Works matching IS 03615235 AND DT 2015 AND VI 44 AND IP 3
1
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 778, doi. 10.1007/s11664-014-3468-8
- Ortega, Ada;
- Park, Byungwoo;
- Kim, Nam
- Article
2
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 784, doi. 10.1007/s11664-014-3506-6
- Mendoza, Kayna;
- Ortega, Ada;
- Kim, Nam
- Article
3
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 792, doi. 10.1007/s11664-014-3524-4
- Kim, Jongheon;
- Jo, Taeyong;
- Kim, Namyoon;
- Kwon, Dongil
- Article
4
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 797, doi. 10.1007/s11664-014-3526-2
- Article
5
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 804, doi. 10.1007/s11664-014-3548-9
- Kim, Dongkyun;
- Gil, Joon-Min
- Article
6
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 842, doi. 10.1007/s11664-014-3551-1
- Reeve, Kathlene;
- Anderson, Iver;
- Handwerker, Carol
- Article
7
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 886, doi. 10.1007/s11664-014-3571-x
- Stein, J.;
- Tineo, C.;
- Welzel, U.;
- Huegel, W.;
- Mittemeijer, E.
- Article
8
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 895, doi. 10.1007/s11664-014-3572-9
- Zhou, Bite;
- Zhou, Quan;
- Bieler, Thomas;
- Lee, Tae-kyu
- Article
9
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 909, doi. 10.1007/s11664-014-3573-8
- Yen, Yee-Wen;
- Chiu, Chao-Wei;
- Chen, Chih-Ming;
- Lai, Mei-Ting;
- Dai, Jia-Ying
- Article
10
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 916, doi. 10.1007/s11664-014-3577-4
- Yadav, Preeti;
- Sharma, Ambika
- Article
11
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 922, doi. 10.1007/s11664-014-3580-9
- Jha, Himanshu;
- Yadav, Asha;
- Singh, Mukesh;
- Kumar, Shailendra;
- Agarwal, Pratima
- Article
12
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 815, doi. 10.1007/s11664-014-3584-5
- Article
13
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 823, doi. 10.1007/s11664-014-3588-1
- Hong, Seongik;
- Kim, Namsoo
- Article
14
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 929, doi. 10.1007/s11664-014-3589-0
- Article
15
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 948, doi. 10.1007/s11664-014-3592-5
- Kumagai, Masaya;
- Kurosaki, Ken;
- Uchida, Noriyuki;
- Ohishi, Yuji;
- Muta, Hiroaki;
- Yamanaka, Shinsuke
- Article
16
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 831, doi. 10.1007/s11664-014-3593-4
- Song, Won-Seok;
- Kim, Seung-Gyu;
- Kim, Young-Cheon;
- Kwon, Dongil
- Article
17
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 953, doi. 10.1007/s11664-014-3594-3
- Ghalib, Basim;
- Hafedh, Ghaidaa;
- Al-Khursan, Amin
- Article
18
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 967, doi. 10.1007/s11664-014-3595-2
- Maheswari, D.;
- Venkatachalam, P.
- Article
19
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 977, doi. 10.1007/s11664-014-3596-1
- Wang, Zhaoyong;
- Hu, Xing;
- Yao, Ning
- Article
20
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 836, doi. 10.1007/s11664-014-3601-8
- Hong, Seongik;
- Sanchez, Cesar;
- Du, Hanuel;
- Kim, Namsoo
- Article
21
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 984, doi. 10.1007/s11664-014-3603-6
- Pan, Chia-Chi;
- Ho, Ching-Hwa
- Article
22
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 991, doi. 10.1007/s11664-014-3604-5
- Wu, W.J.;
- Zhu, T.;
- Liu, J.Q.;
- Fan, J.;
- Tu, L.C.
- Article
23
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 999, doi. 10.1007/s11664-014-3605-4
- Li, Y.;
- Feng, L.;
- Xing, Q.;
- Wang, X.
- Article
24
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 867, doi. 10.1007/s11664-014-3607-2
- Liu, Yi;
- Luo, Fa;
- Su, Jinbu;
- Zhou, Wancheng;
- Zhu, Dongmei
- Article
25
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 1003, doi. 10.1007/s11664-014-3608-1
- Zhao, W.;
- Sun, B.;
- Shen, Z.;
- Liu, Y.;
- Chen, P.
- Article
26
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 1008, doi. 10.1007/s11664-014-3613-4
- Liu, Xue-Bao;
- Liu, Guo-Biao;
- Wang, Yan;
- Chen, Chen;
- Li, Jian-Long;
- Liu, Heng
- Article
27
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 1015, doi. 10.1007/s11664-014-3614-3
- Liao, Wugang;
- Zeng, Xiangbin;
- Wen, Xixing;
- Zheng, Wenjun;
- Wen, Yangyang;
- Yao, Wei
- Article
28
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 874, doi. 10.1007/s11664-014-3618-z
- Ganbavle, V.;
- Kim, J.;
- Rajpure, K.
- Article
29
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 1021, doi. 10.1007/s11664-014-3620-5
- Chen, Chih-chi;
- Tseng, Yan-lun
- Article
30
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 1028, doi. 10.1007/s11664-014-3621-4
- Han, Bing;
- Zhang, Jie;
- Li, Pengju;
- Li, Jianliang;
- Bian, Yang;
- Shi, Hengzhen
- Article
31
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 771, doi. 10.1007/s11664-014-3425-6
- Hwang, Seyeon;
- Reyes, Edgar;
- Moon, Kyoung-sik;
- Rumpf, Raymond;
- Kim, Nam
- Article