Works matching IS 03615235 AND DT 2014 AND VI 43 AND IP 11
1
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3942, doi. 10.1007/s11664-014-3218-y
- Su, Xiaolei;
- Jia, Yan;
- Liu, Xiaoqin;
- Wang, Junbo;
- Xu, Jie;
- He, Xinhai;
- Fu, Chong;
- Liu, Songtao
- Article
2
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3973, doi. 10.1007/s11664-014-3254-7
- Zhu, Ke;
- Yang, Ye;
- Huang, Jinhua;
- Lu, Yuehui;
- Li, Jia;
- Tan, Ruiqin;
- Cui, Ping;
- Song, Weijie
- Article
3
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4090, doi. 10.1007/s11664-014-3298-8
- Mattila, Toni;
- Hokka, Jussi;
- Paulasto-Kröckel, Mervi
- Article
4
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4082, doi. 10.1007/s11664-014-3299-7
- Guo, Cuiping;
- Li, Changrong;
- Du, Zhenmin
- Article
5
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3922, doi. 10.1007/s11664-014-3301-4
- Mohammadi, M.R.;
- Fray, D.J.
- Article
6
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4186, doi. 10.1007/s11664-014-3303-2
- Article
7
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3979, doi. 10.1007/s11664-014-3305-0
- Poduri, Shripriya;
- Dutta, Mitra;
- Stroscio, Michael
- Article
8
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4103, doi. 10.1007/s11664-014-3306-z
- Yang, Ying;
- Balaraju, J.;
- Huang, Yizhong;
- Tay, Yee;
- Shen, Yiqiang;
- Tsakadze, Zviad;
- Chen, Zhong
- Article
9
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4111, doi. 10.1007/s11664-014-3307-y
- Wu, Changjun;
- Su, Xuping;
- Wang, Jianhua;
- Liu, Ya;
- Tu, Hao;
- Zhang, Yifan
- Article
10
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3898, doi. 10.1007/s11664-014-3308-x
- Fuentes-Fernandez, E.;
- Salomon-Preciado, A.;
- Gnade, B.;
- Quevedo-Lopez, M.;
- Shah, P.;
- Alshareef, H.
- Article
11
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4193, doi. 10.1007/s11664-014-3309-9
- Chen, Z.X.;
- Fang, Z.;
- Wang, Y.;
- Yang, Y.;
- Kamath, A.;
- Wang, X.P.;
- Singh, N.;
- Lo, G.-Q.;
- Kwong, D.-L.;
- Wu, Y.H.
- Article
12
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4199, doi. 10.1007/s11664-014-3310-3
- Christian, Beverley;
- Romanov, Alexandre;
- Romanova, Irina;
- Turbini, Laura
- Article
13
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3905, doi. 10.1007/s11664-014-3311-2
- Xing, Zhuo;
- Jin, Li;
- Wang, Tong;
- Hu, Qingyuan;
- Feng, Yujun;
- Wei, Xiaoyong
- Article
14
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4119, doi. 10.1007/s11664-014-3313-0
- Liang, Jiaxing;
- Wang, Haozhe;
- Hu, Anmin;
- Li, Ming
- Article
15
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4126, doi. 10.1007/s11664-014-3315-y
- Lee, Tae-Kyu;
- Duh, Jeng-Gong
- Article
16
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3949, doi. 10.1007/s11664-014-3316-x
- Dincer, Furkan;
- Karaaslan, Muharrem;
- Unal, Emin;
- Akgol, Oguzhan;
- Sabah, Cumali
- Article
17
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3954, doi. 10.1007/s11664-014-3317-9
- Li, Enzhu;
- Zou, Mengying;
- Duan, Shuxin;
- Xu, Ning;
- Yuan, Ying;
- Zhou, Xiaohua
- Article
18
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4134, doi. 10.1007/s11664-014-3318-8
- Lin, Jui-Ching;
- Qin, Yi;
- Woertink, Julia
- Article
19
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4214, doi. 10.1007/s11664-014-3319-7
- Choi, Yongwon;
- Shin, Jiwon;
- Suk, Kyung-lim;
- Kim, Young;
- Kim, Il;
- Paik, Kyung-Wook
- Article
20
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3885, doi. 10.1007/s11664-014-3322-z
- Ratzker, Menahem;
- Pearl, Adam;
- Osterman, Michael;
- Pecht, Michael;
- Milad, George
- Article
21
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4146, doi. 10.1007/s11664-014-3323-y
- Hammad, A.E.;
- El-Taher, A.M.
- Article
22
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3984, doi. 10.1007/s11664-014-3325-9
- Remadevi, T.;
- Dhanya, A.;
- Deepa, K.
- Article
23
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4048, doi. 10.1007/s11664-014-3326-8
- Zhang, Bo;
- Chang, Aimin;
- Zhao, Qing;
- Ye, Haitao;
- Wu, Yiquan
- Article
24
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4056, doi. 10.1007/s11664-014-3327-7
- Bhatta, Rudra;
- Henderson, Mark;
- Eufrasio, Andreza;
- Pegg, Ian;
- Dutta, Biprodas
- Article
25
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4308, doi. 10.1007/s11664-014-3328-6
- Stein, J.;
- Rehm, S.;
- Welzel, U.;
- Huegel, W.;
- Mittemeijer, E.
- Article
26
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4018, doi. 10.1007/s11664-014-3329-5
- Article
27
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4023, doi. 10.1007/s11664-014-3331-y
- Article
28
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4229, doi. 10.1007/s11664-014-3332-x
- Chen, K.;
- Wu, C.;
- Wang, C.;
- Cheng, H.;
- Huang, N.
- Article
29
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4224, doi. 10.1007/s11664-014-3333-9
- Parthiban, S.;
- Park, K.;
- Kim, H.-J.;
- Yang, S.;
- Kwon, J.-Y.
- Article
30
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4317, doi. 10.1007/s11664-014-3334-8
- Luque, P.;
- Gómez-Gutiérrez, Claudia;
- Lastra, G.;
- Carrillo-Castillo, A.;
- Quevedo-López, M.;
- Olivas, A.
- Article
31
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3933, doi. 10.1007/s11664-014-3336-6
- Choi, Chung;
- Yeo, Sang;
- Kim, Dohwan;
- Kim, Jongchae;
- Yoo, Kyung;
- Lee, Hyuck
- Article
32
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4322, doi. 10.1007/s11664-014-3337-5
- Wang, Mao-Hua;
- Ma, Xiao-Yu;
- Zhang, Bo;
- Zhou, Fu
- Article
33
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3993, doi. 10.1007/s11664-014-3338-4
- Benson, J.;
- Bubulac, L.;
- Smith, P.;
- Jacobs, R.;
- Markunas, J.;
- Jaime-Vasquez, M.;
- Almeida, L.;
- Stoltz, A.;
- Wijewarnasuriya, P.;
- Brill, G.;
- Chen, Y.;
- Peterson, J.;
- Reddy, M.;
- Vilela, M.;
- Johnson, S.;
- Lofgreen, D.;
- Yulius, A.;
- Bostrup, G.;
- Carmody, M.;
- Lee, D.
- Article
34
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4327, doi. 10.1007/s11664-014-3339-3
- Yang, Fan;
- Fan, Xi;
- Rong, Zhen;
- Cai, Xin;
- Li, Guang
- Article
35
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3999, doi. 10.1007/s11664-014-3340-x
- Zhao, Xin;
- Montgomery, Kyle;
- Woodall, Jerry
- Article
36
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4033, doi. 10.1007/s11664-014-3341-9
- Naffouti, Wafa;
- Nasr, Tarek;
- Mehdi, Ahmed;
- Kamoun-Turki, Najoua
- Article
37
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4241, doi. 10.1007/s11664-014-3342-8
- Jeong, Yesul;
- Pearson, Christopher;
- Lee, Yong;
- Winchester, Lee;
- Hwang, Jaeeun;
- Kim, Hongdoo;
- Do, Lee-Mi;
- Petty, Michael
- Article
38
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4335, doi. 10.1007/s11664-014-3344-6
- Article
39
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4344, doi. 10.1007/s11664-014-3346-4
- Alshkeili, Sara;
- Emziane, Mahieddine
- Article
40
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3959, doi. 10.1007/s11664-014-3347-3
- Bin, Tang;
- Feng, Si;
- Ying-xiang, Li;
- He-tuo, Chen;
- Xiao, Zhang;
- Shu-ren, Zhang
- Article
41
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4064, doi. 10.1007/s11664-014-3350-8
- Xia, Haiyang;
- Chen, Cheng-Lung;
- Drymiotis, Fivos;
- Wu, Aiping;
- Chen, Yang-Yuan;
- Snyder, G.
- Article
42
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4041, doi. 10.1007/s11664-014-3351-7
- Singh, Vijay;
- Chakradhar, R.;
- Rao, J.;
- Dhoble, S.;
- Kim, S.
- Article
43
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4070, doi. 10.1007/s11664-014-3352-6
- de Leon, Maria;
- Tarazona, Antulio;
- Chong, Harold;
- Kraft, Michael
- Article
44
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4349, doi. 10.1007/s11664-014-3353-5
- Khorshidi, Zahra;
- Bahari, Ali;
- Gholipur, Reza
- Article
45
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4246, doi. 10.1007/s11664-014-3354-4
- Lee, Seung-Woo;
- Lee, Tae-Hyung;
- Park, Ji-Won;
- Park, Cho-Hee;
- Kim, Hyun-Joong;
- Song, Jun-Yeob;
- Lee, Jae-Hak
- Article
46
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4158, doi. 10.1007/s11664-014-3359-z
- Mokhtari, Omid;
- Nishikawa, Hiroshi
- Article
47
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4262, doi. 10.1007/s11664-014-3360-6
- Shih, W.;
- Yang, T.;
- Chuang, H.;
- Kuo, M.;
- Kao, C.
- Article
48
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4003, doi. 10.1007/s11664-014-3361-5
- Abdul-Manaf, N.;
- Echendu, O.;
- Fauzi, F.;
- Bowen, L.;
- Dharmadasa, I.
- Article
49
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4282, doi. 10.1007/s11664-014-3363-3
- Mehdipour, M.;
- Shokrollahi, H.;
- Bahadoran, A.
- Article
50
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4289, doi. 10.1007/s11664-014-3364-2
- Qian, Y.;
- Deng, J.;
- Zheng, H.;
- Zheng, P.;
- Zheng, L.;
- Qin, H.
- Article