Works matching IS 03615235 AND DT 2014 AND VI 43 AND IP 10
1
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3726, doi. 10.1007/s11664-014-3084-7
- Hejtmánek, J.;
- Knížek, K.;
- Švejda, V.;
- Horna, P.;
- Sikora, M.
- Article
2
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3733, doi. 10.1007/s11664-014-3100-y
- Stathokostopoulos, D.;
- Chaliampalias, D.;
- Tarani, E.;
- Theodorakakos, A.;
- Giannoulatou, V.;
- Polymeris, G.S.;
- Pavlidou, E.;
- Chrissafis, K.;
- Hatzikraniotis, E.;
- Paraskevopoulos, K.M.;
- Vourlias, G.
- Article
3
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3740, doi. 10.1007/s11664-014-3105-6
- Casian, Anatolie;
- Sanduleac, Ionel
- Article
4
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3746, doi. 10.1007/s11664-014-3119-0
- Prytuliak, Anastasiia;
- Godlewska, Elzbieta;
- Mars, Krzysztof;
- Berthebaud, David
- Article
5
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3753, doi. 10.1007/s11664-014-3125-2
- Article
6
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3758, doi. 10.1007/s11664-014-3126-1
- Uhl, Stefanie;
- Laux, Edith;
- Journot, Tony;
- Jeandupeux, Laure;
- Charmet, Jérôme;
- Keppner, Herbert
- Article
7
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3765, doi. 10.1007/s11664-014-3128-z
- Conze, S.;
- Poenicke, A.;
- Martin, H.-P.;
- Rost, A.;
- Kinski, I.;
- Schilm, J.;
- Michaelis, A.
- Article
8
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3772, doi. 10.1007/s11664-014-3145-y
- Article
9
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3780, doi. 10.1007/s11664-014-3162-x
- Bulat, L.;
- Osvenskii, V.;
- Pshenay-Severin, D.
- Article
10
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3785, doi. 10.1007/s11664-014-3163-9
- Stefanaki, E.C.;
- Polymeris, G.S.;
- Nikolic, P.M.;
- Papageorgiou, Ch.;
- Pavlidou, E.;
- Hatzikraniotis, E.;
- Kyratsi, Th.;
- Paraskevopoulos, K.M.
- Article
11
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3792, doi. 10.1007/s11664-014-3165-7
- Sakamoto, Tatsuya;
- Iida, Tsutomu;
- Sekiguchi, Takeshi;
- Taguchi, Yutaka;
- Hirayama, Naomi;
- Nishio, Keishi;
- Takanashi, Yoshifumi
- Article
12
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3801, doi. 10.1007/s11664-014-3166-6
- Balout, Hilal;
- Boulet, Pascal;
- Record, Marie-Christine
- Article
13
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3808, doi. 10.1007/s11664-014-3168-4
- Tarkhanyan, Roland;
- Niarchos, Dimitris
- Article
14
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3812, doi. 10.1007/s11664-014-3170-x
- Lorenzi, B.;
- Narducci, D.;
- Tonini, R.;
- Frabboni, S.;
- Gazzadi, G.;
- Ottaviani, G.;
- Neophytou, N.;
- Zianni, X.
- Article
15
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3817, doi. 10.1007/s11664-014-3179-1
- Anbalagan, R.;
- Rogl, Gerda;
- Zehetbauer, Michael;
- Sharma, Amit;
- Rogl, Peter;
- Suwas, Satyam;
- Mallik, Ramesh
- Article
16
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3824, doi. 10.1007/s11664-014-3213-3
- Ioannou, Maria;
- Symeou, Elli;
- Giapintzakis, John;
- Kyratsi, Theodora
- Article
17
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3831, doi. 10.1007/s11664-014-3214-2
- Kutorasinski, K.;
- Tobola, J.;
- Kaprzyk, S.;
- Khan, A.U.;
- Kyratsi, Th.
- Article
18
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3838, doi. 10.1007/s11664-014-3233-z
- Samarelli, A.;
- Llin, L.;
- Cecchi, S.;
- Chrastina, D.;
- Isella, G.;
- Etzelstorfer, T.;
- Stangl, J.;
- Gubler, E.;
- Weaver, J.;
- Dobson, P.;
- Paul, D.
- Article
19
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3844, doi. 10.1007/s11664-014-3235-x
- Vlachos, N.;
- Hatzikraniotis, E.;
- Mihailescu, C.N.;
- Giapintzakis, J.;
- Kyratsi, Th.
- Article
20
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3852, doi. 10.1007/s11664-014-3249-4
- Lorenzi, Bruno;
- Frabboni, Stefano;
- Gazzadi, Gian;
- Tonini, Rita;
- Ottaviani, Giampiero;
- Narducci, Dario
- Article
21
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3857, doi. 10.1007/s11664-014-3292-1
- Maas, M.;
- Diliberto, S.;
- Vaulx, C.;
- Azzouz, K.;
- Boulanger, C.
- Article
22
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3863, doi. 10.1007/s11664-014-3300-5
- Anatychuk, L.I.;
- Lysko, V.V.
- Article
23
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3870, doi. 10.1007/s11664-014-3324-x
- Wolf, Stefanie;
- Neophytou, Neophytos;
- Stanojevic, Zlatan;
- Kosina, Hans
- Article
24
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3876, doi. 10.1007/s11664-014-3356-2
- Polymeris, G.;
- Theodorakakos, A.;
- Mars, K.;
- Godlewska, E.;
- Lioutas, Ch.;
- Hatzikraniotis, E.;
- Paraskevopoulos, K.
- Article
26
- Journal of Electronic Materials, 2014, v. 43, n. 10, p. 3719, doi. 10.1007/s11664-014-3075-8
- Navrátil, J.;
- Kucek, V.;
- Plecháček, T.;
- Černošková, E.;
- Laufek, F.;
- Drašar, Č.;
- Knotek, P.
- Article