Works matching IS 03615235 AND DT 2013 AND VI 42 AND IP 6
1
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1171, doi. 10.1007/s11664-013-2551-x
- Hokka, Jussi;
- Mattila, Toni.;
- Xu, Hongbo;
- Paulasto-Kröckel, Mervi
- Article
2
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1047, doi. 10.1007/s11664-013-2512-4
- Article
3
- 2013
- Singh, Devinder;
- Singh, Rajinder
- Correction Notice
4
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1202, doi. 10.1007/s11664-013-2560-9
- Awais, Muhammad;
- Choi, Kyung
- Article
5
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 956, doi. 10.1007/s11664-013-2474-6
- Article
6
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1242, doi. 10.1007/s11664-013-2573-4
- Chi, Chu-Te;
- Lu, I-Feng;
- Chiu, I-Chung;
- Chen, Po-Yuan;
- Huang, Bo-Wei;
- Cheng, I-Chun;
- Chen, Jian-Zhang
- Article
7
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1024, doi. 10.1007/s11664-013-2497-z
- Jin, S.;
- Valenza, F.;
- Novakovic, R.;
- Leinenbach, C.
- Article
8
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 979, doi. 10.1007/s11664-013-2486-2
- Article
9
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 963, doi. 10.1007/s11664-013-2475-5
- Hokka, Jussi;
- Mattila, Toni;
- Xu, Hongbo;
- Paulasto-Kröckel, Mervi
- Article
10
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1275, doi. 10.1007/s11664-013-2588-x
- Khedr, Abdalla;
- Abou-Sekkina, Morsi;
- El-Metwaly, Fouad
- Article
11
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1101, doi. 10.1007/s11664-013-2523-1
- Alam, Mohammed;
- Azarian, Michael;
- Pecht, Michael
- Article
12
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 944, doi. 10.1007/s11664-013-2472-8
- Kumar, Sumeet;
- Heister, Stephen;
- Xu, Xianfan;
- Salvador, James;
- Meisner, Gregory
- Article
13
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1017, doi. 10.1007/s11664-013-2496-0
- Kadhim, Arej;
- Hmood, Arshad;
- Abu Hassan, Haslan
- Article
14
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 931, doi. 10.1007/s11664-012-2463-1
- Jamali Keikha, A.;
- Fanaei Sheikholeslami, T.;
- Behzadmehr, A.
- Article
15
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1085, doi. 10.1007/s11664-013-2517-z
- Lotfian, S.;
- Molina-Aldareguia, J.M.;
- Yazzie, K.E.;
- Llorca, J.;
- Chawla, N.
- Article
16
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1290, doi. 10.1007/s11664-013-2593-0
- Li, Meicheng;
- Jiang, Yongjian;
- Ding, Ruiqing;
- Song, Dandan;
- Yu, Hang;
- Chen, Zhao
- Article
17
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 999, doi. 10.1007/s11664-013-2494-2
- Park, M.;
- Gibbons, S.;
- Arróyave, R.
- Article
18
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1033, doi. 10.1007/s11664-013-2502-6
- Article
19
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1184, doi. 10.1007/s11664-013-2553-8
- Article
20
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1140, doi. 10.1007/s11664-013-2541-z
- Wu, Fang;
- Song, Hongzhang;
- Gao, Feng;
- Shi, Wenyu;
- Jia, Jianfeng;
- Hu, Xing
- Article
21
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1055, doi. 10.1007/s11664-013-2513-3
- Article
22
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1254, doi. 10.1007/s11664-013-2582-3
- Chung, C.;
- Chen, Y.;
- Yang, T.;
- Kao, C.
- Article
23
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1073, doi. 10.1007/s11664-013-2516-0
- Wang, Hsin;
- Porter, Wallace;
- Böttner, Harald;
- König, Jan;
- Chen, Lidong;
- Bai, Shengqiang;
- Tritt, Terry;
- Mayolet, Alex;
- Senawiratne, Jayantha;
- Smith, Charlene;
- Harris, Fred;
- Gilbert, Patricia;
- Sharp, Jeff;
- Lo, Jason;
- Kleinke, Holger;
- Kiss, Laszlo
- Article
24
- 2013
- Zirmi, R.;
- Portavoce, A.;
- Belkaid, M.;
- Record, M.-C.
- Correction Notice
25
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1219, doi. 10.1007/s11664-013-2566-3
- Li, Fei;
- Huang, Xiangyang;
- Jiang, Wan;
- Chen, Lidong
- Article
26
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1196, doi. 10.1007/s11664-013-2556-5
- Choi, Sun;
- Lee, Hong-Sub;
- Yeom, Geun;
- Park, Hyung-Ho
- Article
27
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1108, doi. 10.1007/s11664-013-2524-0
- KInacI, BarIş;
- Özçelik, Süleyman
- Article
28
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1122, doi. 10.1007/s11664-013-2529-8
- Salunkhe, S.M.;
- Jigajeni, S.R.;
- Tarale, A.N.;
- Sutar, M.M.;
- Joshi, P.B.
- Article
29
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1158, doi. 10.1007/s11664-013-2549-4
- Chen, Wei-Min;
- Zhang, Li-Jun;
- Liu, Dan-Dan;
- Du, Yong;
- Tan, Cheng-Yu
- Article
30
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1146, doi. 10.1007/s11664-013-2542-y
- Hmood, A.;
- Kadhim, A.;
- Hassan, J.J.;
- Abu Hassan, H.
- Article
31
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1092, doi. 10.1007/s11664-013-2519-x
- Diaz, A.;
- Quinones, S.;
- Ferrer, D.
- Article
32
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1114, doi. 10.1007/s11664-013-2525-z
- Liang, Qizhen;
- Nyugen, Mark;
- Moon, Kyoung-Sik;
- Watkins, Ken;
- Morato, Lilian;
- Wong, Ching
- Article
33
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1037, doi. 10.1007/s11664-013-2503-5
- Wang, Hui;
- Yan, Cheng-Feng;
- Kong, Hai-Kuan;
- Chen, Jian-Jun;
- Xin, Jun;
- Shi, Er-Wei;
- Yang, Jian-Hua
- Article
34
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 988, doi. 10.1007/s11664-013-2489-z
- Wang, Hui;
- Bian, Yanlong;
- Shen, Bo;
- Zhai, Jiwei
- Article
35
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 939, doi. 10.1007/s11664-012-2464-0
- Guo, Wenfeng;
- Wang, Yingzi;
- Li, Adan;
- Jiao, Tifeng;
- Gao, Faming
- Article
36
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1063, doi. 10.1007/s11664-013-2515-1
- Zulkifli, Muhammad;
- Jalar, Azman;
- Abdullah, Shahrum;
- Rahman, Irman;
- Othman, Norinsan
- Article
37
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1042, doi. 10.1007/s11664-013-2510-6
- Perumal, S.;
- Gorsse, S.;
- Ail, U.;
- Decourt, R.;
- Umarji, A.
- Article
38
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1010, doi. 10.1007/s11664-013-2495-1
- Duan, H.;
- Dong, Y.;
- Huang, Y.;
- Chen, X.;
- Lu, W.
- Article
39
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1154, doi. 10.1007/s11664-013-2543-x
- Zheng, P.;
- Zhang, J.;
- Qin, H.;
- Song, K.;
- Wu, J.;
- Ying, Z.;
- Zheng, L.;
- Deng, J.
- Article
40
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 993, doi. 10.1007/s11664-013-2492-4
- Article
41
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 973, doi. 10.1007/s11664-013-2477-3
- Nishal, Vandna;
- Kumar, Amit;
- Kadyan, Partap;
- Singh, Devender;
- Srivastava, Ritu;
- Singh, Ishwar;
- Kamalasanan, Modeeparampil
- Article
42
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1246, doi. 10.1007/s11664-013-2577-0
- Fuccillo, M.K.;
- Jia, Shuang;
- Charles, M.E.;
- Cava, R.J.
- Article
43
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1133, doi. 10.1007/s11664-013-2538-7
- Lee, Kwang;
- Tan, Yew;
- Jandl, Adam;
- Fitzgerald, Eugene;
- Tan, Chuan
- Article
44
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1235, doi. 10.1007/s11664-013-2572-5
- Dhingra, Mansi;
- Shrivastava, Sadhna;
- Senthil Kumar, P.;
- Annapoorni, S.
- Article
45
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1225, doi. 10.1007/s11664-013-2567-2
- Pati, Biswajit;
- Choudhary, R.N.P.;
- Das, Piyush;
- Parida, B.N.;
- Padhee, R.
- Article
46
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1260, doi. 10.1007/s11664-013-2583-2
- Yamakawa, Tomohiro;
- Takemoto, Tadashi;
- Shimoda, Masayoshi;
- Nishikawa, Hiroshi;
- Shiokawa, Kunio;
- Terada, Nobuto
- Article
47
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1209, doi. 10.1007/s11664-013-2561-8
- Mei, Yunhui;
- Chen, Gang;
- Cao, Yunjiao;
- Li, Xin;
- Han, Dan;
- Chen, Xu
- Article
48
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1282, doi. 10.1007/s11664-013-2592-1
- Rajagopal Reddy, V.;
- Umapathi, A.;
- Sankar Naik, S.
- Article
49
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1268, doi. 10.1007/s11664-013-2587-y
- Song, Haijun;
- Liu, Congcong;
- Zhu, Hongfei;
- Kong, Fangfang;
- Lu, Baoyang;
- Xu, Jingkun;
- Wang, Jianmin;
- Zhao, Feng
- Article
50
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1190, doi. 10.1007/s11664-013-2554-7
- Kuo, Dong-Hau;
- Jan, Tzung-Ru
- Article