Works matching IS 03615235 AND DT 2015 AND VI 44 AND IP 6
1
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1388, doi. 10.1007/s11664-014-3369-x
- Jeon, Bong-Jun;
- Shin, Dong-Kil;
- Kim, Il-Ho
- Article
2
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1394, doi. 10.1007/s11664-014-3380-2
- Barry, Matthew;
- Agbim, Kenechi;
- Chyu, Minking
- Article
3
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1402, doi. 10.1007/s11664-014-3381-1
- Shalev, Tom;
- Meroz, Omer;
- Beeri, Ofer;
- Gelbstein, Yaniv
- Article
4
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1408, doi. 10.1007/s11664-014-3384-y
- Tak, Jang-Yeul;
- Lee, Kyu;
- Kim, Jong-Young;
- Lim, Chang-Hyun;
- Seo, Won-Seon;
- Lim, Young;
- Cho, Hyung;
- Choi, Soon-Mok
- Article
5
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1413, doi. 10.1007/s11664-014-3385-x
- Anno, Hiroaki;
- Shirataki, Ritsuko
- Article
6
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1420, doi. 10.1007/s11664-014-3386-9
- Budak, S.;
- Baker, M.;
- Lassiter, J.;
- Smith, C.;
- Muntele, C.;
- Johnson, R.
- Article
7
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1426, doi. 10.1007/s11664-014-3387-8
- Article
8
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1432, doi. 10.1007/s11664-014-3401-1
- Lee, Woo-Man;
- Shin, Dong-Kil;
- Kim, Il-Ho
- Article
9
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1438, doi. 10.1007/s11664-014-3402-0
- Yang, Xu-qiu;
- Li, Wen-juan;
- Chen, Gang;
- Zhai, Peng-cheng
- Article
10
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1444, doi. 10.1007/s11664-014-3408-7
- Article
11
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 2203, doi. 10.1007/s11664-014-3410-0
- Liu, X.;
- Deng, Y.;
- Wang, W.;
- Su, C.
- Article
12
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1450, doi. 10.1007/s11664-014-3411-z
- Sie, F.;
- Hwang, C.;
- Tang, Y.;
- Kuo, C.;
- Chou, Y.;
- Yeh, C.;
- Ho, H.;
- Lin, Y.;
- Lan, C.
- Article
13
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1456, doi. 10.1007/s11664-014-3412-y
- Gurevich, Yuri;
- Lashkevych, Igor
- Article
14
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1460, doi. 10.1007/s11664-014-3416-7
- Joseph, Elad;
- Amouyal, Yaron
- Article
15
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1469, doi. 10.1007/s11664-014-3418-5
- Meng, Xiangning;
- Suzuki, Ryosuke
- Article
16
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1477, doi. 10.1007/s11664-014-3420-y
- Li, Wenjuan;
- Li, Guodong;
- Yang, Xuqiu;
- Liu, Lisheng;
- Zhai, Pengcheng
- Article
17
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1483, doi. 10.1007/s11664-014-3423-8
- Takagiwa, Y.;
- Yoshida, T.;
- Yanagihara, D.;
- Kimura, K.
- Article
18
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1491, doi. 10.1007/s11664-014-3428-3
- Deng, Y.;
- Zhang, Y.;
- Su, C.
- Article
19
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1498, doi. 10.1007/s11664-014-3432-7
- Sie, F.;
- Hwang, C.;
- Kuo, C.;
- Chou, Y.;
- Yeh, C.;
- Ho, H.;
- Lin, Y.;
- Lan, C.
- Article
20
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1504, doi. 10.1007/s11664-014-3435-4
- You, Sin-Wook;
- Shin, Dong-Kil;
- Ur, Soon-Chul;
- Kim, Il-Ho
- Article
21
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1509, doi. 10.1007/s11664-014-3438-1
- Jariwala, Bhakti;
- Shah, Dimple;
- Ravindra, N.
- Article
22
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1517, doi. 10.1007/s11664-014-3439-0
- Melnikov, A.;
- Tabachkova, N.;
- Kichik, S.;
- Marakushev, I.;
- Koryakin, A.;
- Ponomarev, V.
- Article
23
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1524, doi. 10.1007/s11664-014-3442-5
- Deng, Y.;
- Chen, Y.;
- Chen, S.;
- Xianyu, W.;
- Su, C.
- Article
24
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1531, doi. 10.1007/s11664-014-3446-1
- Lee, Kyu;
- Choi, Soon-Mok;
- Roh, Jong;
- Hwang, Sungwoo;
- Kim, Sang;
- Shin, Weon;
- Park, Hee;
- Lee, Jeong;
- Kim, Sung;
- Yang, Dae
- Article
25
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1536, doi. 10.1007/s11664-014-3447-0
- Specht, E.;
- Ma, J.;
- Delaire, O.;
- Budai, J.;
- May, A.;
- Karapetrova, E.
- Article
26
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1540, doi. 10.1007/s11664-014-3459-9
- Niedziółka, Kinga;
- Jund, Philippe
- Article
27
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1547, doi. 10.1007/s11664-014-3471-0
- Saini, S.;
- Mele, P.;
- Honda, H.;
- Matsumoto, K.;
- Miyazaki, K.;
- Luna, L.;
- Hopkins, P.
- Article
28
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1554, doi. 10.1007/s11664-014-3472-z
- Tang, Z.;
- Deng, Y.;
- Su, C.;
- Yuan, X.
- Article
29
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1562, doi. 10.1007/s11664-014-3480-z
- Waldrop, Spencer;
- Morelli, Donald
- Article
30
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1566, doi. 10.1007/s11664-014-3482-x
- Derebasi, Naim;
- Eltez, Muhammed;
- Guldiken, Fikret;
- Sever, Aziz;
- Kallis, Klaus;
- Kilic, Halil;
- Ozmutlu, Emin
- Article
31
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1573, doi. 10.1007/s11664-014-3483-9
- Kim, Kwang-Chon;
- Kwon, Beomjin;
- Kim, Hyun;
- Baek, Seung-Hyub;
- Park, Chan;
- Kim, Seong;
- Kim, Jin-Sang
- Article
32
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1579, doi. 10.1007/s11664-014-3485-7
- Lee, Go-Eun;
- Eum, A-Young;
- Song, Kwon-Min;
- Kim, Il-Ho;
- Lim, Young;
- Seo, Won-Seon;
- Choi, Byeong-Jun;
- Hwang, Chang-Won
- Article
33
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1585, doi. 10.1007/s11664-014-3486-6
- Jiang, Qinglin;
- Liu, Congcong;
- Zhu, Danhua;
- Song, Haijun;
- Xu, Jingkun;
- Shi, Hui;
- Mo, Daize;
- Wang, Zhipeng;
- Zhu, Zhengyou
- Article
34
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1592, doi. 10.1007/s11664-014-3487-5
- Zou, Ping;
- Xu, Guiying;
- Wang, Song
- Article
35
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1599, doi. 10.1007/s11664-014-3488-4
- Neophytou, Neophytos;
- Karamitaheri, Hossein;
- Kosina, Hans
- Article
36
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1606, doi. 10.1007/s11664-014-3490-x
- Ming, Shouli;
- Zhen, Shijie;
- Lin, Kaiwen;
- Zhao, Li;
- Xu, Jingkun;
- Lu, Baoyang;
- Wang, Liangying;
- Xiong, Jinhua;
- Zhu, Zhengzhou
- Article
37
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1651, doi. 10.1007/s11664-014-3507-5
- Huang, Fengzhu;
- Xu, Gui-Ying;
- Zou, Ping
- Article
38
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1627, doi. 10.1007/s11664-014-3495-5
- Ren, Guangkun;
- Butt, Sajid;
- Zeng, Chengcheng;
- Liu, Yaochun;
- Zhan, Bin;
- Lan, Jinle;
- Lin, Yuanhua;
- Nan, Cewen
- Article
39
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1632, doi. 10.1007/s11664-014-3496-4
- Kusagaya, K.;
- Hagino, H.;
- Tanaka, S.;
- Miyazaki, K.;
- Takashiri, M.
- Article
40
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1637, doi. 10.1007/s11664-014-3500-z
- Sadia, Yatir;
- Madar, Naor;
- Kaler, Ilan;
- Gelbstein, Yaniv
- Article
41
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1644, doi. 10.1007/s11664-014-3505-7
- Article
42
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1614, doi. 10.1007/s11664-014-3491-9
- Ohara, B.;
- Sitar, R.;
- Soares, J.;
- Novisoff, P.;
- Nunez-Perez, A.;
- Lee, H.
- Article
43
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1656, doi. 10.1007/s11664-014-3508-4
- Hirayama, Naomi;
- Iida, Tsutomu;
- Funashima, Hiroki;
- Morioka, Shunsuke;
- Sakamoto, Mariko;
- Nishio, Keishi;
- Kogo, Yasuo;
- Takanashi, Yoshifumi;
- Hamada, Noriaki
- Article
44
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1663, doi. 10.1007/s11664-014-3509-3
- Lehr, Gloria;
- Morelli, Donald;
- Jin, Hyungyu;
- Heremans, Joseph
- Article
45
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1668, doi. 10.1007/s11664-014-3510-x
- Huang, Ben;
- Yang, Xuqiu;
- Liu, Lisheng;
- Zhai, Pengcheng
- Article
46
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1674, doi. 10.1007/s11664-014-3512-8
- Ye, Xiangrong;
- Chen, Gang;
- Duan, Bo;
- Zhai, Pengcheng
- Article
47
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1679, doi. 10.1007/s11664-014-3518-2
- Zheng, D.;
- Tanaka, S.;
- Miyazaki, K.;
- Takashiri, M.
- Article
48
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1688, doi. 10.1007/s11664-014-3519-1
- Wong-Ng, W.;
- Yan, Y.;
- Otani, M.;
- Martin, J.;
- Talley, K.;
- Barron, S.;
- Carroll, D.;
- Hewitt, C.;
- Joress, H.;
- Thomas, E.;
- Green, M.;
- Tang, X.
- Article
49
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1697, doi. 10.1007/s11664-014-3520-8
- Sharmin, Afsana;
- Rashid, Mohammad;
- Gaddipati, Vamsi;
- Sadeque, Abu;
- Ahmed, Shaikh
- Article
50
- Journal of Electronic Materials, 2015, v. 44, n. 6, p. 1704, doi. 10.1007/s11664-014-3522-6
- Merkisz, Jerzy;
- Fuc, Pawel;
- Lijewski, Piotr;
- Ziolkowski, Andrzej;
- Wojciechowski, Krzysztof
- Article