Works matching IS 03615235 AND DT 2013 AND VI 42 AND IP 8
1
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2595, doi. 10.1007/s11664-013-2562-7
- Giri, Soumen;
- Ghosh, Debasis;
- Malas, Asish;
- Das, Chapal
- Article
2
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2549, doi. 10.1007/s11664-013-2622-z
- Lee, Ying;
- Li, Kun-Dar;
- Lu, Cheng-Hsueh;
- Shen, Jung-Hsiung;
- Teoh, Lay;
- Chiang, Ghi
- Article
3
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2658, doi. 10.1007/s11664-013-2612-1
- Schmitz, G.J.;
- Zhou, B.;
- Böttger, B.;
- Klima, S.;
- Villain, J.
- Article
4
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2641, doi. 10.1007/s11664-013-2603-2
- Article
5
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2470, doi. 10.1007/s11664-013-2618-8
- Han, Dong-Suk;
- Park, Jae-Hyung;
- Kang, Yu-Jin;
- Park, Jong-Wan
- Article
6
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2677, doi. 10.1007/s11664-013-2614-z
- Rodriguez, Rogie;
- Ibitayo, Dimeji;
- Quintero, Pedro
- Article
7
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2439, doi. 10.1007/s11664-013-2616-x
- Trinh, Hai-Dang;
- Lin, Yueh-Chin;
- Kuo, Chien-I;
- Chang, Edward;
- Nguyen, Hong-Quan;
- Wong, Yuen-Yee;
- Yu, Chih-Chieh;
- Chen, Chi-Ming;
- Chang, Chia-Yuan;
- Wu, Jyun-Yi;
- Chiu, Han-Chin;
- Yu, Terrence;
- Chang, Hui-Cheng;
- Tsai, Joseph;
- Hwang, David
- Article
8
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2606, doi. 10.1007/s11664-013-2575-2
- Srinivas, Vikram;
- Menon, Sandeep;
- Osterman, Michael;
- Pecht, Michael
- Article
9
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2582, doi. 10.1007/s11664-013-2634-8
- Bhaskar, Ankam;
- Jhang, C.-S.;
- Liu, Chia-Jyi
- Article
10
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2574, doi. 10.1007/s11664-013-2633-9
- Wu, Fang;
- He, Qingli;
- Hu, Dinxu;
- Gao, Feng;
- Song, Hongzhang;
- Jia, Jianfeng;
- Hu, Xing
- Article
11
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2415, doi. 10.1007/s11664-013-2576-1
- Chauhan, Preeti;
- Zhong, Z.;
- Pecht, Michael
- Article
12
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2708, doi. 10.1007/s11664-013-2620-1
- Chen, Xu;
- Xue, Feng;
- Zhou, Jian;
- Liu, Sidong;
- Qian, Guotong
- Article
13
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2478, doi. 10.1007/s11664-013-2630-z
- Prasath, R.;
- Skenes, K.;
- Danyluk, S.
- Article
14
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2445, doi. 10.1007/s11664-013-2635-7
- Li, Cheng-Che;
- Kuo, Dong-Hau;
- Hsieh, Pin-Wei;
- Huang, Ying-Sheng
- Article
15
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2648, doi. 10.1007/s11664-013-2609-9
- Huang, Chih-Kai;
- Lin, Keh-Wen;
- Huang, Yu-Ming;
- Caparanga, Alvin;
- Leron, Rhoda;
- Li, Meng-Hui
- Article
16
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2435, doi. 10.1007/s11664-013-2611-2
- Kim, Seung;
- Song, Young;
- Jeon, Seong;
- Yang, Gye;
- Ha, Jun;
- Lee, Sang;
- Baek, Jong;
- Park, Hyung
- Article
17
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2525, doi. 10.1007/s11664-013-2610-3
- Chung, Chang-Kyu;
- Jang, Kyung-Woon;
- Choi, Hyoung;
- Jang, Jiyoung;
- Moon, Youngjun;
- Jeon, Chulho
- Article
18
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2615, doi. 10.1007/s11664-013-2599-7
- Cao, Zhanmin;
- Xie, Wei;
- Wang, Kunpeng;
- Du, Guangwei;
- Qiao, Zhiyu
- Article
19
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2498, doi. 10.1007/s11664-013-2596-x
- Banday, Javid;
- Bhat, Ghulam;
- Mir, Feroz;
- Qurishi, Mushtaq;
- Koul, Surinder;
- Razdan, Tej
- Article
20
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2516, doi. 10.1007/s11664-013-2605-0
- Samee, M.A.;
- Edukondalu, A.;
- Ahmmad, Shaik;
- Taqiullah, Sair;
- Rahman, Syed
- Article
21
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2570, doi. 10.1007/s11664-013-2631-y
- He, Q.;
- Zhang, J.;
- Gao, F.;
- Wu, F.;
- Hu, X.;
- Song, H.
- Article
22
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2492, doi. 10.1007/s11664-013-2594-z
- Chen, Zhuo;
- Yang, Jiong;
- Liu, Ruiheng;
- Xi, Lili;
- Zhang, Wenqing;
- Yang, Jihui
- Article
23
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2560, doi. 10.1007/s11664-013-2626-8
- Article
24
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2587, doi. 10.1007/s11664-013-2637-5
- Parida, B.;
- Das, Piyush;
- Padhee, R.;
- Choudhary, R.
- Article
25
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2686, doi. 10.1007/s11664-013-2615-y
- Ma, Hai-Tao;
- Wang, Jie;
- Qu, Lin;
- Zhao, Ning;
- Kunwar, A.
- Article
26
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2556, doi. 10.1007/s11664-013-2624-x
- Wang, Hua;
- Zhai, Xia;
- Xu, Ji-Wen;
- Yuan, Chang-Lai;
- Yang, Ling
- Article
27
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2486, doi. 10.1007/s11664-013-2632-x
- Arivazhagan, Ponnusamy;
- Ramesh, Raju;
- Jayasakthi, Mathaiyan;
- Loganathan, Ravi;
- Balaji, Manavaimaran;
- Baskar, Krishnan
- Article
28
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2564, doi. 10.1007/s11664-013-2627-7
- Li, Lili;
- Xu, Zhuo;
- Xia, Song;
- Li, Zhengrong;
- Ji, Xuanrong;
- Long, Shaojun
- Article
29
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2450, doi. 10.1007/s11664-013-2595-y
- Article
30
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2630, doi. 10.1007/s11664-013-2601-4
- Article
31
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2667, doi. 10.1007/s11664-013-2613-0
- Sharif, Ahmed;
- Lim, Jun;
- Made, Riko;
- Lau, Fu;
- Phua, Eric;
- Lim, Ju;
- Wong, Chee;
- Gan, Chee;
- Chen, Zhong
- Article
32
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2504, doi. 10.1007/s11664-013-2597-9
- Tian, Xiao;
- Yang, Xin;
- Cao, Wei
- Article
33
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2510, doi. 10.1007/s11664-013-2600-5
- Tang, Zhen;
- Xiong, Ying;
- Xu, Ding;
- Tang, Ming;
- Wang, Zi;
- Xiao, Yong;
- Zeng, Bo;
- Gu, Xiao;
- Li, Jian;
- Wang, Long
- Article
34
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2724, doi. 10.1007/s11664-013-2639-3
- Tian, Ye;
- Liu, Xi;
- Chow, Justin;
- Wu, Yi;
- Sitaraman, Suresh
- Article
35
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2464, doi. 10.1007/s11664-013-2608-x
- Zhang, Lei;
- Shen, Honglie;
- You, Jiayi
- Article
36
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2536, doi. 10.1007/s11664-013-2617-9
- Liu, I-Tsan;
- Hon, Min-Hsiung;
- Teoh, Lay
- Article
37
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2696, doi. 10.1007/s11664-013-2619-7
- Article
38
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2716, doi. 10.1007/s11664-013-2629-5
- Santra, Sangeeta;
- Paul, Aloke
- Article
39
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2542, doi. 10.1007/s11664-013-2621-0
- Tang, Linjiang;
- Wang, Jinwen;
- Zhai, Jiwei
- Article
40
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2459, doi. 10.1007/s11664-013-2589-9
- Chen, Yong-Yue;
- Cai, Xi-Kun;
- Ye, Zhen-Yu;
- Wang, Xiong;
- Zhang, Bing-Po;
- Wu, Hui-Zhen
- Article