Works matching IS 03615235 AND DT 2015 AND VI 44 AND IP 1
1
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 391, doi. 10.1007/s11664-014-3189-z
- Sasaki, Keiichi;
- Horikawa, Daisuke;
- Goto, Koichi
- Article
2
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 341, doi. 10.1007/s11664-014-3194-2
- Lubieniecki, Michał;
- Uhl, Tadeusz
- Article
3
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 356, doi. 10.1007/s11664-014-3204-4
- Takeuchi, Tsunehiro;
- Nakayama, Ryu-suke
- Article
4
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 362, doi. 10.1007/s11664-014-3206-2
- Lukowicz, M.;
- Schmiel, T.;
- Rosenfeld, M.;
- Heisig, J.;
- Tajmar, M.
- Article
5
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 371, doi. 10.1007/s11664-014-3207-1
- Frabboni, S.;
- Suriano, F.;
- Ferri, M.;
- Moscatelli, F.;
- Mancarella, F.;
- Belsito, L.;
- Solmi, S.;
- Roncaglia, A.;
- Gazzadi, G.C.;
- Narducci, D.
- Article
6
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 377, doi. 10.1007/s11664-014-3297-9
- Codecasa, Matteo;
- Fanciulli, Carlo;
- Passaretti, Francesca;
- Gaddi, Roberto;
- Gomez-Paz, Francisco
- Article
7
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 384, doi. 10.1007/s11664-014-3312-1
- Toshima, Naoki;
- Ichikawa, Shoko
- Article
8
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 348, doi. 10.1007/s11664-014-3314-z
- Suzuki, Ryosuke;
- Fujisaka, Takeyuki;
- Sui, Hong-Tao;
- Ito, Keita;
- Meng, Xiangning
- Article
9
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 467, doi. 10.1007/s11664-014-3343-7
- Qu, Lin;
- Zhao, Ning;
- Ma, Haitao;
- Zhao, Huijing;
- Huang, Mingliang
- Article
10
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 475, doi. 10.1007/s11664-014-3349-1
- Kwon, Young;
- Kim, Jong;
- Song, Young
- Article
11
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 482, doi. 10.1007/s11664-014-3357-1
- Lang, Fengqun;
- Yamaguchi, Hiroshi;
- Nakagawa, Hiroshi;
- Sato, Hiroshi
- Article
12
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 22, doi. 10.1007/s11664-014-3365-1
- Song, Jiahui;
- Zhang, Xinguo;
- Zhou, Chunyan;
- Lan, Yuwei;
- Pang, Qi;
- Zhou, Liya
- Article
13
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 222, doi. 10.1007/s11664-014-3372-2
- Wessels, B.W.;
- Liu, Z.;
- Peters, J.A.;
- Li, H.;
- Kanatzidis, M.;
- Im, J.;
- Jin, H.;
- Freeman, A.J.
- Article
14
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 435, doi. 10.1007/s11664-014-3373-1
- Lee, Jong-Bum;
- Hwang, How-Yuan;
- Rhee, Min-Woo
- Article
15
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 227, doi. 10.1007/s11664-014-3389-6
- Tang, Linjiang;
- Wang, Wei;
- Shen, Bo;
- Zhai, Jiwei;
- Kong, Ling
- Article
16
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 235, doi. 10.1007/s11664-014-3390-0
- Zhou, Jiao;
- Ji, Hongkai;
- Lan, Tian;
- Zhou, Wenli;
- Miao, Xiangshui;
- Yan, Junbing
- Article
17
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 50, doi. 10.1007/s11664-014-3391-z
- Wang, Mao-Hua;
- Ma, Xiao-Yu;
- Jiang, Wen
- Article
18
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 442, doi. 10.1007/s11664-014-3396-7
- Ashworth, M.;
- Haspel, D.;
- Wu, L.;
- Wilcox, G.;
- Mortimer, R.
- Article
19
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 457, doi. 10.1007/s11664-014-3399-4
- Biyik, Serkan;
- Arslan, Fazli;
- Aydin, Murat
- Article
20
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 1, doi. 10.1007/s11664-014-3403-z
- Dar, M.A.;
- Nam, S.H.;
- Kim, J.Y.;
- Cho, B.K.;
- Kim, W.B.;
- Ahmad, I.
- Article
21
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 87, doi. 10.1007/s11664-014-3404-y
- Alrebati, A.M.;
- Afifi, M.A.;
- Hegab, N.A.;
- Shakra, A.M.;
- Farid, A.S.
- Article
22
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 110, doi. 10.1007/s11664-014-3405-x
- Jabbar, Abdul;
- Qasim, Irfan;
- Waqee-ur-Rehman, M.;
- Zaman, Munawar;
- Nadeem, K.;
- Mumtaz, M.
- Article
23
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 210, doi. 10.1007/s11664-014-3406-9
- Kuo, Dong-Hau;
- Li, Cheng-Che;
- Tuan, Thi;
- Yen, Wei-Chun
- Article
24
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 129, doi. 10.1007/s11664-014-3407-8
- Martins, P.;
- Correia, V.;
- Rocha, J.;
- Lanceros-Mendez, S.
- Article
25
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 399, doi. 10.1007/s11664-014-3409-6
- Matsumoto, Rika;
- Okabe, Yusuke;
- Akuzawa, Noboru
- Article
26
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 258, doi. 10.1007/s11664-014-3413-x
- Article
27
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 121, doi. 10.1007/s11664-014-3414-9
- Singh, Vijay;
- Kim, S.;
- Sivaramaiah, G.;
- Rao, J.;
- Dhoble, S.
- Article
28
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 79, doi. 10.1007/s11664-014-3415-8
- Zhang, Haoran;
- Zhang, Yanhui;
- Chen, Zhiying;
- Sui, Yanping;
- Zhang, Yaqian;
- Tang, Chunmiao;
- Zhu, Bo;
- Xie, Xiaoming;
- Yu, Guanghui;
- Wang, Bin;
- Jin, Zhi;
- Liu, Xinyu
- Article
29
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 407, doi. 10.1007/s11664-014-3419-4
- Liu, Ji-Wei;
- Song, Minghui;
- Takeguchi, Masaki;
- Tsujii, Naohito;
- Isoda, Yukihiro
- Article
30
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 96, doi. 10.1007/s11664-014-3421-x
- Chen, Yen-Jen;
- Tong, Chong;
- Yun, Juhyung;
- Anderson, Wayne
- Article
31
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 263, doi. 10.1007/s11664-014-3422-9
- Yuan, Changlai;
- Chen, Guohua;
- Yang, Tao;
- Zhou, Changrong;
- Yang, Yun;
- Liu, Fei
- Article
32
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 167, doi. 10.1007/s11664-014-3424-7
- Ghosh, Adit;
- Varadachari, Chandrika
- Article
33
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 271, doi. 10.1007/s11664-014-3426-5
- Acharya, Truptimayee;
- Choudhary, R.
- Article
34
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 490, doi. 10.1007/s11664-014-3427-4
- Ramos-Hernandez, J.;
- Kabir, D.;
- Mejia, I.;
- Perez, M.;
- Quevedo-Lopez, M.
- Article
35
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 62, doi. 10.1007/s11664-014-3429-2
- Gupta, S.;
- Meveren, M.;
- Jasinski, J.
- Article
36
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 281, doi. 10.1007/s11664-014-3433-6
- Li, Ying-xiang;
- Qin, Zhen-jun;
- Tang, Bin;
- Zhang, Shu-ren;
- Chang, Geng;
- Li, Hao;
- Chen, He-tuo;
- Yang, Han;
- Li, Jun-shan
- Article
37
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 497, doi. 10.1007/s11664-014-3434-5
- Glowacki, Bartlomiej;
- Nash, Cian;
- Amarandei, George;
- Spiesschaert, Yann;
- Driessche, Isabel;
- Stoeva, Zlatka;
- Tonchev, Dan;
- Tomov, Rumen
- Article
38
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 244, doi. 10.1007/s11664-014-3437-2
- Zhang, Linsen;
- Jin, Kai;
- Li, Suzhen;
- Wang, Lizhen;
- Zhang, Yong;
- Li, Xiaofeng
- Article
39
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 13, doi. 10.1007/s11664-014-3443-4
- Wong, Chin-Hong;
- Dahari, Zuraini;
- Abd Manaf, Asrulnizam;
- Miskam, Muhammad
- Article
40
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 136, doi. 10.1007/s11664-014-3444-3
- Sel, Kivanc;
- Sahiner, Nurettin;
- Demirci, Sahin;
- Meydan, Engin;
- Yildiz, Sema;
- Ozturk, Omer;
- Al-Lohedan, Hamad
- Article
41
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 511, doi. 10.1007/s11664-014-3448-z
- Yang, Teng-Kai;
- Lin, Chih-Fan;
- Chen, Chih-Ming
- Article
42
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 414, doi. 10.1007/s11664-014-3450-5
- Qin, Yalin;
- Zhu, Yuanhu;
- Wang, Chunlei;
- Su, Wenbin;
- Liu, Jian;
- Li, Jichao;
- Du, Yanling;
- Zhang, Xinhua;
- Mei, Liangmo
- Article
43
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 597, doi. 10.1007/s11664-013-2972-6
- Zuo, Yong;
- Ma, Limin;
- Liu, Sihan;
- Shu, Yutian;
- Guo, Fu
- Article
44
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 518, doi. 10.1007/s11664-014-3452-3
- Xu, Lingyan;
- Jie, Wanqi;
- Zhou, Boru;
- Fu, Xu;
- Zha, Gangqiang;
- Wang, Tao;
- Xu, Yadong;
- Feng, Tao;
- Chen, Xi
- Article
45
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 524, doi. 10.1007/s11664-014-3453-2
- Bououdina, M.;
- Praveena, K.;
- Penchal Reddy, M.;
- Srinath, S.;
- Sandhya, R.;
- Katlakunta, Sadhana
- Article
46
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 202, doi. 10.1007/s11664-014-3454-1
- Ma, Quan-Bao;
- Lieten, Ruben;
- Borghs, Gustaaf;
- Degroote, Stefan;
- Germain, Marianne
- Article
47
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 6, doi. 10.1007/s11664-014-3455-0
- Mandal, Soumen;
- Arun, Ravi;
- Nagahanumaiah;
- Chanda, Nripen;
- Das, Surajit;
- Agarwal, Pankaj;
- Akhtar, Jamil;
- Mishra, Prabhash
- Article
48
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 177, doi. 10.1007/s11664-014-3457-y
- Chen, R.S.;
- Tsai, H.Y.;
- Chan, C.H.;
- Huang, Y.S.;
- Chen, Y.T.;
- Chen, K.H.;
- Chen, L.C.
- Article
49
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 532, doi. 10.1007/s11664-014-3460-3
- Shen, Jun;
- Pu, Yayun;
- Yin, Henggang;
- Tang, Qin
- Article
50
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 144, doi. 10.1007/s11664-014-3461-2
- Article