Works matching IS 03615235 AND DT 2014 AND VI 43 AND IP 2
1
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 548, doi. 10.1007/s11664-013-2837-z
- Maeyer, B.;
- Wonterghem, F.;
- Proost, J.
- Article
2
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 579, doi. 10.1007/s11664-013-2873-8
- Nahavandi, M.;
- Hanim, M.;
- Ismarrubie, Z.;
- Hajalilou, A.;
- Rohaizuan, R.;
- Fadzli, M.
- Article
3
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 506, doi. 10.1007/s11664-013-2875-6
- Zhao, Xiayan;
- Wang, Hua;
- Xu, Jiwen;
- Yuan, Changlai;
- Zhai, Xia;
- Cui, Yerang
- Article
4
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 393, doi. 10.1007/s11664-013-2858-7
- Fergus, Jeffrey;
- Yerkes, Kirk;
- Yost, Kevin
- Article
5
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 369, doi. 10.1007/s11664-013-2867-6
- Yang, Jie;
- Jiao, Xiangquan;
- Zhang, Rui;
- Zhong, Hui;
- Shi, Yu;
- Du, Bo
- Article
6
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 341, doi. 10.1007/s11664-013-2841-3
- Ferrer-Pérez, Jorge;
- Claflin, Bruce;
- Jena, Debdeep;
- Sen, Mihir;
- Vetury, Ramakrishna;
- Dorsey, Donald
- Article
7
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 320, doi. 10.1007/s11664-013-2813-7
- Zheng, H.;
- Jagannadham, K.;
- Youssef, K.
- Article
8
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 381, doi. 10.1007/s11664-013-2882-7
- Kumar, Arvind;
- Srivastava, P.
- Article
9
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 308, doi. 10.1007/s11664-013-2868-5
- Jin, Zhi-He;
- Wallace, Travis;
- Lad, Robert;
- Su, Ji
- Article
10
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 512, doi. 10.1007/s11664-013-2900-9
- Ali, Ihsan;
- Islam, M.;
- Awan, M.;
- Ahmad, Mukhtar
- Article
11
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 314, doi. 10.1007/s11664-013-2811-9
- Jiang, Dachuan;
- Ren, Shiqiang;
- Shi, Shuang;
- Dong, Wei;
- Qiu, Jieshan;
- TAN, Yi;
- Li, Jiayan
- Article
12
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 485, doi. 10.1007/s11664-013-2870-y
- Akram, M.;
- Anis-ur-Rehman, M.
- Article
13
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 447, doi. 10.1007/s11664-013-2913-4
- Karthika, S.;
- Prathibha, Vasudevan;
- Ann, Mary;
- Viji, Vidyadharan;
- Biju, P.;
- Unnikrishnan, N.
- Article
14
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 459, doi. 10.1007/s11664-013-2827-1
- Li, Pin;
- Pu, Yongping;
- Dong, Zijing;
- Gao, Pan
- Article
15
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 594, doi. 10.1007/s11664-013-2891-6
- Tian, Yingtao;
- Liu, Changqing;
- Hutt, David;
- Stevens, Bob
- Article
16
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 604, doi. 10.1007/s11664-013-2893-4
- Salmerón, José;
- Molina-Lopez, Francisco;
- Briand, Danick;
- Ruan, Jason;
- Rivadeneyra, Almudena;
- Carvajal, Miguel;
- Capitán-Vallvey, L.;
- Rooij, Nico;
- Palma, Alberto
- Article
17
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 630, doi. 10.1007/s11664-013-2918-z
- Kim, M.;
- Jeong, T.;
- Ha, J.;
- Oh, T.
- Article
18
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 522, doi. 10.1007/s11664-013-2906-3
- Article
19
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 535, doi. 10.1007/s11664-013-2922-3
- Bhaskar, Ankam;
- Huang, Y.C.;
- Liu, Chia-Jyi
- Article
20
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 567, doi. 10.1007/s11664-013-2845-z
- Shen, Jun;
- Zhai, Dajun;
- Cao, Zhongming;
- Zhao, Mali;
- Pu, Yayun
- Article
21
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 555, doi. 10.1007/s11664-013-2844-0
- Tiwari, Ruchi;
- Chandra, Sudhir
- Article
22
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 636, doi. 10.1007/s11664-013-2927-y
- Chen, Sinn-wen;
- Chen, Tung-Kai;
- Chang, Jui-shen;
- Hsu, Chia-ming;
- Chen, Wei-An
- Article
23
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 452, doi. 10.1007/s11664-013-2826-2
- Article
24
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 435, doi. 10.1007/s11664-013-2903-6
- Tang, Guodong;
- Yang, Wenchao;
- Xu, Feng;
- He, Yun
- Article
25
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 329, doi. 10.1007/s11664-013-2815-5
- Chegel, Raad;
- Behzad, Somayeh
- Article
26
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 479, doi. 10.1007/s11664-013-2859-6
- Tian, Xiao;
- Yang, Xin;
- Cao, Wei
- Article
27
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 618, doi. 10.1007/s11664-013-2907-2
- Xiong, Hua;
- Huang, Zhiheng;
- Conway, Paul
- Article
28
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 299, doi. 10.1007/s11664-013-2831-5
- Su, Hua;
- Tang, Xiaoli;
- Zhang, Huaiwu;
- Jing, Yulan;
- Bai, Feiming
- Article
29
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 541, doi. 10.1007/s11664-013-2861-z
- Li, L.-G.;
- Rubino, S.;
- Vallin, Ö.;
- Olsson, J.
- Article
30
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 493, doi. 10.1007/s11664-013-2939-7
- Article
31
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 359, doi. 10.1007/s11664-013-2905-4
- Zhou, Zaoyuan;
- Zhang, Weixin;
- Zhao, Wenran;
- Yang, Zeheng;
- Zeng, Chunyan
- Article
32
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 439, doi. 10.1007/s11664-013-2874-7
- Article
33
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 414, doi. 10.1007/s11664-013-2869-4
- Yoon, Sejin;
- Cho, Jun-Young;
- Koo, Hyun;
- Bae, Sung-Hwan;
- Ahn, Seunghyun;
- Kim, Gwi;
- Kim, Jin-Sang;
- Park, Chan
- Article
34
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 470, doi. 10.1007/s11664-013-2847-x
- Pattanayak, Samita;
- Choudhary, R.;
- Das, Piyush
- Article
35
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 375, doi. 10.1007/s11664-013-2908-1
- Jeong, Jin-Su;
- Choe, Byung-Hak;
- Lee, Jung-Ho;
- Lee, Jae-Joon;
- Choi, Won-Youl
- Article
36
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 586, doi. 10.1007/s11664-013-2889-0
- Wong, E.;
- Seah, S.;
- Shim, V.
- Article
37
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 426, doi. 10.1007/s11664-013-2925-0
- Article
38
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 389, doi. 10.1007/s11664-013-2914-3
- Zhang, Shujuan;
- Yang, Yuguo
- Article
39
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 353, doi. 10.1007/s11664-013-2872-9
- Kang, Chanyoung;
- Wang, Hongchao;
- Kim, HeeJin;
- Kim, Sung-Jin;
- Kim, Woochul
- Article
40
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 404, doi. 10.1007/s11664-013-2860-0
- Xu, Shaohui;
- Chen, Qiang;
- Zhu, Yiping;
- Wang, Lianwei;
- Zheng, Lirong;
- Chu, Paul
- Article
41
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 419, doi. 10.1007/s11664-013-2899-y
- Liang, Ying;
- Zhao, Jing-Tai
- Article
42
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 465, doi. 10.1007/s11664-013-2830-6
- Wu, Chun-Sen;
- Lin, Bor-Tsuen;
- Jean, Ming-Der
- Article
43
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 348, doi. 10.1007/s11664-013-2862-y
- Wahab, Fazal;
- Fernandes, Gustavo;
- Kim, Jin;
- Jung, Seungwoo;
- Kim, Ki-Bum;
- Hassan Sayyad, M.;
- Xu, Jimmy
- Article
44
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 528, doi. 10.1007/s11664-013-2921-4
- Golmojdeh, Hosein;
- Zanjanchi, Mohamad
- Article