Works matching IS 03615235 AND DT 2014 AND VI 43 AND IP 8
Results: 43
Mid-Wavelength Infrared nB n for HOT Detectors.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2963, doi. 10.1007/s11664-014-3161-y
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Cadmium Telluride Solar Cells on Ultrathin Glass for Space Applications.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2818, doi. 10.1007/s11664-014-3090-9
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Modeling Photocurrent Spectra of Single-Color and Dual-Band HgCdTe Photodetectors: Is 3D Simulation Unavoidable?
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3070, doi. 10.1007/s11664-014-3252-9
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Antimonide-Based Type II Superlattices: A Superior Candidate for the Third Generation of Infrared Imaging Systems.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2802, doi. 10.1007/s11664-014-3080-y
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Development of Nuclear Radiation Detectors by Use of Thick Single-Crystal CdTe Layers Grown on (211) p-Si Substrates by MOVPE.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2860, doi. 10.1007/s11664-014-3132-3
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Theoretical and Experimental Study of Time- and Temperature-Dependent Photoluminescence in ZnO.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3033, doi. 10.1007/s11664-014-3188-0
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Processing of LPE-Grown HgCdTe for MWIR Devices Designed for High Operating Temperatures.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2778, doi. 10.1007/s11664-014-3033-5
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Influence of Hydrogenation on Electrical Conduction in HgCdTe Thin Films on Silicon.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2831, doi. 10.1007/s11664-014-3122-5
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Ultrathin CdTe Solar Cells with MoO/Au Back Contacts.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2783, doi. 10.1007/s11664-014-3042-4
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Improvement of RTS Noise in HgCdTe MWIR Detectors.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3060, doi. 10.1007/s11664-014-3217-z
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GaSb: A New Alternative Substrate for Epitaxial Growth of HgCdTe.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2788, doi. 10.1007/s11664-014-3049-x
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Incorporation and Activation of Arsenic Dopant in Single-Crystal CdTe Grown on Si by Molecular Beam Epitaxy.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2998, doi. 10.1007/s11664-014-3173-7
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Numerical Simulation and Analytical Modeling of InAs nB n Infrared Detectors with n-Type Barrier Layers.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2915, doi. 10.1007/s11664-014-3148-8
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Surface Passivation of HgCdTe Using Low-Pressure Chemical Vapor Deposition of CdTe.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3012, doi. 10.1007/s11664-014-3178-2
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Exploring the Optical Properties of HgCdSe Films Using IR-Spectroscopic Ellipsometry.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3056, doi. 10.1007/s11664-014-3208-0
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Study of Morphological Defects on Dual-Band HgCdTe on CdZnTe.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2991, doi. 10.1007/s11664-014-3171-9
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Bulk Growth of CdZnTe: Quality Improvement and Size Increase.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2901, doi. 10.1007/s11664-014-3146-x
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Modeling InAs/GaSb and InAs/InAsSb Superlattice Infrared Detectors.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2984, doi. 10.1007/s11664-014-3169-3
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Topographic Evaluation of the Effect of Passivation in Improving the Performance of CdZnTe Detectors.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2941, doi. 10.1007/s11664-014-3153-y
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Numerical Analysis of Radiative Recombination in Narrow-Gap Semiconductors Using the Green's Function Formalism.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2841, doi. 10.1007/s11664-014-3123-4
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Structural and Energetic Analysis of Group V Impurities in p-Type HgCdTe: The Case of As and Sb.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2849, doi. 10.1007/s11664-014-3124-3
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Numerical Simulation of the Modulation Transfer Function in HgCdTe Detector Arrays.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2864, doi. 10.1007/s11664-014-3134-1
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Confocal Micro-PL Mapping of Defects in CdTe Epilayers Grown on Si (211) Substrates with Different Annealing Cycles.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2854, doi. 10.1007/s11664-014-3129-y
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Higher Dislocation Density of Arsenic-Doped HgCdTe Material.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3018, doi. 10.1007/s11664-014-3180-8
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Performance Optimization of InSb Infrared Focal-Plane Arrays with Diffractive Microlenses.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2795, doi. 10.1007/s11664-014-3054-0
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Quantification and Modeling of RMS Noise Distributions in HDVIP Infrared Focal Plane Arrays.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2824, doi. 10.1007/s11664-014-3099-0
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Tellurium-Rich CdTe, and the Effect of Tellurium Content on the Properties of CdTe.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2888, doi. 10.1007/s11664-014-3141-2
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A Highly Sensitive Multi-element HgCdTe e-APD Detector for IPDA Lidar Applications.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2970, doi. 10.1007/s11664-014-3164-8
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Small-Pitch HgCdTe Photodetectors.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3041, doi. 10.1007/s11664-014-3192-4
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Characterization of the Microstructure of HgCdTe with p-Type Doping.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2908, doi. 10.1007/s11664-014-3147-9
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Improvements of MCT MBE Growth on GaAs.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2935, doi. 10.1007/s11664-014-3149-7
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MBE Growth of Strained HgTe/CdTe Topological Insulator Structures.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2955, doi. 10.1007/s11664-014-3160-z
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Evaluation of Quantum Efficiency, Crosstalk, and Surface Recombination in HgCdTe Photon-Trapping Structures.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2808, doi. 10.1007/s11664-014-3081-x
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Novel Approach to Surface Processing for Improving the Efficiency of CdZnTe Detectors.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2771, doi. 10.1007/s11664-013-2698-5
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Numerical Simulation of Refractive-Microlensed HgCdTe Infrared Focal Plane Arrays Operating in Optical Systems.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2879, doi. 10.1007/s11664-014-3138-x
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Response Time Measurements in Short-Wave Infrared HgCdTe e-APDs.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2947, doi. 10.1007/s11664-014-3155-9
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Growth of AgGaTe and AgAlTe Layers for Novel Photovoltaic Materials.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2874, doi. 10.1007/s11664-014-3135-0
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MTF Issues in Small-Pixel-Pitch Planar Quantum IR Detectors.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3025, doi. 10.1007/s11664-014-3185-3
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CdTe/ZnTe/GaAs Heterostructures for Single-Crystal CdTe Solar Cells.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2895, doi. 10.1007/s11664-014-3142-1
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Structural and Electronic Properties of Gold Contacts on CdZnTe with Different Surface Finishes for Radiation Detector Applications.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2978, doi. 10.1007/s11664-014-3167-5
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Defects Study in HgCdTe Infrared Photodetectors by Deep Level Transient Spectroscopy.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3065, doi. 10.1007/s11664-014-3226-y
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Development of a Method for Chemical-Mechanical Preparation of the Surface of CdZnTe Substrates for HgCdTe-Based Infrared Focal-Plane Arrays.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3004, doi. 10.1007/s11664-014-3175-5
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Comparison of Continuously- and Step-Graded ZnSSe/GaAs (001) Metamorphic Buffer Layers.
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- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3047, doi. 10.1007/s11664-014-3205-3
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