1
- Zhang, Mingyang;
- Yang, Junyou;
- Jiang, Qinghui;
- Fu, Liangwei;
- Xiao, Ye;
- Luo, Yubo;
- Zhang, Dan;
- Cheng, Yudong;
- Zhou, Zhiwei
- Article
17
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2807, doi. 10.1007/s11664-015-3704-x
- Takpire, S.R.;
- Waghuley, S.A.
- Article
18
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2670, doi. 10.1007/s11664-015-3705-9
- Yang, Weijia;
- Wang, Wenliang;
- Lin, Yunhao;
- Liu, Zuolian;
- Zhou, Shizhong;
- Qian, Huirong;
- Li, Guoqiang
- Article
19
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2813, doi. 10.1007/s11664-015-3706-8
- DeWames, R.;
- Littleton, R.;
- Witte, K.;
- Wichman, A.;
- Bellotti, E.;
- Pellegrino, J.
- Article
20
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2768, doi. 10.1007/s11664-015-3707-7
- Yahia, I.;
- AlFaify, S.;
- Yakuphanoglu, F.;
- Chusnutdinow, S.;
- Wojtowicz, T.;
- Karczewski, G.
- Article
21
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2578, doi. 10.1007/s11664-015-3708-6
- Song, X.;
- Valset, K.;
- Graff, J.S.;
- Thøgersen, A.;
- Gunnæs, A.E.;
- Luxsacumar, S.;
- Løvvik, O.M.;
- Snyder, G.J.;
- Finstad, T.G.
- Article
22
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2651, doi. 10.1007/s11664-015-3710-z
- Yang, Chen;
- Zhu, Dachuan;
- Zeng, Tao;
- Jiao, Lin
- Article
23
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2862, doi. 10.1007/s11664-015-3711-y
- Lopez-Juarez, Rigoberto;
- Gomez-Vidales, Virginia;
- Cruz, M.P.;
- Villafuerte-Castrejon, M.E.
- Article
24
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2842, doi. 10.1007/s11664-015-3712-x
- Bilgaiyan, Anubha;
- Dixit, Tejendra;
- Palani, I.;
- Singh, Vipul
- Article
25
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2856, doi. 10.1007/s11664-015-3720-x
- Jamalian, Majid;
- Ghasemi, Ali;
- Pourhosseini Asl, Mohammad
- Article
26
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2754, doi. 10.1007/s11664-015-3724-6
- Vidyadharan, Viji;
- Vasudevan, Prathibha;
- Karthika, S.;
- Joseph, Cyriac;
- Unnikrishnan, N.;
- Biju, P.
- Article
27
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2693, doi. 10.1007/s11664-015-3726-4
- Mousavi, Hamze;
- Bagheri, Mehran
- Article
28
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2890, doi. 10.1007/s11664-015-3727-3
- Tian, Yongshang;
- Gong, Yansheng;
- Meng, Dawei;
- Li, Yuanjian;
- Kuang, Boya
- Article
29
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2930, doi. 10.1007/s11664-015-3728-2
- Bick, D.;
- Sharath, S.;
- Hoffman, I.;
- Major, M.;
- Kurian, J.;
- Alff, L.
- Article
30
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2869, doi. 10.1007/s11664-015-3731-7
- Article
31
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2555, doi. 10.1007/s11664-015-3732-6
- Article
32
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2712, doi. 10.1007/s11664-015-3734-4
- Bang, Ki;
- Oh, Yong;
- Lee, Seung-Yun
- Article
33
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2773, doi. 10.1007/s11664-015-3735-3
- Sun, Quanzhi;
- Yang, Jianrong;
- Wei, Yanfeng;
- Zhang, Juan;
- Sun, Ruiyun
- Article
34
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2883, doi. 10.1007/s11664-015-3736-2
- Liang, Pengxia;
- Li, Zhengqiang;
- Mi, Yongsheng;
- Yang, Zhou;
- Wang, Dong;
- Cao, Hui;
- He, Wanli;
- Yang, Huai
- Article
35
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2686, doi. 10.1007/s11664-015-3738-0
- Article
36
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2786, doi. 10.1007/s11664-015-3739-z
- Zeng, Guanggen;
- Zhang, Jingquan;
- Li, Bing;
- Wu, Lili;
- Li, Wei;
- Feng, Lianghuan
- Article
37
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2779, doi. 10.1007/s11664-015-3744-2
- Vardanyan, K.A.;
- Vartanian, A.L.;
- Kirakosyan, A.A.
- Article
38
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2915, doi. 10.1007/s11664-015-3748-y
- Rabari, Ronil;
- Mahmud, Shohel;
- Dutta, Animesh;
- Biglarbegian, Mohammad
- Article
39
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2877, doi. 10.1007/s11664-015-3751-3
- Jiang, Qiang;
- Yin, Shengyu;
- Feng, Chuanqi;
- Guo, Zaiping
- Article
40
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2898, doi. 10.1007/s11664-015-3752-2
- Mu, Wei;
- Sun, Shuangxi;
- Jiang, Di;
- Fu, Yifeng;
- Edwards, Michael;
- Zhang, Yong;
- Jeppson, Kjell;
- Liu, Johan
- Article
41
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2719, doi. 10.1007/s11664-015-3755-z
- Zhao, Cansong;
- Li, Zhao;
- Mi, Wei;
- Luan, Caina;
- Feng, Xianjin;
- Ma, Jin
- Article
42
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2823, doi. 10.1007/s11664-015-3757-x
- Pitthan, E.;
- Gobbi, A.L.;
- Boudinov, H.I.;
- Stedile, F.C.
- Article
43
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2725, doi. 10.1007/s11664-015-3758-9
- Article
44
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2679, doi. 10.1007/s11664-015-3777-6
- Selvaraj, S.;
- Kamath, A.;
- Wang, W.;
- Chen, Z.;
- Win, K.;
- Phua, T.;
- Lo, G.
- Article
45
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2792, doi. 10.1007/s11664-015-3760-2
- Ben Mahrsia, R.;
- Choubani, M.;
- Bouzaiene, L.;
- Maaref, H.
- Article
46
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2736, doi. 10.1007/s11664-015-3763-z
- Singh, Vijay;
- Watanabe, S.;
- Gundu Rao, T.;
- Senthil Kumaran, R.;
- Gao, Hui;
- Li, Jinglin;
- Kwak, Ho-Young
- Article
47
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2908, doi. 10.1007/s11664-015-3768-7
- Fang, J.S.;
- Lin, C.S.;
- Huang, Y.Y.;
- Chin, T.S.
- Article
48
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2745, doi. 10.1007/s11664-015-3771-z
- Mohsennia, Mohsen;
- Bidgoli, Maryam;
- Boroumand, Farhad;
- Khademi, Alireza
- Article
49
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2800, doi. 10.1007/s11664-015-3759-8
- Ravikumar, M.;
- Valanarasu, S.;
- Chandramohan, R.;
- Jacob, S.;
- Kathalingam, A.
- Article
50
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2939, doi. 10.1007/s11664-015-3778-5
- Kumar, Narinder;
- Kumar, Rajesh;
- Kumar, Sushil;
- Chakarvarti, S.
- Article