Works matching IS 03615235 AND DT 2015 AND VI 44 AND IP 2
1
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 733, doi. 10.1007/s11664-014-3516-4
- Ji, Hongjun;
- Ma, Yuyou;
- Li, Mingyu;
- Wang, Chunqing
- Article
2
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 744, doi. 10.1007/s11664-014-3528-0
- Key Chung, C.;
- Zhu, Z.;
- Kao, C.
- Article
3
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 682, doi. 10.1007/s11664-014-3529-z
- Zhou, Li;
- Dubey, Mukul;
- Simões, Raul;
- Fan, Qi;
- Neto, Victor
- Article
4
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 688, doi. 10.1007/s11664-014-3532-4
- Che, F.;
- Wai, L.;
- Zhang, Xiaowu;
- Chai, T.
- Article
5
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 720, doi. 10.1007/s11664-014-3533-3
- Shen, Longguang;
- Liu, Jianguo;
- Zeng, Xiaoyan;
- Ren, Zhao
- Article
6
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 613, doi. 10.1007/s11664-014-3534-2
- Shinekumar, K.;
- Dutta, Soma
- Article
7
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 636, doi. 10.1007/s11664-014-3535-1
- Norouzzadeh, Payam;
- Vashaee, Daryoosh
- Article
8
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 725, doi. 10.1007/s11664-014-3537-z
- Chen, Xu;
- Zhou, Jian;
- Xue, Feng;
- Bai, Jing;
- Yao, Yao
- Article
9
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 751, doi. 10.1007/s11664-014-3538-y
- Yamaguchi, T.;
- Ikeda, O.;
- Oda, Y.;
- Hata, S.;
- Kuroki, K.;
- Kuroda, H.;
- Hirose, A.
- Article
10
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 699, doi. 10.1007/s11664-014-3541-3
- Babu, B.;
- Velumani, S.;
- Arenas-Alatorre, J.;
- Kassiba, A.;
- Chavez, Jose;
- Park, Hyeonsik;
- Hussain, Shahzada;
- Yi, Junsin;
- Asomoza, R.
- Article
11
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 630, doi. 10.1007/s11664-014-3546-y
- Fan, Ping;
- Zhang, Yin;
- Zheng, Zhuang-hao;
- Fan, Wei-fang;
- Luo, Jing-ting;
- Liang, Guang-xing;
- Zhang, Dong-ping
- Article
12
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 645, doi. 10.1007/s11664-014-3547-x
- Pei, Yanli;
- Mai, Biaoren;
- Zhang, Xiaoke;
- Hu, Ruiqin;
- Li, Ya;
- Chen, Zimin;
- Fan, Bingfeng;
- Liang, Jun;
- Wang, Gang
- Article
13
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 715, doi. 10.1007/s11664-014-3552-0
- Ali-Sharbati;
- Amiri, G.R.;
- Mousarezaei, R.
- Article
14
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 761, doi. 10.1007/s11664-014-3553-z
- Tan, Yansong;
- Li, Xin;
- Chen, Gang;
- Mei, Yunhui;
- Chen, Xu
- Article
15
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 651, doi. 10.1007/s11664-014-3554-y
- Han, Dong-Suk;
- Park, Jae-Hyung;
- Kang, Min-Soo;
- Shin, So-Ra;
- Jung, Yeon-Jae;
- Choi, Duck-Kyun;
- Park, Jong-Wan
- Article
16
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 706, doi. 10.1007/s11664-014-3555-x
- Krishnaveni, M.;
- Devadason, Suganthi
- Article
17
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 623, doi. 10.1007/s11664-014-3558-7
- Chuang, Tung-Han;
- Lin, Hsin-Jung;
- Wang, Hsi-Ching;
- Chuang, Chien-Hsun;
- Tsai, Chih-Hsin
- Article
18
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 658, doi. 10.1007/s11664-014-3561-z
- Yan, Haiyan;
- Wang, Rongrong;
- Li, Yongfei;
- Long, Wei
- Article
19
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 667, doi. 10.1007/s11664-014-3563-x
- Liu, Wenjiang;
- Cai, Shaohong;
- Deng, Xiaoqing
- Article
20
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 675, doi. 10.1007/s11664-014-3567-6
- Kumar, Hitanshu;
- Barman, P.;
- Singh, Ragini
- Article
