Works matching IS 03615235 AND DT 2014 AND VI 43 AND IP 9
1
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3493, doi. 10.1007/s11664-014-3174-6
- Wang, Shuyun;
- Zhang, Hui;
- Yao, Yuan
- Article
2
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3499, doi. 10.1007/s11664-014-3177-3
- Rajagopal Reddy, V.;
- Manjunath, V.;
- Janardhanam, V.;
- Kil, Yeon-Ho;
- Choi, Chel-Jong
- Article
3
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3169, doi. 10.1007/s11664-014-3181-7
- Haneef, Muhammad;
- Arif, Suneela;
- Akbar, Jehan;
- Abdul-Malik, Attiya
- Article
4
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3290, doi. 10.1007/s11664-014-3182-6
- Su, Chien-Hao;
- Chen, Hao;
- Lee, Hsin-Yi;
- Liu, Cheng;
- Ku, Ching-Shun;
- Wu, Albert
- Article
5
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3229, doi. 10.1007/s11664-014-3183-5
- Hazra, A.;
- Dutta, K.;
- Bhowmik, B.;
- Manjuladevi, V.;
- Gupta, R.;
- Chattopadhyay, P.;
- Bhattacharyya, P.
- Article
6
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3508, doi. 10.1007/s11664-014-3184-4
- Li, Lin;
- Feng, Chuanqi;
- Zheng, Hao;
- He, Peixin;
- Wang, Jiazhao
- Article
7
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3514, doi. 10.1007/s11664-014-3186-2
- Rajammal, R.;
- Anbarasu, V.;
- Savarimuthu, E.;
- Arumugam, S.
- Article
8
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3077, doi. 10.1007/s11664-014-3187-1
- Chang, Shang-Chou;
- Hsiao, Yu-Jen;
- Li, To-Sing
- Article
9
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3522, doi. 10.1007/s11664-014-3190-6
- Tudorache, Florin;
- Petrila, Iulian
- Article
10
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3296, doi. 10.1007/s11664-014-3191-5
- Kim, Yang;
- Ma, Sung;
- Kim, Young-Ho
- Article
11
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3527, doi. 10.1007/s11664-014-3198-y
- Mekap, Anita;
- Das, Piyush;
- Choudhary, R.
- Article
12
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3307, doi. 10.1007/s11664-014-3203-5
- Nam, N.;
- Bui, Q.;
- Nhan, H.;
- Phuong, D.;
- Bian, M.
- Article
13
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3236, doi. 10.1007/s11664-014-3209-z
- Article
14
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3317, doi. 10.1007/s11664-014-3210-6
- Lee, Jong-Bum;
- Aw, Jie-Li;
- Rhee, Min-Woo
- Article
15
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3177, doi. 10.1007/s11664-014-3211-5
- Seo, T.;
- Kim, Hyun-Suk;
- Lee, Kwang-Ho;
- Chung, Kwun-Bum;
- Park, Jin-Seong
- Article
16
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3534, doi. 10.1007/s11664-014-3215-1
- Sun, Xiaoyu;
- Sun, Xiaodan;
- Li, Xingang;
- He, Jian;
- Wang, Binsheng
- Article
17
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3539, doi. 10.1007/s11664-014-3216-0
- Behera, C.;
- Das, Piyush;
- Choudhary, R.
- Article
18
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3550, doi. 10.1007/s11664-014-3219-x
- Khan, Hidayat;
- Iqbal, Yaseen
- Article
19
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3162, doi. 10.1007/s11664-014-3220-4
- Shi, Wenyu;
- Wu, Fang;
- Wang, Kunlun;
- Yang, Jingjing;
- Song, Hongzhang;
- Hu, Xing
- Article
20
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3082, doi. 10.1007/s11664-014-3221-3
- Kim, Ki-Hong;
- Yun, Dong-Jin;
- Kyoung, Yong-Koo;
- Yu, Da-Eun;
- Choi, Sang-Jun
- Article
21
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3559, doi. 10.1007/s11664-014-3222-2
- Sanad, M.;
- Rashad, M.;
- Abdel-Aal, E.;
- El-Shahat, M.;
- Powers, K.
- Article
22
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3333, doi. 10.1007/s11664-014-3232-0
- Lin, Hsin-fu;
- Chang, Ya-chun;
- Chen, Chih-chi
- Article
23
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3567, doi. 10.1007/s11664-014-3227-x
- Tsubota, Toshiki;
- Kobayashi, Shogo;
- Murakami, Naoya;
- Ohno, Teruhisa
- Article
24
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3574, doi. 10.1007/s11664-014-3228-9
- An, Guk-Hwan;
- Hwang, Tae-Yeon;
- Choa, Yong-Ho;
- Shin, Kyoosik
- Article
25
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3155, doi. 10.1007/s11664-014-3229-8
- Deepa, K.;
- Dhanya, A.;
- Remadevi, T.
- Article
26
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3283, doi. 10.1007/s11664-014-3230-2
- Dhall, Shivani;
- Vaidya, Gayatri;
- Jaggi, Neena
- Article
27
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3324, doi. 10.1007/s11664-014-3223-1
- Chen, Yue-ting;
- Fang, Gu;
- Chen, Chih-chi
- Article
28
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3582, doi. 10.1007/s11664-014-3234-y
- Yao, Lichun;
- Yang, Jian;
- Qiu, Tai
- Article
29
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3341, doi. 10.1007/s11664-014-3236-9
- Liu, Ziyu;
- Cai, Jian;
- Wang, Qian;
- He, Xi;
- Chen, Yu
- Article
30
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3087, doi. 10.1007/s11664-014-3237-8
- Wu, Menglei;
- Xiao, Yukun;
- Fu, Zhengping;
- Li, Zhixiang;
- Xu, Jingtao;
- Jiang, Jun;
- Jiang, Haochuan;
- Xu, Gaojie
- Article
31
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3351, doi. 10.1007/s11664-014-3238-7
- Lin, Qijing;
- Yang, Shuming;
- Jing, Weixuan;
- Li, Changsheng;
- Wang, Chenying;
- Jiang, Zhuangde;
- Jiang, Kely
- Article
32
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3184, doi. 10.1007/s11664-014-3239-6
- Lin, Y.;
- Wang, D.;
- Donetsky, D.;
- Belenky, G.;
- Hier, H.;
- Sarney, W.;
- Svensson, S.
- Article
33
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3588, doi. 10.1007/s11664-014-3240-0
- Article
34
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3357, doi. 10.1007/s11664-014-3241-z
- Santra, Sangeeta;
- Islam, Sarfaraj;
- Ravi, Raju;
- Vuorinen, Vesa;
- Laurila, Tomi;
- Paul, Aloke
- Article
35
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3593, doi. 10.1007/s11664-014-3242-y
- Yang, Su-Hua;
- Yang, Chih-Ka;
- Yan, Jia-Hung;
- Lin, Che-Min
- Article
36
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3243, doi. 10.1007/s11664-014-3243-x
- Patil, Hemlata;
- Gupta, Akhil;
- Bilic, Ante;
- Jackson, Sam;
- Latham, Kay;
- Bhosale, Sheshanath
- Article
37
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3191, doi. 10.1007/s11664-014-3244-9
- Choi, Jaewoo;
- Balaji, Nagarajan;
- Dao, Vinh;
- Park, Cheolmin;
- Lee, Seunghwan;
- Kim, Jungmo;
- Ju, Minkyu;
- Lee, Hoongjoo;
- Lee, Youn-Jung;
- Yi, Junsin
- Article
38
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3372, doi. 10.1007/s11664-014-3245-8
- Shin, Yong;
- Kim, Hyun-Jin;
- Jang, Seok;
- Lee, Jong-Hyun
- Article
39
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3601, doi. 10.1007/s11664-014-3246-7
- Fang, Sheng-Yu;
- Teoh, Lay;
- Huang, Rong-Hsin;
- Chao, Wen-Kai;
- Lin, Tien-Jen;
- Yang, Kai-Chun;
- Hsueh, Kan-Lin;
- Shieu, Fuh-Sheng
- Article
40
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3196, doi. 10.1007/s11664-014-3247-6
- Bharathan, Jayesh;
- Zhou, Honghui;
- Narayan, Jagdish;
- Rozgonyi, George;
- Bulman, Gary
- Article
41
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3217, doi. 10.1007/s11664-014-3256-5
- Singh, Budhi;
- Ghosh, Subhasis
- Article
42
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3611, doi. 10.1007/s11664-014-3250-y
- Kruk, A.;
- Mrózek, M.;
- Domagała, J.;
- Brylewski, T.;
- Gawlik, W.
- Article
43
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3618, doi. 10.1007/s11664-014-3251-x
- Mahmoudi, M.;
- Kavanlouei, M.;
- Maleki-Ghaleh, H.
- Article
44
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3211, doi. 10.1007/s11664-014-3253-8
- Dhivya Ponnusamy;
- Sridharan Madanagurusamy
- Article
45
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3255, doi. 10.1007/s11664-014-3255-6
- Zhu, Chunsheng;
- Ning, Wenguo;
- Xu, Gaowei;
- Luo, Le
- Article
46
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3092, doi. 10.1007/s11664-014-3248-5
- Hong, K.;
- Jeong, T.;
- Youn, C.
- Article
47
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3379, doi. 10.1007/s11664-014-3257-4
- McCoppin, Jared;
- Reitz, Thomas;
- Miller, Ryan;
- Vijwani, Hema;
- Mukhopadhyay, Sharmila;
- Young, Daniel
- Article
48
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3625, doi. 10.1007/s11664-014-3258-3
- Li, Ming;
- Zhang, Yang;
- Shao, Yayun;
- Zeng, Min;
- Zhang, Zhang;
- Gao, Xingsen;
- Lu, Xubing;
- Liu, J.-M.;
- Ishiwara, Hiroshi
- Article
49
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3145, doi. 10.1007/s11664-014-3259-2
- Abusnina, Mohamed;
- Moutinho, Helio;
- Al-Jassim, Mowafak;
- DeHart, Clay;
- Matin, Mohammed
- Article
50
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3389, doi. 10.1007/s11664-014-3260-9
- Zhou, Jian;
- Gan, Weiping;
- Li, Yingfen;
- Luo, Lin;
- Pan, Qiaoyun;
- Xiong, Zhijun
- Article