Works matching IS 03615235 AND DT 2014 AND VI 43 AND IP 7
1
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2573, doi. 10.1007/s11664-014-3120-7
- Mousavinia, Mohammad;
- Ghasemi, Ali;
- Paimozd, Ebrahim
- Article
2
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2747, doi. 10.1007/s11664-014-3193-3
- Pham, Ngoc;
- Nguyen, Do;
- Dao, Bang;
- Ta, Kieu;
- Tran, Vinh;
- Nguyen, Van;
- Kim, Sang;
- Maenosono, Shinya;
- Phan, Thang
- Article
3
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2607, doi. 10.1007/s11664-014-3156-8
- Wang, Mao-Hua;
- Zhang, Bo;
- Zhou, Fu
- Article
4
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2658, doi. 10.1007/s11664-014-3108-3
- Xiang, Jun;
- Huang, Xing;
- Lin, Gengqi;
- Tang, Jiang;
- Ju, Chen;
- Miao, Xiangshui
- Article
5
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2540, doi. 10.1007/s11664-014-3224-0
- Ito, Kazuhiro;
- Hamasaka, Keiji;
- Kohama, Kazuyuki;
- Shirai, Yasuharu;
- Murakami, Masanori
- Article
6
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2759, doi. 10.1007/s11664-014-3159-5
- Lin, Jin;
- Zhang, Haiyan;
- Hong, Haoqun;
- Liu, Hui;
- Zhang, Xiubin
- Article
7
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2621, doi. 10.1007/s11664-014-3231-1
- Sutar, B.;
- Choudhary, R.;
- Das, Piyush
- Article
8
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2467, doi. 10.1007/s11664-014-3113-6
- Ji, Hongjun;
- Wang, Qiang;
- Li, Mingyu;
- Wang, Chunqing
- Article
9
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2715, doi. 10.1007/s11664-014-3225-z
- Sui, Yanping;
- Wang, Bin;
- Zhao, Zhide;
- Xu, Wei;
- Li, Xiaoliang;
- Yu, Guanghui;
- Wang, Xinzhong
- Article
10
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2614, doi. 10.1007/s11664-014-3199-x
- Xing, Zhuo;
- Jin, Li;
- Feng, Yujun;
- Wei, Xiaoyong
- Article
11
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2584, doi. 10.1007/s11664-014-3144-z
- Tsai, Shu-Yi;
- Fung, Kuan-Zong;
- Wei, Chao-Nan;
- Bor, Hui-Yun
- Article
12
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2521, doi. 10.1007/s11664-014-3176-4
- Darbandi, Payam;
- Bieler, Thomas;
- Pourboghrat, Farhang;
- Lee, Tae-kyu
- Article
13
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2597, doi. 10.1007/s11664-014-3154-x
- Pu, Zejun;
- Tong, Lifen;
- Long, Ya;
- Yang, Wei;
- Huang, Xu;
- Liu, Xiaobo
- Article
14
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2588, doi. 10.1007/s11664-014-3152-z
- Li, Linlin;
- Leng, Zhihua;
- Zi, Wenwen;
- Gan, Shucai
- Article
15
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2723, doi. 10.1007/s11664-014-3103-8
- Fu, Gaosheng;
- Zuo, Lei;
- Longtin, Jon;
- Nie, Chao;
- Chen, Yikai;
- Tewolde, Mahder;
- Sampath, Sanjay
- Article
16
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2738, doi. 10.1007/s11664-014-3172-8
- Lu, Yushan;
- Wang, Jun;
- Liu, Yueming;
- Xing, Xueling
- Article
17
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2754, doi. 10.1007/s11664-014-3195-1
- Xu, Pei;
- Gui, Haoguan;
- Hu, Yadong;
- Bahader, Ali;
- Ding, Yunsheng
- Article
18
- 2014
- Gaucher, A.;
- Martinez, E.;
- Baylet, J.;
- Cardinaud, C.
- Erratum
19
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2631, doi. 10.1007/s11664-014-3143-0
- Castro, H.;
- Sowade, E.;
- Rocha, J.;
- Alpuim, P.;
- Lanceros-Méndez, S.;
- Baumann, R.
- Article
20
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2530, doi. 10.1007/s11664-014-3196-0
- Takita, Atsuko;
- Sasaki, Katsuhiko;
- Ohguchi, Ken-ichi
- Article
21
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2644, doi. 10.1007/s11664-014-3114-5
- Ho, Yung-Shou;
- Chen, Yi-Siou;
- Wu, Cheng-Heng
- Article
22
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2553, doi. 10.1007/s11664-014-3117-2
- Article
23
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2683, doi. 10.1007/s11664-014-3133-2
- Ito, Takuya;
- Ota, Yasuyuki;
- Shiomori, Koichiro;
- Nishioka, Kensuke
- Article
24
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2479, doi. 10.1007/s11664-014-3121-6
- Article
25
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2566, doi. 10.1007/s11664-014-3112-7
- Wan, Wei;
- Huang, Chun-e;
- Yang, Jian;
- Zeng, Jinzhen;
- Qiu, Tai
- Article
26
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2498, doi. 10.1007/s11664-014-3131-4
- Chidambaram, Vivek;
- Bangtao, Chen;
- Lip, Gan;
- Rhee Min Woo, Daniel
- Article
27
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2731, doi. 10.1007/s11664-014-3111-8
- Bhatta, Rudra;
- Annamalai, Sezhian;
- Brandys, Marek;
- Pegg, Ian;
- Dutta, Biprodas
- Article
28
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2709, doi. 10.1007/s11664-014-3200-8
- Gu, Xiuquan;
- Zhang, Shuang;
- Qiang, Yinghuai;
- Zhao, Yulong;
- Zhu, Lei
- Article
29
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2667, doi. 10.1007/s11664-014-3115-4
- Arnatkevičiūtė, A.;
- Reklaitis, I.;
- Kadys, A.;
- Malinauskas, T.;
- Stanionytė, S.;
- Juška, G.;
- Rzheutski, M.;
- Tomašiūnas, R.
- Article
30
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2688, doi. 10.1007/s11664-014-3136-z
- Jeong, T.;
- Yu, J.;
- Mo, H.;
- Kim, T.;
- Lim, K.;
- Youn, C.;
- Hong, K.;
- Kim, H.
- Article
31
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2676, doi. 10.1007/s11664-014-3116-3
- Lai, Yunfeng;
- Wang, Yuzhu;
- Cheng, Shuying;
- Yu, Jinling
- Article
32
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2510, doi. 10.1007/s11664-014-3151-0
- Park, M.;
- Gibbons, S.;
- Arróyave, R.
- Article
33
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2651, doi. 10.1007/s11664-014-3104-7
- Aguirre, Brandon;
- Zubia, David;
- Ordonez, Rafael;
- Anwar, Farhana;
- Prieto, Heber;
- Sanchez, Carlos;
- Salazar, Maria;
- Pimentel, Alejandro.;
- Michael, Joseph;
- Zhou, Xiaowang;
- Mcclure, John;
- Nielson, Gregory;
- Cruz-Campa, Jose
- Article
34
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2694, doi. 10.1007/s11664-014-3137-y
- Kuo, Dong-Hau;
- Hsu, Jin-Tung
- Article
35
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2559, doi. 10.1007/s11664-014-3056-y
- Yang, Jin;
- Wen, Yumei;
- Li, Ping;
- Yue, Xihai;
- Yu, Qiangmo
- Article
36
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2487, doi. 10.1007/s11664-014-3130-5
- Chen, Sinn-wen;
- Chen, Tung-Kai;
- Hsu, Chia-ming;
- Chang, Jui-shen;
- Pan, Kevin
- Article
37
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2702, doi. 10.1007/s11664-014-3140-3
- Sheng, Fengfeng;
- Yang, Jianrong;
- Sun, Shiwen;
- Zhou, Changhe;
- Yu, Huixian
- Article
38
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2637, doi. 10.1007/s11664-014-3197-z
- Ioannidou, A.;
- Rull, M.;
- Martin-Gonzalez, M.;
- Moure, A.;
- Jacquot, A.;
- Niarchos, D.
- Article
39
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2459, doi. 10.1007/s11664-014-3202-6
- Khazaka, R.;
- Mendizabal, L.;
- Henry, D.
- Article
40
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2548, doi. 10.1007/s11664-014-3201-7
- Hu, Hailong;
- Zhang, Dian;
- Yu, Weiming;
- Sugawara, Katsuyasu;
- Guo, Tailiang
- Article