Works matching IS 03615235 AND DT 2015 AND VI 44 AND IP 11
1
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4207, doi. 10.1007/s11664-015-3918-y
- Sun, Yuxia;
- Liu, Xingyun;
- Zeng, Jiaoyan;
- Yan, Jinwei;
- Shi, Daqing;
- Liu, Hongri
- Article
2
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4646, doi. 10.1007/s11664-015-3932-0
- Fu, Weixin;
- Nimura, Masatsugu;
- Kasahara, Takashi;
- Mimatsu, Hayata;
- Okada, Akiko;
- Shoji, Shuichi;
- Ishizuka, Shugo;
- Mizuno, Jun
- Article
3
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4373, doi. 10.1007/s11664-015-3933-z
- Lee, Seong;
- Shim, Hyun;
- Shim, In-Bo
- Article
4
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4243, doi. 10.1007/s11664-015-3934-y
- Lu, Xuepeng;
- Zheng, Yong;
- Huang, Qi;
- Xiong, Weihao
- Article
5
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4525, doi. 10.1007/s11664-015-3923-1
- Zulkarnain, M.;
- Husaini, Muhammad;
- Mariatti, M.;
- Azid, I.
- Article
6
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4516, doi. 10.1007/s11664-015-3930-2
- Hu, Fengtian;
- Yang, Shan;
- Wang, Haozhe;
- Hu, Anmin;
- Li, Ming
- Article
7
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4549, doi. 10.1007/s11664-015-3931-1
- Menon, Sandeep;
- Osterman, Michael;
- Pecht, Michael
- Article
8
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4316, doi. 10.1007/s11664-015-3927-x
- Li, Enzhu;
- Zhang, Peng;
- Mi, Yuean;
- Wang, Jing;
- Yuan, Ying;
- Zhou, Xiaohua
- Article
9
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4236, doi. 10.1007/s11664-015-3928-9
- Fang, Zixuan;
- Tang, Bin;
- Li, Yingxiang;
- Si, Feng;
- Zhang, Shuren
- Article
10
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4533, doi. 10.1007/s11664-015-3929-8
- Rautiainen, Antti;
- Xu, Hongbo;
- Österlund, Elmeri;
- Li, Jue;
- Vuorinen, Vesa;
- Paulasto-Kröckel, Mervi
- Article
11
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4175, doi. 10.1007/s11664-015-3935-x
- Bae, Seonho;
- Kim, Dae-Sik;
- Jung, Seojoo;
- Jeong, Woo;
- Lee, Jee;
- Cho, Seunghee;
- Park, Junsung;
- Byun, Dongjin
- Article
12
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4557, doi. 10.1007/s11664-015-3936-9
- Zhang, Rui;
- Huo, Zhenxuan;
- Jiao, Xiangquan;
- Zhong, Hui;
- Shi, Yu
- Article
13
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4191, doi. 10.1007/s11664-015-3937-8
- Article
14
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4275, doi. 10.1007/s11664-015-3939-6
- Panda, Niranjan;
- Parida, B.;
- Padhee, R.;
- Choudhary, R.
- Article
15
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4098, doi. 10.1007/s11664-015-3940-0
- Deo, Soumya;
- Singh, Ajaya;
- Deshmukh, Lata;
- Abu Bin Hasan Susan, Md.
- Article
16
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4283, doi. 10.1007/s11664-015-3942-y
- Garduño-Wilches, Ismael;
- Rodríguez-Fernández, Luis;
- Alonso, Juan
- Article
17
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4144, doi. 10.1007/s11664-015-3943-x
- Chowdhury, Subhra;
- Borisov, Boris;
- Chow, Peter;
- Biswas, Dhrubes
- Article
18
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4290, doi. 10.1007/s11664-015-3944-9
- Satpathy, S.;
- Mohanty, N.;
- Behera, A.;
- Sen, S.;
- Behera, Banarji;
- Nayak, P.
- Article
19
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4563, doi. 10.1007/s11664-015-3945-8
- Sahoo, Benudhar;
- Panda, Prasanta
- Article
20
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4250, doi. 10.1007/s11664-015-3946-7
- Li, Wen-Bo;
- Xi, Hai-Hong;
- Zhou, Di
- Article
21
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4080, doi. 10.1007/s11664-015-3947-6
- Fan, Jincheng;
- Li, Tengfei;
- Djerdj, Igor
- Article
22
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4182, doi. 10.1007/s11664-015-3948-5
- Li, Yang;
- Deng, Wu-Zhu;
- Wang, Dong-Zhao;
- Chen, Yang-Yang;
- Zhou, Wen-Li
- Article
23
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4167, doi. 10.1007/s11664-015-3949-4
- Sharma, Y.;
- Li, F.;
- Jennings, M.;
- Fisher, C.;
- Pérez-Tomás, A.;
- Thomas, S.;
- Hamilton, D.;
- Russell, S.;
- Mawby, P.
- Article
24
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4567, doi. 10.1007/s11664-015-3950-y
- Wang, Chao-hong;
- Kuo, Chun-yi;
- Yang, Nian-cih
- Article
25
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4269, doi. 10.1007/s11664-015-3951-x
- Chen, Junfeng;
- Huang, Xiutao;
- Zerihun, Gebru;
- Hu, Zhaoyang;
- Wang, Shengming;
- Wang, Guodong;
- Hu, Xiwei;
- Liu, Minghai
- Article
26
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4213, doi. 10.1007/s11664-015-3953-8
- Bouguila, N.;
- Kraini, M.;
- Najeh, I.;
- Halidou, I.;
- Lacaze, E.;
- Bouchriha, H.;
- Bouzouita, H.;
- Alaya, S.
- Article
27
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4343, doi. 10.1007/s11664-015-3954-7
- Yi, Jinqiao;
- Xiong, Xue;
- Liu, Sisi;
- Jiang, Shenglin
- Article
28
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4065, doi. 10.1007/s11664-015-3956-5
- Domask, A.;
- Gurunathan, R.;
- Mohney, S.
- Article
29
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4400, doi. 10.1007/s11664-015-3957-4
- Mokurala, Krishnaiah;
- Kamble, Anvita;
- Bhargava, Parag;
- Mallick, Sudhanshu
- Article
30
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4220, doi. 10.1007/s11664-015-3958-3
- Campos, R.V.B.;
- Bezerra, C.L.;
- Oliveira, L.N.L.;
- Gouveia, D.X.;
- Silva, M.A.S.;
- Sombra, A.S.B.
- Article
31
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4349, doi. 10.1007/s11664-015-3959-2
- Panda, Prasanta;
- Sahoo, Benudhar;
- Chandraiah, M.;
- Raghavan, Sreekumari;
- Manoj, Bindu;
- Ramakrishna, J.;
- Kiran, P.
- Article
32
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4444, doi. 10.1007/s11664-015-3960-9
- Liang, Ying;
- Schnelle, Walter;
- Veremchuk, Igor;
- Böhme, Bodo;
- Baitinger, Michael;
- Grin, Yuri
- Article
33
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4154, doi. 10.1007/s11664-015-3961-8
- Zhu, Jiandong;
- An, Rong;
- Wang, Chunqing;
- Zhang, Wei;
- Wen, Guangwu
- Article
34
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4354, doi. 10.1007/s11664-015-3962-7
- Kumar, Ashwini;
- Varshney, Dinesh
- Article
35
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4405, doi. 10.1007/s11664-015-3963-6
- Ding, Kangkang;
- Xiao, Kui;
- Dong, Chaofang;
- Zou, Shiwen;
- Yi, Pan;
- Li, Xiaogang
- Article
36
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4418, doi. 10.1007/s11664-015-3969-0
- Article
38
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4392, doi. 10.1007/s11664-015-3971-6
- Reghima, Meriem;
- Akkari, Anis;
- Guasch, Cathy;
- Kamoun-Turki, Najoua
- Article
39
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4452, doi. 10.1007/s11664-015-3972-5
- Balout, H.;
- Boulet, P.;
- Record, M.-C.
- Article
40
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4227, doi. 10.1007/s11664-015-3974-3
- Allehyani, S.;
- Seoudi, R.;
- Said, D.;
- Lashin, A.;
- Abouelsayed, A.
- Article
41
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4187, doi. 10.1007/s11664-015-3975-2
- Grzesik, Michael;
- Bailey, Robert;
- Mahan, Joe;
- Ampe, Jim
- Article
42
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4465, doi. 10.1007/s11664-015-3977-0
- Sarhadi, Ali;
- Bjørk, Rasmus;
- Pryds, Nini
- Article
43
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4367, doi. 10.1007/s11664-015-3978-z
- Liu, Weihu;
- Yan, Shuoqing;
- Cheng, Yongzhi;
- Li, Qifan;
- Feng, Zekun;
- Wang, Xian;
- Gong, Rongzhou;
- Nie, Yan
- Article
44
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4058, doi. 10.1007/s11664-015-3979-y
- Chen, Zhiwen;
- Liu, Changqing;
- Wu, Yiping;
- An, Bing;
- Zhou, Longzao
- Article
45
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4434, doi. 10.1007/s11664-015-3981-4
- Dreger, Henning;
- Bockholt, Henrike;
- Haselrieder, Wolfgang;
- Kwade, Arno
- Article
46
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4576, doi. 10.1007/s11664-015-3982-3
- Lis, Adrian;
- Leinenbach, Christian
- Article
47
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4473, doi. 10.1007/s11664-015-3985-0
- Sim, Minseob;
- Park, Hyunbin;
- Kim, Shiho
- Article
48
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4589, doi. 10.1007/s11664-015-3987-y
- Kiziroglou, M.;
- Yeatman, E.
- Article
49
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4161, doi. 10.1007/s11664-015-3989-9
- Broeck, D.M.;
- Bharrat, D.;
- Liu, Z.;
- El-Masry, N.A.;
- Bedair, S.M.
- Article
50
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4379, doi. 10.1007/s11664-015-3990-3
- Article