Works matching IS 03615235 AND DT 2013 AND VI 42 AND IP 12
1
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3547, doi. 10.1007/s11664-013-2812-8
- Mahesh, M. L. V.;
- Bhanuprasad, V. V.;
- James, A. R.
- Article
2
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3426, doi. 10.1007/s11664-013-2723-8
- Parmar, Narendra S.;
- McCluskey, Matthew D.;
- Lynn, Kelvin G.
- Article
3
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3582, doi. 10.1007/s11664-013-2711-z
- Luu, Thi-Thuy;
- Duan, Ani;
- Aasmundtveit, Knut E.;
- Hoivik, Nils
- Article
4
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3609, doi. 10.1007/s11664-013-2705-x
- Zhou, Yuqin;
- Turbini, Laura J.;
- Ramjattan, Deepchand;
- Christian, Bev;
- Pritzker, Mark
- Article
5
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3379, doi. 10.1007/s11664-013-2717-6
- Boieriu, P.;
- Buurma, C.;
- Bommena, R.;
- Blissett, C.;
- Grein, C.;
- Sivananthan, S.
- Article
6
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3458, doi. 10.1007/s11664-013-2793-7
- Balout, Hilal;
- Boulet, Pascal;
- Record, Marie-Christine
- Article
7
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3471, doi. 10.1007/s11664-013-2816-4
- Romyen, Nathavat;
- Thongyai, Supakanok;
- Praserthdam, Piyasan;
- Sotzing, Gregory A.
- Article
8
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3438, doi. 10.1007/s11664-013-2719-4
- Xu, Jianping;
- Shi, Shaobo;
- Li, Lan;
- Zhang, Xiaosong;
- Wang, Youwei;
- Shi, Qingliang;
- Li, Shubin;
- Wang, Hao
- Article
9
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3408, doi. 10.1007/s11664-013-2771-0
- Kujofsa, T.;
- Antony, A.;
- Xhurxhi, S.;
- Obst, F.;
- Sidoti, D.;
- Bertoli, B.;
- Cheruku, S.;
- Correa, J. P.;
- Rago, P. B.;
- Suarez, E. N.;
- Jain, F. C.;
- Ayers, J. E.
- Article
10
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3559, doi. 10.1007/s11664-013-2763-0
- Han, Y. D.;
- Chen, L.;
- Jing, H. Y.;
- Nai, S. M. L.;
- Wei, J.;
- Xu, L.Y.
- Article
11
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3385, doi. 10.1007/s11664-013-2751-4
- Article
12
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3573, doi. 10.1007/s11664-013-2748-z
- Aksöz, Namık;
- Öztürk, Esra;
- Bayram, Ümit;
- Aksöz, Sezen;
- Kervan, Selçuk;
- Ülgen, Ahmet;
- Maraşlı, Necmettin
- Article
13
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3397, doi. 10.1007/s11664-013-2756-z
- Hegab, N. A.;
- Fadel, M.;
- Yahia, I. S.;
- Salem, A. M.;
- Farid, A. S.
- Article
14
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3373, doi. 10.1007/s11664-013-2715-8
- Li, Shaohua;
- Tan, Guolong;
- Murowchick, James B.;
- Wisner, Clarissa;
- Leventis, Nickolas;
- Xia, Ting;
- Chen, Xiaobo;
- Peng, Zhonghua
- Article
15
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3489, doi. 10.1007/s11664-013-2764-z
- Wen, Fei;
- Xu, Zhuo;
- Xia, Weimin;
- Ye, Hongjun;
- Wei, Xiaoyong;
- Zhang, Zhicheng
- Article
16
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3512, doi. 10.1007/s11664-013-2720-y
- Ali, Adnan;
- Lee, Yun Woo;
- Choi, Kyung Hyun;
- Jo, Jeongdai
- Article
17
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3519, doi. 10.1007/s11664-013-2731-8
- Li, Enzhu;
- Duan, Shuxin;
- Sun, Shumeng;
- Li, Hao;
- Mi, Yuean;
- Zhou, Xiaohua;
- Zhang, Shuren
- Article
18
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3390, doi. 10.1007/s11664-013-2753-2
- Yoon, Sejin;
- Kwon, O-Jong;
- Ahn, Seunghyun;
- Kim, Jae-Yeol;
- Koo, Hyun;
- Bae, Sung-Hwan;
- Cho, Jun-Young;
- Kim, Jin-Sang;
- Park, Chan
- Article
19
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3567, doi. 10.1007/s11664-013-2749-y
- Hu, Xiaowu;
- Li, Yulong;
- Li, Ke;
- Min, Zhixian
- Article
20
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3467, doi. 10.1007/s11664-013-2794-6
- Das, N.C.;
- Reed, M.L.;
- Sampath, A.V.;
- Shen, H.;
- Wraback, M.;
- Farrell, R.M.;
- Iza, M.;
- Cruz, S.C.;
- Lang, J.R.;
- Young, N.G.;
- Terao, Y.;
- Neufeld, C. J.;
- Keller, S.;
- Nakamura, S.;
- DenBaars, S.P.;
- Mishra, U.K.;
- Speck, J.S.
- Article
21
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3552, doi. 10.1007/s11664-013-2817-3
- Article
22
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3541, doi. 10.1007/s11664-013-2752-3
- Bhaskar, Ankam;
- Jhang, C.-S.;
- Liu, Chia-Jyi
- Article
23
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3367, doi. 10.1007/s11664-013-2714-9
- Sharda, Sunanda;
- Sharma, Neha;
- Sharma, Pankaj;
- Sharma, Vineet
- Article
24
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3481, doi. 10.1007/s11664-013-2785-7
- Derry, Cameron;
- Wu, Yiliang;
- Zhu, Shiping;
- Deen, Jamal
- Article
25
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3524, doi. 10.1007/s11664-013-2747-0
- Dutta, Soma;
- Jeyaseelan, A. Antony;
- Sruthi, S.
- Article
26
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3445, doi. 10.1007/s11664-013-2774-x
- Liao, Wugang;
- Zeng, Xiangbin;
- Wen, Xixing;
- Zheng, Wenjun;
- Yao, Wei
- Article
27
- 2013
- Lee, Kwang Hong;
- Tan, Yew Heng;
- Jandl, Adam;
- Fitzgerald, Eugene A.;
- Tan, Chuan Seng
- Correction Notice
28
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3451, doi. 10.1007/s11664-013-2740-7
- Qasrawi, A.F.;
- Khanfar, H.K.
- Article
29
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3421, doi. 10.1007/s11664-013-2779-5
- Zheng, Zhuang-hao;
- Fan, Ping;
- Luo, Jing-ting;
- Liang, Guang-xing;
- Zhang, Dong-ping
- Article
30
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3502, doi. 10.1007/s11664-013-2730-9
- Memisoglu, Gorkem;
- Varlikli, Canan;
- Diker, Halide
- Article
31
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3593, doi. 10.1007/s11664-013-2709-6
- Fakpan, Kittichai;
- Otsuka, Yuichi;
- Miyashita, Yukio;
- Mutoh, Yoshiharu;
- Nagata, Kohsoku
- Article
32
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3494, doi. 10.1007/s11664-013-2732-7
- Yung, Kam-chuen;
- Lee, Chung-pang;
- Wong, Ching-hong;
- Tam, Siu-lim;
- Pang, Siu-kwong;
- Yue, Tai-man
- Article
33
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3529, doi. 10.1007/s11664-013-2772-z
- Bahari, Ali;
- Gholipur, Reza
- Article
34
- Journal of Electronic Materials, 2013, v. 42, n. 12, p. 3429, doi. 10.1007/s11664-013-2766-x
- Sharma, G.;
- Mishra, M. C.;
- Dhaka, M. S.;
- Kothari, R. K.;
- Joshi, K. B.;
- Sharma, B. K.
- Article