Works matching IS 03615235 AND DT 2015 AND VI 44 AND IP 10
1
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3696, doi. 10.1007/s11664-015-3730-8
- Wu, Xiaochun;
- Xiao, Ping;
- Guo, Yongquan;
- Zheng, Qiaoji;
- Lin, Dunmin
- Article
2
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3581, doi. 10.1007/s11664-015-3766-9
- Augustine, Anju;
- Girijavallabhan, C.;
- Nampoori, V.;
- Kailasnath, M.
- Article
3
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3556, doi. 10.1007/s11664-015-3775-8
- Ruan, Limin;
- Luo, Jun;
- Zhu, Hangtian;
- Zhao, Huaizhou;
- Liang, Jingkui
- Article
4
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3733, doi. 10.1007/s11664-015-3776-7
- Özdemir, B.;
- Yarar, Z.;
- Özdemir, M.D.;
- Atasever, Ö.S.;
- Özdemir, M.
- Article
5
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 4012, doi. 10.1007/s11664-015-3779-4
- Vianco, P.;
- Neilsen, M.;
- Rejent, J.;
- Grant, R.
- Article
6
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3942, doi. 10.1007/s11664-015-3780-y
- Hsu, Hsueh;
- Chen, Hao;
- Ouyang, Yao;
- Chiu, Tz;
- Chang, Tao;
- Lee, Hsin;
- Ku, Chin;
- Wu, Albert
- Article
7
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3334, doi. 10.1007/s11664-015-3782-9
- Wang, Zhichong;
- Zhang, Xiangpeng;
- Wu, Yigui;
- Hu, Zhiyu
- Article
8
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3904, doi. 10.1007/s11664-015-3788-3
- Wu, Changjun;
- Su, Xuping;
- Peng, Haoping;
- Liu, Ya;
- Tu, Hao;
- Wang, Jianhua
- Article
9
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3677, doi. 10.1007/s11664-015-3790-9
- Murphy, Neil;
- Sun, Lirong;
- Grant, John;
- Jones, John;
- Jakubiak, Rachel
- Article
10
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3948, doi. 10.1007/s11664-015-3791-8
- Milhet, X.;
- Gadaud, P.;
- Caccuri, V.;
- Bertheau, D.;
- Mellier, D.;
- Gerland, M.
- Article
11
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3855, doi. 10.1007/s11664-015-3794-5
- Chang, Jing-Yao;
- Chaung, Tung-Han;
- Chang, Tao-Chih
- Article
12
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3843, doi. 10.1007/s11664-015-3795-4
- Fan, Qiaolan;
- Zeng, Weidong;
- Zhou, Changrong;
- Cen, Zhenyong;
- Yuan, Changlai;
- Xiao, Jianrong;
- Ma, Jiafeng
- Article
13
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3481, doi. 10.1007/s11664-015-3797-2
- Williams, Adrienne;
- Ouchen, Fahima;
- Kim, Steve;
- Ngo, Yen;
- Elhamri, Said;
- Siwecki, Arthur;
- Mou, Shin;
- Campo, Eva;
- Kozlowski, Gregory;
- Naik, Rajesh;
- Grote, James
- Article
14
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3512, doi. 10.1007/s11664-015-3799-0
- Nasirpouri, Farzad;
- Pourmahmoudi, Hassan;
- Abbasi, Farhang;
- Littlejohn, Samuel;
- Chauhan, Ashok;
- Nogaret, Alain
- Article
15
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3819, doi. 10.1007/s11664-015-3801-x
- Sharma, Himani;
- Jain, Shubham;
- Raj, Pulugurtha;
- Murali, K.;
- Tummala, Rao
- Article
16
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3215, doi. 10.1007/s11664-015-3802-9
- Kumar, Jagdish;
- Kapoor, Pooja;
- Ahluwalia, P.
- Article
17
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3341, doi. 10.1007/s11664-015-3803-8
- Lalhriatzuala;
- Agarwal, Pratima
- Article
18
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3550, doi. 10.1007/s11664-015-3804-7
- Zhang, Yaqian;
- Zhang, Haoran;
- Zhang, Yanhui;
- Chen, Zhiying;
- Tang, Chunmiao;
- Sui, Yanping;
- Wang, Bin;
- Li, Xiaoliang;
- Xie, Xiaoming;
- Yu, Guanghui;
- Jin, Zhi;
- Liu, Xinyu
- Article
19
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3477, doi. 10.1007/s11664-015-3809-2
- Cruz-Vázquez, C.;
- Bernal, R.;
- Burruel-Ibarra, S.E.;
- Cota-Valenzuela, E.;
- Brown, F.;
- Grijalva-Monteverde, H.;
- Castaño, V.M.
- Article
20
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3523, doi. 10.1007/s11664-015-3810-9
- Guo, Mingxing;
- Wang, Fei;
- Huang, Guojie;
- Bi, Wenlu;
- Zhang, Yan;
- Wang, Mingpu
- Article
21
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3967, doi. 10.1007/s11664-015-3811-8
- Kim, Jun;
- Na, Jin-Young;
- Kim, Sun-Kyung;
- Yoo, Young-Zo;
- Seong, Tae-Yeon
- Article
22
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3545, doi. 10.1007/s11664-015-3814-5
- Chen, Y.B.;
- Cao, X.L.;
- Ma, R.X.;
- Gao, F.;
- Hu, X.;
- Song, H.Z.
- Article
23
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3327, doi. 10.1007/s11664-015-3816-3
- Han, Jun-feng;
- Krishnakumar, V.;
- Schimper, H.-J.;
- Cha, Li-mei;
- Liao, Cheng
- Article
24
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3957, doi. 10.1007/s11664-015-3817-2
- Jang, J.;
- Yoo, S.;
- Hwang, H.;
- Yuk, S.;
- Kim, C.;
- Kim, S.;
- Han, J.;
- An, S.
- Article
25
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3534, doi. 10.1007/s11664-015-3818-1
- Lee, Wook-Hyun;
- Hwang, Hyun-Chang;
- Lee, Ji-Su;
- Kim, Pan-Jo;
- Lim, Sang-Hyuk;
- Rhi, Seok-Ho;
- Lee, Kye-Bock;
- Lee, Ki-Woo
- Article
26
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3761, doi. 10.1007/s11664-015-3819-0
- Vinodh Kumar, S.;
- Seenithurai, S.;
- Manivel Raja, M.;
- Mahendran, M.
- Article
27
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3801, doi. 10.1007/s11664-015-3820-7
- Sakhya, Anup;
- Dutta, Alo;
- Sinha, T.P.
- Article
28
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3788, doi. 10.1007/s11664-015-3836-z
- Yan, Yi;
- Ngo, Khai;
- Hou, Dongbin;
- Mu, Mingkai;
- Mei, Yunhui;
- Lu, Guo-Quan
- Article
29
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3272, doi. 10.1007/s11664-015-3832-3
- Wang, W.;
- Selvaraj, S.;
- Win, K.;
- Dolmanan, S.;
- Bhat, T.;
- Yakovlev, N.;
- Tripathy, S.;
- Lo, G.
- Article
30
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3458, doi. 10.1007/s11664-015-3833-2
- Article
31
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3388, doi. 10.1007/s11664-015-3834-1
- Punetha, Mayank;
- Singh, Yashvir
- Article
32
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3229, doi. 10.1007/s11664-015-3835-0
- Guo, Rongrong;
- Jie, Wanqi;
- Xu, Yadong;
- Zha, Gangqiang;
- Wang, Tao;
- Lin, Yun;
- Zhang, Mengmeng;
- Du, Zhuotong
- Article
33
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 4006, doi. 10.1007/s11664-015-3826-1
- Tavgeniene, D.;
- Liu, L.;
- Krucaite, G.;
- Volyniuk, D.;
- Grazulevicius, J.;
- Xie, Z.;
- Zhang, B.;
- Grigalevicius, S.
- Article
34
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3783, doi. 10.1007/s11664-015-3837-y
- Huang, Xian-Xiong;
- Tang, Xin-Gui;
- Lai, Ju-Lan;
- Jiang, Yan-Ping;
- Liu, Qiu-Xiang;
- Xiong, De-Ping
- Article
35
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3367, doi. 10.1007/s11664-015-3838-x
- Seoudi, R.;
- Allehyani, S.H.A.;
- Said, D.A.;
- Lashin, A.R.;
- Abouelsayed, A.
- Article
36
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3744, doi. 10.1007/s11664-015-3840-3
- Yang, Hanmin;
- Yu, Gaige;
- Liu, Haowen
- Article
37
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 4035, doi. 10.1007/s11664-015-3841-2
- Choi, Seung-Kyum;
- Gorguluarslan, Recep;
- Park, Sang-In;
- Stone, Thomas;
- Moon, Jack;
- Rosen, David
- Article
38
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3973, doi. 10.1007/s11664-015-3842-1
- Fu, Shancan;
- Mei, Yunhui;
- Li, Xin;
- Ning, Puqi;
- Lu, Guo-Quan
- Article
39
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3811, doi. 10.1007/s11664-015-3843-0
- Rout, Jyoshna;
- Choudhary, R.;
- Shannigrahi, S.;
- Sharma, H.
- Article
40
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3752, doi. 10.1007/s11664-015-3844-z
- Xing, Wenyu;
- Ma, Yinina;
- Chen, Jieyu;
- Zhao, Shifeng
- Article
41
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3586, doi. 10.1007/s11664-015-3845-y
- Article
42
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3768, doi. 10.1007/s11664-015-3846-x
- Hilal, A.;
- Raulet, M.;
- Martin, C.;
- Sixdenier, F.
- Article
43
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3777, doi. 10.1007/s11664-015-3847-9
- Li, Qifan;
- Feng, Zekun;
- Yan, Shuoqing;
- Nie, Yan;
- Wang, Xian
- Article
44
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3710, doi. 10.1007/s11664-015-3848-8
- Bhardwaj, Sumit;
- Paul, Joginder;
- Chand, Subhash;
- Raina, K.K.;
- Kumar, Ravi
- Article
45
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3380, doi. 10.1007/s11664-015-3849-7
- Mkawi, E.M.;
- Ibrahim, K.;
- Ali, M.K.M.;
- Farrukh, M.A.;
- Mohamed, A.S.
- Article
46
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3795, doi. 10.1007/s11664-015-3850-1
- Tian, Xiao;
- Yang, Xin;
- Wang, Peng
- Article
47
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3277, doi. 10.1007/s11664-015-3853-y
- Burgess, Lindsay;
- Kumar, Francis;
- Mackenzie, Jason
- Article
48
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3603, doi. 10.1007/s11664-015-3854-x
- Nhi Truong, D.;
- Berthebaud, David;
- Gascoin, Franck;
- Kleinke, Holger
- Article
49
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3243, doi. 10.1007/s11664-015-3855-9
- Benzarti, Z.;
- Khelifi, M.;
- Halidou, I.;
- El Jani, B.
- Article
50
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3927, doi. 10.1007/s11664-015-3856-8
- Article